CN1552077A - 磁电阻级别产生器 - Google Patents
磁电阻级别产生器 Download PDFInfo
- Publication number
- CN1552077A CN1552077A CNA028163605A CN02816360A CN1552077A CN 1552077 A CN1552077 A CN 1552077A CN A028163605 A CNA028163605 A CN A028163605A CN 02816360 A CN02816360 A CN 02816360A CN 1552077 A CN1552077 A CN 1552077A
- Authority
- CN
- China
- Prior art keywords
- resistance
- magnetoresistive element
- equals
- rmin
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005415 magnetization Effects 0.000 claims description 15
- 230000005291 magnetic effect Effects 0.000 claims description 11
- 239000004065 semiconductor Substances 0.000 claims description 10
- CLOMYZFHNHFSIQ-UHFFFAOYSA-N clonixin Chemical compound CC1=C(Cl)C=CC=C1NC1=NC=CC=C1C(O)=O CLOMYZFHNHFSIQ-UHFFFAOYSA-N 0.000 abstract 2
- 238000000034 method Methods 0.000 description 4
- 238000013475 authorization Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000006096 absorbing agent Substances 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012549 training Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005294 ferromagnetic effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000008672 reprogramming Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000005641 tunneling Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5607—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using magnetic storage elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Semiconductor Memories (AREA)
- Measuring Magnetic Variables (AREA)
Abstract
Description
Claims (11)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/935,269 | 2001-08-22 | ||
US09/935,269 US6829158B2 (en) | 2001-08-22 | 2001-08-22 | Magnetoresistive level generator and method |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1552077A true CN1552077A (zh) | 2004-12-01 |
CN100380522C CN100380522C (zh) | 2008-04-09 |
Family
ID=25466822
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB028163605A Expired - Fee Related CN100380522C (zh) | 2001-08-22 | 2002-08-02 | 磁电阻级别产生器 |
Country Status (8)
Country | Link |
---|---|
US (1) | US6829158B2 (zh) |
EP (1) | EP1425750A2 (zh) |
JP (1) | JP4209322B2 (zh) |
KR (1) | KR100898874B1 (zh) |
CN (1) | CN100380522C (zh) |
AU (1) | AU2002319767A1 (zh) |
TW (1) | TWI235369B (zh) |
WO (1) | WO2003019564A2 (zh) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7760882B2 (en) * | 2004-06-28 | 2010-07-20 | Japan Communications, Inc. | Systems and methods for mutual authentication of network nodes |
US7286393B2 (en) * | 2005-03-31 | 2007-10-23 | Honeywell International Inc. | System and method for hardening MRAM bits |
US7264985B2 (en) * | 2005-08-31 | 2007-09-04 | Freescale Semiconductor, Inc. | Passive elements in MRAM embedded integrated circuits |
JP5002401B2 (ja) * | 2007-10-03 | 2012-08-15 | 株式会社東芝 | 抵抗変化メモリ |
JP2011222829A (ja) * | 2010-04-12 | 2011-11-04 | Toshiba Corp | 抵抗変化メモリ |
JP2012027974A (ja) * | 2010-07-22 | 2012-02-09 | Panasonic Corp | 半導体記憶装置 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3450657B2 (ja) * | 1997-07-16 | 2003-09-29 | 株式会社東芝 | 半導体記憶装置 |
US5699293A (en) * | 1996-10-09 | 1997-12-16 | Motorola | Method of operating a random access memory device having a plurality of pairs of memory cells as the memory device |
JPH11316913A (ja) * | 1998-04-30 | 1999-11-16 | Sony Corp | 磁気抵抗効果型磁気ヘッド |
US6055179A (en) * | 1998-05-19 | 2000-04-25 | Canon Kk | Memory device utilizing giant magnetoresistance effect |
US6111781A (en) * | 1998-08-03 | 2000-08-29 | Motorola, Inc. | Magnetic random access memory array divided into a plurality of memory banks |
US6343032B1 (en) * | 1999-07-07 | 2002-01-29 | Iowa State University Research Foundation, Inc. | Non-volatile spin dependent tunnel junction circuit |
US6185143B1 (en) | 2000-02-04 | 2001-02-06 | Hewlett-Packard Company | Magnetic random access memory (MRAM) device including differential sense amplifiers |
US6205073B1 (en) | 2000-03-31 | 2001-03-20 | Motorola, Inc. | Current conveyor and method for readout of MTJ memories |
US6317376B1 (en) | 2000-06-20 | 2001-11-13 | Hewlett-Packard Company | Reference signal generation for magnetic random access memory devices |
US6493259B1 (en) * | 2000-08-14 | 2002-12-10 | Micron Technology, Inc. | Pulse write techniques for magneto-resistive memories |
DE10041378C1 (de) * | 2000-08-23 | 2002-05-16 | Infineon Technologies Ag | MRAM-Anordnung |
US6515895B2 (en) * | 2001-01-31 | 2003-02-04 | Motorola, Inc. | Non-volatile magnetic register |
US6392923B1 (en) * | 2001-02-27 | 2002-05-21 | Motorola, Inc. | Magnetoresistive midpoint generator and method |
JP2002334585A (ja) * | 2001-05-02 | 2002-11-22 | Sony Corp | 半導体記憶装置 |
US6445612B1 (en) * | 2001-08-27 | 2002-09-03 | Motorola, Inc. | MRAM with midpoint generator reference and method for readout |
JP4242117B2 (ja) | 2002-07-11 | 2009-03-18 | 株式会社ルネサステクノロジ | 記憶装置 |
-
2001
- 2001-08-22 US US09/935,269 patent/US6829158B2/en not_active Expired - Lifetime
-
2002
- 2002-08-02 WO PCT/US2002/024861 patent/WO2003019564A2/en not_active Application Discontinuation
- 2002-08-02 AU AU2002319767A patent/AU2002319767A1/en not_active Abandoned
- 2002-08-02 JP JP2003522935A patent/JP4209322B2/ja not_active Expired - Lifetime
- 2002-08-02 EP EP02750431A patent/EP1425750A2/en not_active Withdrawn
- 2002-08-02 KR KR1020047002504A patent/KR100898874B1/ko active IP Right Grant
- 2002-08-02 CN CNB028163605A patent/CN100380522C/zh not_active Expired - Fee Related
- 2002-08-15 TW TW091118402A patent/TWI235369B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US20030053331A1 (en) | 2003-03-20 |
CN100380522C (zh) | 2008-04-09 |
EP1425750A2 (en) | 2004-06-09 |
JP4209322B2 (ja) | 2009-01-14 |
KR20040028995A (ko) | 2004-04-03 |
KR100898874B1 (ko) | 2009-05-25 |
JP2005525664A (ja) | 2005-08-25 |
WO2003019564A3 (en) | 2003-05-22 |
WO2003019564A2 (en) | 2003-03-06 |
AU2002319767A1 (en) | 2003-03-10 |
TWI235369B (en) | 2005-07-01 |
US6829158B2 (en) | 2004-12-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20090306 Address after: Arizona USA Patentee after: EVERSPIN TECHNOLOGIES, Inc. Address before: Texas in the United States Patentee before: FreeScale Semiconductor |
|
ASS | Succession or assignment of patent right |
Owner name: EVERSPIN TECHNOLOGIES, INC. Free format text: FORMER OWNER: FREEDOM SEMICONDUCTORS CO. Effective date: 20090306 |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080409 Termination date: 20110802 |