CN1993624A - 基板检查装置 - Google Patents

基板检查装置 Download PDF

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Publication number
CN1993624A
CN1993624A CNA2005800264954A CN200580026495A CN1993624A CN 1993624 A CN1993624 A CN 1993624A CN A2005800264954 A CNA2005800264954 A CN A2005800264954A CN 200580026495 A CN200580026495 A CN 200580026495A CN 1993624 A CN1993624 A CN 1993624A
Authority
CN
China
Prior art keywords
substrate
base
movable wing
aforementioned
frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2005800264954A
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English (en)
Chinese (zh)
Inventor
久保胜英
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of CN1993624A publication Critical patent/CN1993624A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
CNA2005800264954A 2004-11-15 2005-09-01 基板检查装置 Pending CN1993624A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP330783/2004 2004-11-15
JP2004330783A JP2006138808A (ja) 2004-11-15 2004-11-15 基板検査装置

Publications (1)

Publication Number Publication Date
CN1993624A true CN1993624A (zh) 2007-07-04

Family

ID=36336326

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2005800264954A Pending CN1993624A (zh) 2004-11-15 2005-09-01 基板检查装置

Country Status (3)

Country Link
JP (1) JP2006138808A (ja)
CN (1) CN1993624A (ja)
WO (1) WO2006051643A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103412251A (zh) * 2013-07-24 2013-11-27 昆山迈致治具科技有限公司 一种具有行程控制机构的pcb板性能检测治具
CN105510797A (zh) * 2014-10-14 2016-04-20 富士施乐株式会社 检查装置

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008202283A (ja) * 2007-02-19 2008-09-04 Shimizu Corp 擬似窓
JP2011247838A (ja) 2010-05-31 2011-12-08 Ricoh Co Ltd スイッチプローブ、基板検査装置及び基板検査システム
KR102655029B1 (ko) * 2019-01-24 2024-04-08 주식회사 고영테크놀러지 검사 장치용 이송 기구, 검사 장치, 및 이를 이용하는 대상물 검사 방법
JP7303543B2 (ja) * 2019-08-30 2023-07-05 ヤマハファインテック株式会社 高周波特性検査装置、及び高周波特性検査方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0624783Y2 (ja) * 1987-10-15 1994-06-29 株式会社横尾製作所 回路基板検査装置
JPH01102778U (ja) * 1987-12-25 1989-07-11
JPH073353Y2 (ja) * 1988-07-06 1995-01-30 グラフテック株式会社 ファンクションテスタの基板固定構造
JP2844803B2 (ja) * 1990-02-23 1999-01-13 日本電気株式会社 プリント基板の検査方法および検査装置
JP2001201528A (ja) * 2000-01-18 2001-07-27 Hiroshi Fujimoto 配線基板等の導通試験装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103412251A (zh) * 2013-07-24 2013-11-27 昆山迈致治具科技有限公司 一种具有行程控制机构的pcb板性能检测治具
CN105510797A (zh) * 2014-10-14 2016-04-20 富士施乐株式会社 检查装置
CN105510797B (zh) * 2014-10-14 2018-05-29 富士施乐株式会社 检查装置

Also Published As

Publication number Publication date
JP2006138808A (ja) 2006-06-01
WO2006051643A1 (ja) 2006-05-18

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Open date: 20070704