JP2007127653A - Ｍａｌｄｉのためのレーザ集束及びスポット撮像を一体に組み込むための装置 - Google Patents

Ｍａｌｄｉのためのレーザ集束及びスポット撮像を一体に組み込むための装置 Download PDF

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Publication number
JP2007127653A
JP2007127653A JP2006300109A JP2006300109A JP2007127653A JP 2007127653 A JP2007127653 A JP 2007127653A JP 2006300109 A JP2006300109 A JP 2006300109A JP 2006300109 A JP2006300109 A JP 2006300109A JP 2007127653 A JP2007127653 A JP 2007127653A
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optical element
target area
optical
radiation
optical path
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Japanese (ja)
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JP2007127653A5 (enExample
Inventor
Gregor Overney
グレガー・オーヴァニー
Jean-Luc Truche
ジャン‐リュック・トゥルーシュ
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Agilent Technologies Inc
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Agilent Technologies Inc
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0004—Imaging particle spectrometry

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2006300109A 2005-11-04 2006-11-06 Ｍａｌｄｉのためのレーザ集束及びスポット撮像を一体に組み込むための装置 Pending JP2007127653A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/266,950 US7423260B2 (en) 2005-11-04 2005-11-04 Apparatus for combined laser focusing and spot imaging for MALDI

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JP2007127653A true JP2007127653A (ja) 2007-05-24
JP2007127653A5 JP2007127653A5 (enExample) 2009-12-17

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JP2006300109A Pending JP2007127653A (ja) 2005-11-04 2006-11-06 Ｍａｌｄｉのためのレーザ集束及びスポット撮像を一体に組み込むための装置

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US (1) US7423260B2 (enExample)
EP (1) EP1783816A3 (enExample)
JP (1) JP2007127653A (enExample)
CN (1) CN1992143B (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019225059A1 (ja) * 2018-05-24 2019-11-28 株式会社島津製作所 Ｍａｌｄｉイオン源及び質量分析装置
JPWO2019187353A1 (ja) * 2018-03-27 2021-03-11 株式会社島津製作所 Ｍａｌｄｉイオン源
JP2022182314A (ja) * 2021-05-28 2022-12-08 株式会社島津製作所 マトリックス支援レーザ脱離イオン化質量分析装置及び方法

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7777181B2 (en) * 2006-05-26 2010-08-17 Ionsense, Inc. High resolution sampling system for use with surface ionization technology
CN103413748B (zh) * 2013-08-13 2016-01-13 中国科学院化学研究所 一种多通道光成像激光电离源
US9558858B2 (en) * 2013-08-14 2017-01-31 Kla-Tencor Corporation System and method for imaging a sample with a laser sustained plasma illumination output
CN104867806B (zh) * 2014-02-24 2018-05-01 岛津分析技术研发（上海）有限公司 用于解吸附样品的进样方法和装置
CN104698067B (zh) * 2015-03-17 2017-08-29 北京理工大学 高空间分辨激光双轴共焦质谱显微成像方法与装置
CN104698069B (zh) * 2015-03-17 2018-01-12 北京理工大学 高空间分辨激光双轴差动共焦质谱显微成像方法与装置
CN104698068B (zh) * 2015-03-17 2017-05-17 北京理工大学 高空间分辨激光双轴差动共焦光谱‑质谱显微成像方法与装置
CN104795306A (zh) * 2015-04-17 2015-07-22 江苏天瑞仪器股份有限公司 基质辅助激光解吸电离用样品激发和样品成像的光路装置
DE102015115416B4 (de) * 2015-09-14 2018-09-13 Bruker Daltonik Gmbh Austastung von Pulsen in Pulslasern für LDI-Massenspektrometer
CN106932524B (zh) * 2015-12-30 2018-11-27 中国科学院化学研究所 液相薄层色谱-质谱联用装置、用途及检测方法
CN106981412B (zh) * 2016-01-19 2019-02-12 中国科学院化学研究所 检测颗粒质量的质谱装置、用途及测量方法
CN107658205B (zh) * 2017-09-29 2024-05-24 珠海美华医疗科技有限公司 一种maldi用光路及高压电场施加装置及质谱仪
CN112004602A (zh) * 2018-03-14 2020-11-27 生物梅里埃有限公司 用于对准仪器的光源的方法以及相关的仪器
CN110940723A (zh) * 2018-09-25 2020-03-31 广州禾信康源医疗科技有限公司 质谱检测装置及其光学系统
CN109712862A (zh) * 2019-01-28 2019-05-03 安图实验仪器(郑州)有限公司 适于基质辅助激光解析电离飞行时间质谱仪的光路系统
CN111161997B (zh) * 2020-02-10 2024-11-26 浙江迪谱诊断技术有限公司 一种激光侧轴离子激发装置
CN112378474B (zh) * 2020-11-17 2022-11-04 哈尔滨工业大学 大长径比卧式罐容积多站三维激光扫描内测装置及方法
CN112378473B (zh) * 2020-11-17 2022-10-04 哈尔滨工业大学 大长径比立式罐容积多站三维激光扫描内测装置及方法
CN112378477B (zh) * 2020-11-17 2022-11-04 哈尔滨工业大学 大长径比卧式罐容积连续激光扫描内测装置及测量方法
CN113921372B (zh) * 2021-12-02 2025-07-11 国开启科量子技术(北京)有限公司 一种激光溅射原子发生装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63146339A (ja) * 1986-12-08 1988-06-18 Shimadzu Corp 飛行時間型質量分析計
JPH04306549A (ja) * 1991-04-03 1992-10-29 Hitachi Ltd 顕微レーザ質量分析計
JPH0945276A (ja) * 1995-07-27 1997-02-14 Hitachi Ltd 質量分析計
JP2005098909A (ja) * 2003-09-26 2005-04-14 Shimadzu Corp イオン化装置およびこれを用いた質量分析装置
JP2005521874A (ja) * 2002-03-28 2005-07-21 エムディーエス シエックス レーザ脱離およびマルチプルリアクションモニタリングを用いる小分子のハイスループット定量のための方法およびシステム
WO2005074003A1 (ja) * 2004-01-28 2005-08-11 Kyoto University レーザ分析装置及び方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19635643C2 (de) * 1996-09-03 2001-03-15 Bruker Daltonik Gmbh Verfahren zur Spektrenaufnahme und lineares Flugzeitmassenspektrometer dafür
US5777324A (en) * 1996-09-19 1998-07-07 Sequenom, Inc. Method and apparatus for maldi analysis
US7135689B2 (en) * 2002-02-22 2006-11-14 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
US6825462B2 (en) * 2002-02-22 2004-11-30 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
US6680477B2 (en) * 2002-05-31 2004-01-20 Battelle Memorial Institute High spatial resolution matrix assisted laser desorption/ionization (MALDI)
US7091483B2 (en) * 2002-09-18 2006-08-15 Agilent Technologies, Inc. Apparatus and method for sensor control and feedback
US6707039B1 (en) * 2002-09-19 2004-03-16 Agilent Technologies, Inc. AP-MALDI target illumination device and method for using an AP-MALDI target illumination device
US7138625B2 (en) * 2003-05-02 2006-11-21 Agilent Technologies, Inc. User customizable plate handling for MALDI mass spectrometry
US6963066B2 (en) * 2003-06-05 2005-11-08 Thermo Finnigan Llc Rod assembly in ion source
US7435951B2 (en) * 2005-06-08 2008-10-14 Agilent Technologies, Inc. Ion source sample plate illumination system
US7180058B1 (en) * 2005-10-05 2007-02-20 Thermo Finnigan Llc LDI/MALDI source for enhanced spatial resolution

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63146339A (ja) * 1986-12-08 1988-06-18 Shimadzu Corp 飛行時間型質量分析計
JPH04306549A (ja) * 1991-04-03 1992-10-29 Hitachi Ltd 顕微レーザ質量分析計
JPH0945276A (ja) * 1995-07-27 1997-02-14 Hitachi Ltd 質量分析計
JP2005521874A (ja) * 2002-03-28 2005-07-21 エムディーエス シエックス レーザ脱離およびマルチプルリアクションモニタリングを用いる小分子のハイスループット定量のための方法およびシステム
JP2005098909A (ja) * 2003-09-26 2005-04-14 Shimadzu Corp イオン化装置およびこれを用いた質量分析装置
WO2005074003A1 (ja) * 2004-01-28 2005-08-11 Kyoto University レーザ分析装置及び方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JPN6012002314; Ｂ．Ｓｐｅｎｇｌｅｒ　ａｎｄ　Ｍ．Ｈｕｂｅｒｔ: 'Ｓｃａｎｎｉｎｇ　Ｍｉｃｒｏｐｒｏｂｅ　Ｍａｔｒｉｘ-Ａｓｓｉｓｔｅｄ　Ｌａｓｅｒ　Ｄｅｓｏｒｐｔｉｏｎ　Ｉｏｎｉｚａｔｉｏｎ　（ＳＭＡＬＤＩ）　Ｍａｓｓ　Ｓｐｅｃｔｒｏｍｅｔｒｙ　：　Ｉｎｓｔｒｕｍ' Ｊｏｕｒｎａｌ　ｏｆ　Ａｍｅｒｉｃａｎ　Ｓｏｃｉｅｔｙ　ｆｏｒ　Ｍａｓｓ　Ｓｐｅｃｔｒｏｍｅｔｒｙ Ｖｏｌ．１３，　Ｎｏ．６, 2002, Ｐ７３５-７４８, Ａｍｅｒｉｃａｎ　Ｓｏｃｉｅｔｙ　ｆｏｒ　Ｍａｓｓ　Ｓｐｅｃｔｒｏｍｅｔｒｙ *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2019187353A1 (ja) * 2018-03-27 2021-03-11 株式会社島津製作所 Ｍａｌｄｉイオン源
WO2019225059A1 (ja) * 2018-05-24 2019-11-28 株式会社島津製作所 Ｍａｌｄｉイオン源及び質量分析装置
JP2022182314A (ja) * 2021-05-28 2022-12-08 株式会社島津製作所 マトリックス支援レーザ脱離イオン化質量分析装置及び方法
JP7582073B2 (ja) 2021-05-28 2024-11-13 株式会社島津製作所 マトリックス支援レーザ脱離イオン化質量分析装置及び方法

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US20070102632A1 (en) 2007-05-10
CN1992143B (zh) 2012-05-23
EP1783816A3 (en) 2009-02-25
US7423260B2 (en) 2008-09-09
EP1783816A2 (en) 2007-05-09
CN1992143A (zh) 2007-07-04

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