CN1836257B - 检查印刷在工件上的沉淀的方法及检查系统 - Google Patents
检查印刷在工件上的沉淀的方法及检查系统 Download PDFInfo
- Publication number
- CN1836257B CN1836257B CN2004800233650A CN200480023365A CN1836257B CN 1836257 B CN1836257 B CN 1836257B CN 2004800233650 A CN2004800233650 A CN 2004800233650A CN 200480023365 A CN200480023365 A CN 200480023365A CN 1836257 B CN1836257 B CN 1836257B
- Authority
- CN
- China
- Prior art keywords
- image
- workpiece
- precipitation
- aperture
- pixel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title claims abstract description 125
- 238000007689 inspection Methods 0.000 title claims abstract description 25
- 238000007639 printing Methods 0.000 claims abstract description 202
- 238000001556 precipitation Methods 0.000 claims description 230
- 230000014509 gene expression Effects 0.000 claims description 36
- 239000002244 precipitate Substances 0.000 claims description 12
- 238000003384 imaging method Methods 0.000 claims description 11
- 239000004744 fabric Substances 0.000 claims description 8
- 238000005520 cutting process Methods 0.000 claims description 4
- 238000012512 characterization method Methods 0.000 description 36
- 238000010586 diagram Methods 0.000 description 9
- 230000002708 enhancing effect Effects 0.000 description 7
- 238000005286 illumination Methods 0.000 description 7
- 238000009826 distribution Methods 0.000 description 6
- 238000012360 testing method Methods 0.000 description 5
- 230000008878 coupling Effects 0.000 description 4
- 238000010168 coupling process Methods 0.000 description 4
- 238000005859 coupling reaction Methods 0.000 description 4
- 238000013507 mapping Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 241000193935 Araneus diadematus Species 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004587 chromatography analysis Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000006071 cream Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0008—Industrial image inspection checking presence/absence
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
- H05K3/1216—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by screen printing or stencil printing
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0266—Marks, test patterns or identification means
- H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Screen Printers (AREA)
- Inking, Control Or Cleaning Of Printing Machines (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
Description
Claims (45)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0314233.8 | 2003-06-19 | ||
GB0314233A GB2403003B (en) | 2003-06-19 | 2003-06-19 | Inspection system for and method of inspecting deposits printed on workpieces |
PCT/GB2004/002649 WO2004114217A2 (en) | 2003-06-19 | 2004-06-18 | Inspection system for and method of inspecting deposits printed on workpieces |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1836257A CN1836257A (zh) | 2006-09-20 |
CN1836257B true CN1836257B (zh) | 2011-10-26 |
Family
ID=27636866
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2004800233650A Expired - Lifetime CN1836257B (zh) | 2003-06-19 | 2004-06-18 | 检查印刷在工件上的沉淀的方法及检查系统 |
Country Status (6)
Country | Link |
---|---|
US (1) | US9791383B2 (zh) |
EP (1) | EP1639545A2 (zh) |
JP (2) | JP4990619B2 (zh) |
CN (1) | CN1836257B (zh) |
GB (1) | GB2403003B (zh) |
WO (1) | WO2004114217A2 (zh) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005043833A1 (de) * | 2005-09-13 | 2007-03-29 | Ersa Gmbh | Vorrichtung zur Ermittlung der Relativposition zwischen zwei im Wesentlichen flächigen Elementen |
JP4919378B2 (ja) * | 2005-09-29 | 2012-04-18 | 富士フイルム株式会社 | 描画点データ取得方法および装置並びに描画方法および装置 |
US20070102477A1 (en) * | 2005-11-10 | 2007-05-10 | Speedline Technologies, Inc. | Imaging system and method for a stencil printer |
US20070102478A1 (en) * | 2005-11-10 | 2007-05-10 | Speedline Technologies, Inc. | Optimal imaging system and method for a stencil printer |
US7458318B2 (en) | 2006-02-01 | 2008-12-02 | Speedline Technologies, Inc. | Off-axis illumination assembly and method |
US7549371B2 (en) | 2006-07-10 | 2009-06-23 | Speedline Technologies, Inc. | Method and apparatus for clamping a substrate |
US7710611B2 (en) | 2007-02-16 | 2010-05-04 | Illinois Tool Works, Inc. | Single and multi-spectral illumination system and method |
US7861650B2 (en) | 2007-04-13 | 2011-01-04 | Illinois Tool Works, Inc. | Method and apparatus for adjusting a substrate support |
CA2712141A1 (en) * | 2008-01-15 | 2009-07-23 | Targacept, Inc. | Preparation and enantiomeric separation of 7-(3-pyridinyl)-1,7-diazaspiro[4.4] nonane and novel salt forms of the racemate and enantiomers |
US8215473B2 (en) * | 2008-05-21 | 2012-07-10 | Applied Materials, Inc. | Next generation screen printing system |
US8733244B2 (en) * | 2010-12-08 | 2014-05-27 | Illinois Tool Works, Inc. | Methods for depositing viscous material on a substrate with a combination stencil printer and dispenser |
JP6141507B2 (ja) * | 2014-02-19 | 2017-06-07 | ヤマハ発動機株式会社 | スクリーン印刷用検査データの作成ユニット、スクリーン印刷装置およびスクリーン印刷用検査データの作成方法 |
WO2018006180A1 (en) * | 2016-07-08 | 2018-01-11 | Ats Automation Tooling Systems Inc. | System and method for combined automatic and manual inspection |
DE102018201794B3 (de) * | 2018-02-06 | 2019-04-11 | Heidelberger Druckmaschinen Ag | Adaptive Bildglättung |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4578810A (en) * | 1983-08-08 | 1986-03-25 | Itek Corporation | System for printed circuit board defect detection |
CN1262025A (zh) * | 1997-07-02 | 2000-08-02 | 艾克拉爱德瓦德克拉夫特有限公司 | 在利用丝网印刷工艺将焊膏涂敷到印刷电路板上时产生测试图形的方法和设备 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0740526A (ja) | 1993-07-27 | 1995-02-10 | Matsushita Electric Ind Co Ltd | 半田印刷装置 |
JP2982617B2 (ja) * | 1994-06-27 | 1999-11-29 | 松下電器産業株式会社 | クリーム半田の印刷量検査方法 |
US5982927A (en) * | 1996-12-19 | 1999-11-09 | Cognex Corporation | Methods and apparatuses for in-line solder paste inspection |
US6317513B2 (en) * | 1996-12-19 | 2001-11-13 | Cognex Corporation | Method and apparatus for inspecting solder paste using geometric constraints |
GB2323664A (en) * | 1997-03-25 | 1998-09-30 | Dek Printing Machines Ltd | Viewing and imaging systems |
JPH10337843A (ja) * | 1997-06-09 | 1998-12-22 | Matsushita Electric Ind Co Ltd | スクリーン印刷方法及びその装置 |
JP3832062B2 (ja) * | 1997-12-22 | 2006-10-11 | 松下電器産業株式会社 | クリーム半田の外観検査方法 |
JPH11344449A (ja) | 1998-05-29 | 1999-12-14 | Shimu:Kk | 外観検査方法 |
US6574358B1 (en) * | 1998-11-13 | 2003-06-03 | Cognex Technology And Investment Corporation | Automatic training of inspection sites for paste inspection |
US6687402B1 (en) * | 1998-12-18 | 2004-02-03 | Cognex Corporation | Machine vision methods and systems for boundary feature comparison of patterns and images |
US6606402B2 (en) * | 1998-12-18 | 2003-08-12 | Cognex Corporation | System and method for in-line inspection of stencil aperture blockage |
JP4187332B2 (ja) * | 1998-12-24 | 2008-11-26 | 松下電器産業株式会社 | スクリーン印刷検査方法およびスクリーン印刷装置 |
JP2000238233A (ja) * | 1999-02-23 | 2000-09-05 | Fuji Mach Mfg Co Ltd | スクリーン検査方法,装置およびスクリーン印刷機 |
JP3252826B2 (ja) * | 1999-03-23 | 2002-02-04 | 株式会社日立製作所 | 回路パターン欠陥検査方法及びその装置 |
US6738505B1 (en) * | 1999-05-04 | 2004-05-18 | Speedline Technologies, Inc. | Method and apparatus for detecting solder paste deposits on substrates |
US6522776B1 (en) * | 1999-08-17 | 2003-02-18 | Advanced Micro Devices, Inc. | Method for automated determination of reticle tilt in a lithographic system |
JP3758463B2 (ja) * | 2000-05-09 | 2006-03-22 | 松下電器産業株式会社 | スクリーン印刷の検査方法 |
-
2003
- 2003-06-19 GB GB0314233A patent/GB2403003B/en not_active Expired - Lifetime
-
2004
- 2004-06-18 EP EP04743002A patent/EP1639545A2/en not_active Ceased
- 2004-06-18 JP JP2006516457A patent/JP4990619B2/ja not_active Expired - Lifetime
- 2004-06-18 CN CN2004800233650A patent/CN1836257B/zh not_active Expired - Lifetime
- 2004-06-18 US US10/561,495 patent/US9791383B2/en active Active
- 2004-06-18 WO PCT/GB2004/002649 patent/WO2004114217A2/en active Application Filing
-
2010
- 2010-11-18 JP JP2010258383A patent/JP2011081006A/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4578810A (en) * | 1983-08-08 | 1986-03-25 | Itek Corporation | System for printed circuit board defect detection |
CN1262025A (zh) * | 1997-07-02 | 2000-08-02 | 艾克拉爱德瓦德克拉夫特有限公司 | 在利用丝网印刷工艺将焊膏涂敷到印刷电路板上时产生测试图形的方法和设备 |
Non-Patent Citations (4)
Title |
---|
全文. |
第6页第12行-第8页第10行 |
说明书正文第1页第20-22行 |
附图1、2. |
Also Published As
Publication number | Publication date |
---|---|
US9791383B2 (en) | 2017-10-17 |
JP2007527506A (ja) | 2007-09-27 |
EP1639545A2 (en) | 2006-03-29 |
US20060222234A1 (en) | 2006-10-05 |
GB2403003A (en) | 2004-12-22 |
WO2004114217A2 (en) | 2004-12-29 |
CN1836257A (zh) | 2006-09-20 |
WO2004114217A3 (en) | 2005-09-15 |
JP4990619B2 (ja) | 2012-08-01 |
JP2011081006A (ja) | 2011-04-21 |
GB2403003B (en) | 2006-06-07 |
GB0314233D0 (en) | 2003-07-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN1836257B (zh) | 检查印刷在工件上的沉淀的方法及检查系统 | |
US7221443B2 (en) | Appearance inspection apparatus and method of image capturing using the same | |
EP2801816B1 (de) | Verfahren und Vorrichtung zur optischen Analyse eines PCBs | |
DE60225354T2 (de) | Verfahren und vorrichtung zur herstellung eines referenzbildes bei einer prüfvorrichtung für glasflaschen | |
DE102017203853A1 (de) | Platinenuntersuchungsvorrichtung | |
EP3104117B1 (de) | Verfahren zur fehleranalyse von drahtverbindungen | |
DE112007000232T5 (de) | Optimales Abbildungssystem und Verfahren für einen Schablonendrucker | |
JP2009168582A (ja) | 外観検査装置 | |
CN102331240B (zh) | 检查装置以及检查方法 | |
JP2539496B2 (ja) | プリント基板検査装置 | |
DE102014115650B4 (de) | Inspektionssystem und Verfahren zur Fehleranalyse | |
JP3993107B2 (ja) | 部品認識データ作成方法及び作成装置、並びに部品認識データ作成プログラム | |
JPH0740526A (ja) | 半田印刷装置 | |
JP2004226316A (ja) | 走査ヘッドおよびそれを利用可能な外観検査装置 | |
WO2011049190A1 (ja) | 外観検査装置及び印刷半田検査装置 | |
DE112020006158T5 (de) | Bild-gut/fehlerhaft-Lernvorrichtung, Bild-gut/fehlerhaft-Bestimmungsvorrichtung und Bild-Lesevorrichtung | |
US6567542B1 (en) | Automatic training of inspection sites for paste inspection by using sample pads | |
JP2004226318A (ja) | 走査ヘッドおよびそれを利用可能な外観検査装置 | |
JP2018158567A (ja) | 印刷装置及び印刷物の製造方法 | |
JP2696878B2 (ja) | 基板の検査方法およびその装置 | |
JP3402994B2 (ja) | 半田ペースト良否判定方法 | |
JP2008076215A (ja) | 検査装置および検査方法 | |
JP3730222B2 (ja) | 三次元計測装置及び検査装置 | |
CN115494062A (zh) | 一种基于机器视觉识别缺陷的印刷方法 | |
JPH04312181A (ja) | 線条体上の印刷マーク検査方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee |
Owner name: DEK INT GMBH Free format text: FORMER NAME: DEK INTERNAT GMBH |
|
CP01 | Change in the name or title of a patent holder |
Address after: Zurich Patentee after: DTG INTERNATIONAL GmbH Address before: Zurich Patentee before: DEK INTERNATIONAL GmbH |
|
CP01 | Change in the name or title of a patent holder |
Address after: Zurich Patentee after: DTG INTERNATIONAL GmbH Address before: Zurich Patentee before: DTG INTERNATIONAL GmbH |
|
CP01 | Change in the name or title of a patent holder | ||
TR01 | Transfer of patent right |
Effective date of registration: 20170904 Address after: Singapore Singapore Patentee after: ASM ASSEMBLY SYSTEMS SINGAPORE Pte. Ltd. Address before: Zurich Patentee before: DTG INTERNATIONAL GmbH |
|
TR01 | Transfer of patent right |