CN1764823B - 物理量测定装置 - Google Patents
物理量测定装置 Download PDFInfo
- Publication number
- CN1764823B CN1764823B CN2005800001198A CN200580000119A CN1764823B CN 1764823 B CN1764823 B CN 1764823B CN 2005800001198 A CN2005800001198 A CN 2005800001198A CN 200580000119 A CN200580000119 A CN 200580000119A CN 1764823 B CN1764823 B CN 1764823B
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- physical quantity
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5776—Signal processing not specific to any of the devices covered by groups G01C19/5607 - G01C19/5719
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Signal Processing (AREA)
- Gyroscopes (AREA)
Abstract
Description
Claims (6)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004011568 | 2004-01-20 | ||
JP011568/2004 | 2004-01-20 | ||
PCT/JP2005/000936 WO2005068938A1 (ja) | 2004-01-20 | 2005-01-19 | 物理量測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1764823A CN1764823A (zh) | 2006-04-26 |
CN1764823B true CN1764823B (zh) | 2010-10-13 |
Family
ID=34792338
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2005800001198A Active CN1764823B (zh) | 2004-01-20 | 2005-01-19 | 物理量测定装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7441458B2 (zh) |
EP (1) | EP1707919B1 (zh) |
JP (1) | JP4608435B2 (zh) |
KR (1) | KR100879156B1 (zh) |
CN (1) | CN1764823B (zh) |
WO (1) | WO2005068938A1 (zh) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1715293B1 (en) * | 2004-01-20 | 2020-09-30 | Seiko Epson Corporation | Detection circuits, detection method and systems of measuring physical quantities |
JP5294228B2 (ja) * | 2006-09-27 | 2013-09-18 | シチズンホールディングス株式会社 | 物理量センサ |
JP5079541B2 (ja) * | 2007-03-16 | 2012-11-21 | シチズンホールディングス株式会社 | 物理量センサ |
WO2009028594A1 (ja) * | 2007-08-31 | 2009-03-05 | Rohm Co., Ltd. | 角速度信号検出回路及び角速度信号検出方法 |
JP5975601B2 (ja) | 2011-02-25 | 2016-08-23 | セイコーエプソン株式会社 | 検出回路、物理量検出装置、角速度検出装置、集積回路装置及び電子機器 |
JP5752441B2 (ja) | 2011-02-25 | 2015-07-22 | セイコーエプソン株式会社 | 駆動回路、物理量検出装置、角速度検出装置、集積回路装置及び電子機器 |
JP5638419B2 (ja) | 2011-02-25 | 2014-12-10 | セイコーエプソン株式会社 | 信号処理回路、物理量検出装置、角速度検出装置、集積回路装置及び電子機器 |
FR2992418B1 (fr) * | 2012-06-22 | 2014-08-01 | Thales Sa | Capteur a element vibrant dans une cavite, a detection integree d anomalies |
JP6032243B2 (ja) * | 2014-05-23 | 2016-11-24 | 横河電機株式会社 | 電流電圧変換回路及び自励発振回路 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6028332A (en) * | 1997-06-30 | 2000-02-22 | Denso Corporation | Semiconductor type yaw rate sensor |
US6345533B1 (en) * | 1998-06-16 | 2002-02-12 | Matsushita Electric Industrial Co., Ltd. | Angular rate sensor |
US6487146B1 (en) * | 2000-03-13 | 2002-11-26 | Plasmon Lms Inc. | Read focus optimization for an optical disk drive |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01143961A (ja) * | 1987-11-30 | 1989-06-06 | Nec Corp | 振動ジャイロの駆動方法 |
JP2837211B2 (ja) * | 1990-01-25 | 1998-12-14 | 横河電機株式会社 | 自励発振回路 |
US5148126A (en) * | 1991-12-13 | 1992-09-15 | Sentech Corporation | Capacitance sensor circuit and method for measuring capacitance and small changes in capacitance |
JPH07270165A (ja) | 1994-03-31 | 1995-10-20 | Showa Electric Wire & Cable Co Ltd | 振動ジャイロ装置 |
JPH08338729A (ja) * | 1995-06-13 | 1996-12-24 | Nikon Corp | 自励振回路及びこれを用いた圧電振動角速度計 |
US5794080A (en) * | 1994-08-31 | 1998-08-11 | Nikon Corporation | Piezoelectric vibration angular velocity meter and camera using the same |
JPH0933262A (ja) * | 1995-07-25 | 1997-02-07 | Nikon Corp | 励振駆動回路及び方法並びにこれを用いた圧電振動角速度計 |
JP3490551B2 (ja) | 1995-09-20 | 2004-01-26 | オリンパス株式会社 | 体内触診装置 |
JP3999377B2 (ja) | 1997-11-04 | 2007-10-31 | 日本碍子株式会社 | 振動子、振動型ジャイロスコープ、直線加速度計および回転角速度の測定方法 |
DE19845185B4 (de) * | 1998-10-01 | 2005-05-04 | Eads Deutschland Gmbh | Sensor mit Resonanzstruktur sowie Vorrichtung und Verfahren zum Selbsttest eines derartigen Sensors |
JP2000205861A (ja) * | 1999-01-13 | 2000-07-28 | Murata Mfg Co Ltd | 振動ジャイロ |
JP3456445B2 (ja) * | 1999-05-17 | 2003-10-14 | 株式会社村田製作所 | センサ装置 |
JP2000337881A (ja) * | 1999-05-28 | 2000-12-08 | Alps Electric Co Ltd | ジャイロスコープの駆動検出装置 |
JP2001227954A (ja) * | 2000-02-15 | 2001-08-24 | Toyota Motor Corp | 物理量検出装置 |
JP3525862B2 (ja) * | 2000-05-22 | 2004-05-10 | トヨタ自動車株式会社 | センサ素子及びセンサ装置 |
US6497146B1 (en) | 2000-09-15 | 2002-12-24 | Bei Technologies, Inc. | Inertial rate sensor and method with built-in testing |
JP2004279101A (ja) * | 2003-03-13 | 2004-10-07 | Denso Corp | 振動型角速度センサ |
US7124632B2 (en) * | 2004-07-26 | 2006-10-24 | Bei Technologies, Inc. | Electronically configurable rate sensor circuit and method |
US7297242B2 (en) * | 2004-08-25 | 2007-11-20 | Honeywell International, Inc. | Self-adjusting electrochemical sensor |
-
2005
- 2005-01-19 WO PCT/JP2005/000936 patent/WO2005068938A1/ja not_active Application Discontinuation
- 2005-01-19 EP EP05704080.0A patent/EP1707919B1/en active Active
- 2005-01-19 US US11/039,712 patent/US7441458B2/en active Active
- 2005-01-19 JP JP2005517148A patent/JP4608435B2/ja active Active
- 2005-01-19 CN CN2005800001198A patent/CN1764823B/zh active Active
- 2005-01-19 KR KR1020057011016A patent/KR100879156B1/ko active IP Right Grant
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6028332A (en) * | 1997-06-30 | 2000-02-22 | Denso Corporation | Semiconductor type yaw rate sensor |
US6345533B1 (en) * | 1998-06-16 | 2002-02-12 | Matsushita Electric Industrial Co., Ltd. | Angular rate sensor |
US6487146B1 (en) * | 2000-03-13 | 2002-11-26 | Plasmon Lms Inc. | Read focus optimization for an optical disk drive |
Also Published As
Publication number | Publication date |
---|---|
KR100879156B1 (ko) | 2009-01-19 |
US7441458B2 (en) | 2008-10-28 |
EP1707919A1 (en) | 2006-10-04 |
EP1707919B1 (en) | 2016-08-24 |
US20050204814A1 (en) | 2005-09-22 |
WO2005068938A1 (ja) | 2005-07-28 |
KR20060126346A (ko) | 2006-12-07 |
EP1707919A4 (en) | 2014-03-19 |
JP4608435B2 (ja) | 2011-01-12 |
CN1764823A (zh) | 2006-04-26 |
JPWO2005068938A1 (ja) | 2007-09-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20081205 Address after: Tokyo Applicant after: Seiko Epson Co-applicant after: Nippon Precision Circuits Inc. Address before: Aichi Applicant before: Japan Hindu company Co-applicant before: Seiko Epson Corp. Co-applicant before: Nippon Precision Circuits Inc. |
|
ASS | Succession or assignment of patent right |
Owner name: SEIKO EPSON CORP. Free format text: FORMER OWNER: NGK INSULATORS LTD. Effective date: 20081205 |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant |