CN1992143B - 用于maldi的激光聚焦和斑点成像的组合装置 - Google Patents

用于maldi的激光聚焦和斑点成像的组合装置 Download PDF

Info

Publication number
CN1992143B
CN1992143B CN2006101646312A CN200610164631A CN1992143B CN 1992143 B CN1992143 B CN 1992143B CN 2006101646312 A CN2006101646312 A CN 2006101646312A CN 200610164631 A CN200610164631 A CN 200610164631A CN 1992143 B CN1992143 B CN 1992143B
Authority
CN
China
Prior art keywords
optical
target area
radiation
ion source
optical path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2006101646312A
Other languages
English (en)
Chinese (zh)
Other versions
CN1992143A (zh
Inventor
格雷戈·欧瓦内
琼-鲁克·图克
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of CN1992143A publication Critical patent/CN1992143A/zh
Application granted granted Critical
Publication of CN1992143B publication Critical patent/CN1992143B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0004—Imaging particle spectrometry

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CN2006101646312A 2005-11-04 2006-11-03 用于maldi的激光聚焦和斑点成像的组合装置 Expired - Fee Related CN1992143B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/266,950 US7423260B2 (en) 2005-11-04 2005-11-04 Apparatus for combined laser focusing and spot imaging for MALDI
US11/266,950 2005-11-04

Publications (2)

Publication Number Publication Date
CN1992143A CN1992143A (zh) 2007-07-04
CN1992143B true CN1992143B (zh) 2012-05-23

Family

ID=37776825

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2006101646312A Expired - Fee Related CN1992143B (zh) 2005-11-04 2006-11-03 用于maldi的激光聚焦和斑点成像的组合装置

Country Status (4)

Country Link
US (1) US7423260B2 (enExample)
EP (1) EP1783816A3 (enExample)
JP (1) JP2007127653A (enExample)
CN (1) CN1992143B (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7777181B2 (en) * 2006-05-26 2010-08-17 Ionsense, Inc. High resolution sampling system for use with surface ionization technology
CN103413748B (zh) * 2013-08-13 2016-01-13 中国科学院化学研究所 一种多通道光成像激光电离源
US9558858B2 (en) * 2013-08-14 2017-01-31 Kla-Tencor Corporation System and method for imaging a sample with a laser sustained plasma illumination output
CN104867806B (zh) * 2014-02-24 2018-05-01 岛津分析技术研发（上海）有限公司 用于解吸附样品的进样方法和装置
CN104698067B (zh) * 2015-03-17 2017-08-29 北京理工大学 高空间分辨激光双轴共焦质谱显微成像方法与装置
CN104698069B (zh) * 2015-03-17 2018-01-12 北京理工大学 高空间分辨激光双轴差动共焦质谱显微成像方法与装置
CN104698068B (zh) * 2015-03-17 2017-05-17 北京理工大学 高空间分辨激光双轴差动共焦光谱‑质谱显微成像方法与装置
CN104795306A (zh) * 2015-04-17 2015-07-22 江苏天瑞仪器股份有限公司 基质辅助激光解吸电离用样品激发和样品成像的光路装置
DE102015115416B4 (de) * 2015-09-14 2018-09-13 Bruker Daltonik Gmbh Austastung von Pulsen in Pulslasern für LDI-Massenspektrometer
CN106932524B (zh) * 2015-12-30 2018-11-27 中国科学院化学研究所 液相薄层色谱-质谱联用装置、用途及检测方法
CN106981412B (zh) * 2016-01-19 2019-02-12 中国科学院化学研究所 检测颗粒质量的质谱装置、用途及测量方法
CN107658205B (zh) * 2017-09-29 2024-05-24 珠海美华医疗科技有限公司 一种maldi用光路及高压电场施加装置及质谱仪
CN112004602A (zh) * 2018-03-14 2020-11-27 生物梅里埃有限公司 用于对准仪器的光源的方法以及相关的仪器
WO2019187353A1 (ja) * 2018-03-27 2019-10-03 株式会社島津製作所 Ｍａｌｄｉイオン源
JP3217378U (ja) * 2018-05-24 2018-08-02 株式会社島津製作所 Ｍａｌｄｉイオン源及び質量分析装置
CN110940723A (zh) * 2018-09-25 2020-03-31 广州禾信康源医疗科技有限公司 质谱检测装置及其光学系统
CN109712862A (zh) * 2019-01-28 2019-05-03 安图实验仪器(郑州)有限公司 适于基质辅助激光解析电离飞行时间质谱仪的光路系统
CN111161997B (zh) * 2020-02-10 2024-11-26 浙江迪谱诊断技术有限公司 一种激光侧轴离子激发装置
CN112378474B (zh) * 2020-11-17 2022-11-04 哈尔滨工业大学 大长径比卧式罐容积多站三维激光扫描内测装置及方法
CN112378473B (zh) * 2020-11-17 2022-10-04 哈尔滨工业大学 大长径比立式罐容积多站三维激光扫描内测装置及方法
CN112378477B (zh) * 2020-11-17 2022-11-04 哈尔滨工业大学 大长径比卧式罐容积连续激光扫描内测装置及测量方法
JP7582073B2 (ja) * 2021-05-28 2024-11-13 株式会社島津製作所 マトリックス支援レーザ脱離イオン化質量分析装置及び方法
CN113921372B (zh) * 2021-12-02 2025-07-11 国开启科量子技术(北京)有限公司 一种激光溅射原子发生装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0789476B2 (ja) * 1986-12-08 1995-09-27 株式会社島津製作所 飛行時間型質量分析計
JPH04306549A (ja) * 1991-04-03 1992-10-29 Hitachi Ltd 顕微レーザ質量分析計
JPH0945276A (ja) * 1995-07-27 1997-02-14 Hitachi Ltd 質量分析計
DE19635643C2 (de) * 1996-09-03 2001-03-15 Bruker Daltonik Gmbh Verfahren zur Spektrenaufnahme und lineares Flugzeitmassenspektrometer dafür
US5777324A (en) * 1996-09-19 1998-07-07 Sequenom, Inc. Method and apparatus for maldi analysis
US7135689B2 (en) * 2002-02-22 2006-11-14 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
US6825462B2 (en) * 2002-02-22 2004-11-30 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
JP2005521874A (ja) * 2002-03-28 2005-07-21 エムディーエス シエックス レーザ脱離およびマルチプルリアクションモニタリングを用いる小分子のハイスループット定量のための方法およびシステム
US6680477B2 (en) * 2002-05-31 2004-01-20 Battelle Memorial Institute High spatial resolution matrix assisted laser desorption/ionization (MALDI)
US7091483B2 (en) * 2002-09-18 2006-08-15 Agilent Technologies, Inc. Apparatus and method for sensor control and feedback
US6707039B1 (en) * 2002-09-19 2004-03-16 Agilent Technologies, Inc. AP-MALDI target illumination device and method for using an AP-MALDI target illumination device
US7138625B2 (en) * 2003-05-02 2006-11-21 Agilent Technologies, Inc. User customizable plate handling for MALDI mass spectrometry
US6963066B2 (en) * 2003-06-05 2005-11-08 Thermo Finnigan Llc Rod assembly in ion source
JP2005098909A (ja) * 2003-09-26 2005-04-14 Shimadzu Corp イオン化装置およびこれを用いた質量分析装置
WO2005074003A1 (ja) 2004-01-28 2005-08-11 Kyoto University レーザ分析装置及び方法
US7435951B2 (en) * 2005-06-08 2008-10-14 Agilent Technologies, Inc. Ion source sample plate illumination system
US7180058B1 (en) * 2005-10-05 2007-02-20 Thermo Finnigan Llc LDI/MALDI source for enhanced spatial resolution

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Bernhard Spengler.Scanning Microprobe Matrix-Assisted Laser DesorptionIonization (SMALDI) Mass Spectrometry: Instrumentation forSub-Micrometer Resolved LDI and MALDI Surface Analysis.American Society for Mass Spectrometry13 6.2002,735-748页.
Bernhard Spengler.Scanning Microprobe Matrix-Assisted Laser DesorptionIonization (SMALDI) Mass Spectrometry: Instrumentation forSub-Micrometer Resolved LDI and MALDI Surface Analysis.American Society for Mass Spectrometry13 6.2002,735-748页. *

Also Published As

Publication number Publication date
US20070102632A1 (en) 2007-05-10
EP1783816A3 (en) 2009-02-25
JP2007127653A (ja) 2007-05-24
US7423260B2 (en) 2008-09-09
EP1783816A2 (en) 2007-05-09
CN1992143A (zh) 2007-07-04

Similar Documents

Publication Publication Date Title
CN1992143B (zh) 用于maldi的激光聚焦和斑点成像的组合装置
JP2859159B2 (ja) 薄層構造体の表面層の局限区域の形態と厚さを原位置実時間観測する方法と装置
US7180058B1 (en) LDI/MALDI source for enhanced spatial resolution
CA2430750A1 (en) High spatial resolution matrix assisted laser desorption/ionization (maldi)
US7961397B2 (en) Single-channel optical processing system for energetic-beam microscopes
JP5039342B2 (ja) Ｍａｌｄｉサンプルプレート撮像ワークステーション
WO2007020862A1 (ja) 質量分析装置
JP2012003898A (ja) 二次元イメージング装置および方法
US20060278824A1 (en) Ion source sample plate illumination system
JP2009164034A (ja) レーザ脱離イオン化方法、レーザ脱離イオン化装置、及び質量分析装置
CN114910457A (zh) 一种阴极荧光共聚焦显微光谱成像系统和方法
CN118464874B (zh) 一种水下激光诱导击穿光谱信号增强方法及系统
CN207396353U (zh) 一种光谱结合质谱的未知样品中元素的定量分析装置
JP3718300B2 (ja) 試料分析装置
JP6908180B2 (ja) Ｍａｌｄｉイオン源
JPH07226184A (ja) 質量分析計
JPH0945276A (ja) 質量分析計
JPS61129555A (ja) 空間分解能を有するモニタ−
JPH0589823A (ja) 質量分析計
JPH0620643A (ja) 質量分光測定システム
JPH04306549A (ja) 顕微レーザ質量分析計
WO2007017621A1 (en) Electron-optical apparatus
CN116973355A (zh) 高光谱和时间分辨率的辉光放电光谱测定设备和方法
JPH10104073A (ja) プラズマ測定装置
CN114975073A (zh) 一种质谱仪

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20120523