CN202103011U - 用于样本物质分析的设备 - Google Patents

用于样本物质分析的设备 Download PDF

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Publication number
CN202103011U
CN202103011U CN200890100006.4U CN200890100006U CN202103011U CN 202103011 U CN202103011 U CN 202103011U CN 200890100006 U CN200890100006 U CN 200890100006U CN 202103011 U CN202103011 U CN 202103011U
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CN
China
Prior art keywords
ion
guides part
ion guides
axis
mass analyzer
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Expired - Lifetime
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CN200890100006.4U
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English (en)
Chinese (zh)
Inventor
克雷格·M·怀特豪斯
戴维·G·韦尔基
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Revvity Health Sciences Inc
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PerkinElmer Health Sciences Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • H01J49/062Ion guides
    • H01J49/063Multipole ion guides, e.g. quadrupoles, hexapoles

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN200890100006.4U 2007-05-31 2008-05-28 用于样本物质分析的设备 Expired - Lifetime CN202103011U (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/809,349 2007-05-31
US11/809,349 US8507850B2 (en) 2007-05-31 2007-05-31 Multipole ion guide interface for reduced background noise in mass spectrometry
PCT/US2008/064984 WO2009038825A2 (en) 2007-05-31 2008-05-28 Multipole ion guide interface for reduced background noise in mass spectrometry

Publications (1)

Publication Number Publication Date
CN202103011U true CN202103011U (zh) 2012-01-04

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CN200890100006.4U Expired - Lifetime CN202103011U (zh) 2007-05-31 2008-05-28 用于样本物质分析的设备

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US (2) US8507850B2 (https=)
EP (1) EP2150967A4 (https=)
JP (2) JP5512512B2 (https=)
CN (1) CN202103011U (https=)
CA (1) CA2687965C (https=)
WO (1) WO2009038825A2 (https=)

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CN102856153A (zh) * 2012-10-08 2013-01-02 复旦大学 一种离子光学偏轴传输系统
CN103854953A (zh) * 2012-11-30 2014-06-11 中国科学院大连化学物理研究所 无光窗式真空紫外灯质谱电离源
CN107004551A (zh) * 2014-12-16 2017-08-01 卡尔蔡司Smt有限责任公司 离子化装置和包含离子化装置的质谱仪
CN110446921A (zh) * 2017-03-16 2019-11-12 株式会社岛津制作所 带电粒子的供给控制方法和装置
CN111668087A (zh) * 2020-06-11 2020-09-15 中国科学院上海应用物理研究所 一种多级真空差分的电喷雾离子源引导装置
CN115315777A (zh) * 2020-03-24 2022-11-08 Dh科技发展私人贸易有限公司 在第三级具有额外去簇的三级大气到真空质谱仪入口
CN116313729A (zh) * 2022-11-25 2023-06-23 中国科学院青岛生物能源与过程研究所 一种大气压下可切换激光剥蚀/电喷雾离子源质谱仪及其使用方法

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JP6436236B2 (ja) * 2015-07-13 2018-12-12 株式会社島津製作所 シャッター
US11081331B2 (en) 2015-10-28 2021-08-03 Duke University Mass spectrometers having segmented electrodes and associated methods
GB2549248B (en) 2016-01-12 2020-07-22 Thermo Fisher Scient Bremen Gmbh IRMS sample introduction system and method
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JP6808669B2 (ja) 2018-03-14 2021-01-06 日本電子株式会社 質量分析装置
JP2022537141A (ja) 2019-06-14 2022-08-24 シャンハイ ポラリス バイオロジー カンパニー, リミテッド 単一粒子分析のためのシステムおよび方法
US20230402272A1 (en) * 2020-10-19 2023-12-14 Dh Technologies Development Pte. Ltd. Systems and methods for multistage mass spectrometry utilizing an electrostatic ion trap
JP7343944B2 (ja) * 2021-01-29 2023-09-13 アトナープ株式会社 ガス分析装置および制御方法
US12542266B2 (en) 2021-02-25 2026-02-03 Dh Technologies Development Pte. Ltd. Bent PCB ion guide for reduction of contamination and noise
CN113237943B (zh) * 2021-05-12 2023-10-20 中国科学技术大学 一种降低质谱探测h2和h2o背景噪声的超高真空装置
JP7729210B2 (ja) 2022-01-05 2025-08-26 株式会社島津製作所 質量分析装置

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Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102856153A (zh) * 2012-10-08 2013-01-02 复旦大学 一种离子光学偏轴传输系统
CN103854953A (zh) * 2012-11-30 2014-06-11 中国科学院大连化学物理研究所 无光窗式真空紫外灯质谱电离源
CN107004551A (zh) * 2014-12-16 2017-08-01 卡尔蔡司Smt有限责任公司 离子化装置和包含离子化装置的质谱仪
CN107004551B (zh) * 2014-12-16 2018-09-25 卡尔蔡司Smt有限责任公司 离子化装置和包含离子化装置的质谱仪
US10236169B2 (en) 2014-12-16 2019-03-19 Carl Zeiss Smt Gmbh Ionization device with mass spectrometer therewith
CN110446921A (zh) * 2017-03-16 2019-11-12 株式会社岛津制作所 带电粒子的供给控制方法和装置
CN115315777A (zh) * 2020-03-24 2022-11-08 Dh科技发展私人贸易有限公司 在第三级具有额外去簇的三级大气到真空质谱仪入口
US12394613B2 (en) 2020-03-24 2025-08-19 Dh Technologies Development Pte. Ltd. Three stage atmosphere to vacuum mass spectrometer inlet with additional declustering in the third stage
CN115315777B (zh) * 2020-03-24 2026-03-27 Dh科技发展私人贸易有限公司 在第三级具有额外去簇的三级大气到真空质谱仪入口
CN111668087A (zh) * 2020-06-11 2020-09-15 中国科学院上海应用物理研究所 一种多级真空差分的电喷雾离子源引导装置
CN111668087B (zh) * 2020-06-11 2023-10-27 中国科学院上海应用物理研究所 一种多级真空差分的电喷雾离子源引导装置
CN116313729A (zh) * 2022-11-25 2023-06-23 中国科学院青岛生物能源与过程研究所 一种大气压下可切换激光剥蚀/电喷雾离子源质谱仪及其使用方法

Also Published As

Publication number Publication date
EP2150967A4 (en) 2012-12-05
US20140008530A1 (en) 2014-01-09
US8507850B2 (en) 2013-08-13
EP2150967A2 (en) 2010-02-10
CA2687965C (en) 2015-11-24
US20090218486A1 (en) 2009-09-03
AU2008302733A1 (en) 2009-03-26
WO2009038825A3 (en) 2009-05-14
US8723107B2 (en) 2014-05-13
JP5512512B2 (ja) 2014-06-04
CA2687965A1 (en) 2009-03-26
WO2009038825A2 (en) 2009-03-26
JP2010531031A (ja) 2010-09-16
JP2014112570A (ja) 2014-06-19

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