CN1324344C - 空间光调制器中活动元件的改进定址方法 - Google Patents

空间光调制器中活动元件的改进定址方法 Download PDF

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Publication number
CN1324344C
CN1324344C CNB038061686A CN03806168A CN1324344C CN 1324344 C CN1324344 C CN 1324344C CN B038061686 A CNB038061686 A CN B038061686A CN 03806168 A CN03806168 A CN 03806168A CN 1324344 C CN1324344 C CN 1324344C
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China
Prior art keywords
movable element
electromagnetic radiation
signal
electrode
amplifying signal
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Expired - Fee Related
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CNB038061686A
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English (en)
Chinese (zh)
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CN1643432A (zh
Inventor
乌尔里克·扬布拉德
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Micronic Laser Systems AB
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Micronic Laser Systems AB
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
    • G02B26/0841—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD the reflecting element being moved or deformed by electrostatic means

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Micromachines (AREA)
  • Liquid Crystal (AREA)
  • Mechanical Optical Scanning Systems (AREA)
CNB038061686A 2002-03-15 2003-03-14 空间光调制器中活动元件的改进定址方法 Expired - Fee Related CN1324344C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE02007870 2002-03-15
SE0200787A SE0200787D0 (sv) 2002-03-15 2002-03-15 Improved addressing method

Publications (2)

Publication Number Publication Date
CN1643432A CN1643432A (zh) 2005-07-20
CN1324344C true CN1324344C (zh) 2007-07-04

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Family Applications (1)

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CNB038061686A Expired - Fee Related CN1324344C (zh) 2002-03-15 2003-03-14 空间光调制器中活动元件的改进定址方法

Country Status (9)

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US (2) US7075693B2 (enExample)
EP (1) EP1485746B1 (enExample)
JP (1) JP4243546B2 (enExample)
CN (1) CN1324344C (enExample)
AT (1) ATE403175T1 (enExample)
AU (1) AU2003215999A1 (enExample)
DE (1) DE60322517D1 (enExample)
SE (1) SE0200787D0 (enExample)
WO (1) WO2003079090A1 (enExample)

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SE0100336L (sv) 2001-02-05 2002-08-06 Micronic Laser Systems Ab Adresseringsmetod och apparat som använder densamma tekniskt område
US7410736B2 (en) 2003-09-30 2008-08-12 Asml Holding N.V. Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system not utilizing overlap of the exposure zones
US6876440B1 (en) 2003-09-30 2005-04-05 Asml Holding N.V. Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system utilizing overlap of exposure zones with attenuation of the aerial image in the overlap region
US7023526B2 (en) 2003-09-30 2006-04-04 Asml Holding N.V. Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system utilizing overlap without an explicit attenuation
US7839561B2 (en) * 2007-02-26 2010-11-23 Silicon Quest Kabushiki-Kaisha Micromirror device with a single address electrode
US20090033878A1 (en) * 2003-11-01 2009-02-05 Akira Shirai System configurations and methods for controlling image projection apparatuses and mirror device
US7336290B2 (en) 2004-01-07 2008-02-26 Texas Instruments Incorporated Method and apparatus for increasing a perceived resolution of a display
JP4073886B2 (ja) * 2004-03-30 2008-04-09 アンリツ株式会社 可変波長光源
US7072090B2 (en) * 2004-04-22 2006-07-04 Micronic Laser Systems Ab Addressing of an SLM
US7499146B2 (en) * 2005-03-14 2009-03-03 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method, an integrated circuit, a flat panel display, and a method of compensating for cupping
US7372617B2 (en) * 2005-07-06 2008-05-13 Peter Enoksson Hidden hinge MEMS device
JP2007033787A (ja) * 2005-07-26 2007-02-08 Fujifilm Corp 微小薄膜可動素子および微小薄膜可動素子アレイ並びに微小薄膜可動素子アレイの駆動方法
US7443568B2 (en) * 2006-05-04 2008-10-28 Miradia Inc. Method and system for resonant operation of a reflective spatial light modulator
US7505195B2 (en) 2006-05-04 2009-03-17 Miradia Inc. Reflective spatial light modulator with high stiffness torsion spring hinge
US20080231936A1 (en) * 2007-03-02 2008-09-25 Taro Endo Display system comprising a mirror device with micromirrors controlled to operate in intermediate oscillating state
US7961161B2 (en) * 2007-03-02 2011-06-14 Silicon Quest Kabushiki-Kaisha Display system comprising a mirror device with micromirrors controlled to operate in intermediate oscillating state
US9250536B2 (en) 2007-03-30 2016-02-02 Asml Netherlands B.V. Lithographic apparatus and method
US8937706B2 (en) * 2007-03-30 2015-01-20 Asml Netherlands B.V. Lithographic apparatus and method
JP5239594B2 (ja) * 2008-07-30 2013-07-17 富士通株式会社 クリップ検出装置及び方法
US8861066B2 (en) 2009-02-16 2014-10-14 Micronic Ab Oversized micro-mechanical light modulator with redundant elements, device and method
NL2006625A (en) * 2010-05-26 2011-11-29 Asml Netherlands Bv Illumination system and lithographic apparatus.
DE102011081042B4 (de) * 2011-08-16 2021-05-27 Robert Bosch Gmbh Steuervorrichtung für einen Mikrospiegel, Verfahren zum Ansteuern eines Mikrospiegels und Bildprojektionssystem
CN102354050B (zh) * 2011-09-28 2013-01-02 哈尔滨工业大学 柔性辅助臂跟随超高角灵敏度高频响微角摆控制反射镜
US20130286463A1 (en) * 2011-10-24 2013-10-31 Texas Instruments Incorporated Dynamic actuation waveform for a digital micromirror device
FR2985320B1 (fr) * 2011-12-29 2014-02-14 Alpao Systeme a etalonnage commun et procede correspondant
DE102015205404A1 (de) * 2015-03-25 2016-09-29 Carl Zeiss Smt Gmbh Vielspiegel-Anordnung
CN109557661B (zh) * 2018-10-15 2021-02-26 武汉光迅科技股份有限公司 驱动光学转镜转动的方法及用于驱动光学转镜转动的装置
CN111552072B (zh) * 2020-04-28 2022-07-12 安徽中科米微电子技术有限公司 大尺寸mems垂直梳齿微镜及其制备方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5382961A (en) * 1992-10-15 1995-01-17 Texas Instruments Incorporated Bistable DMD addressing method
CN1115067A (zh) * 1993-07-27 1996-01-17 德克萨斯仪器股份有限公司 微型单片可变电气器件以及含有这类器件的装置
US5771116A (en) * 1996-10-21 1998-06-23 Texas Instruments Incorporated Multiple bias level reset waveform for enhanced DMD control
US6044705A (en) * 1993-10-18 2000-04-04 Xros, Inc. Micromachined members coupled for relative rotation by torsion bars
JP2001228552A (ja) * 2000-02-17 2001-08-24 Fuji Photo Film Co Ltd プリンタ

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US5032924A (en) * 1989-04-10 1991-07-16 Nilford Laboratories, Inc. System for producing an image from a sequence of pixels
US5488862A (en) * 1993-10-18 1996-02-06 Armand P. Neukermans Monolithic silicon rate-gyro with integrated sensors
US5949570A (en) * 1995-06-20 1999-09-07 Matsushita Electric Industrial Co., Ltd. Diffractive optical modulator and method for producing the same, infrared sensor including such a diffractive optical modulator and method for producing the same, and display device including such a diffractive optical modulator
US6323982B1 (en) * 1998-05-22 2001-11-27 Texas Instruments Incorporated Yield superstructure for digital micromirror device
KR100311032B1 (ko) * 1999-10-29 2001-11-02 윤종용 마이크로미러 가동장치
US6600591B2 (en) * 2001-06-12 2003-07-29 Network Photonics, Inc. Micromirror array having adjustable mirror angles
US7190509B2 (en) * 2001-11-07 2007-03-13 Trex Enterprises Corp. Optically addressed MEMS
US6757092B2 (en) * 2001-12-10 2004-06-29 Nayef M. Abu-Ageel Micro-machine electrostatic actuator, method and system employing same, and fabrication methods thereof
KR100630029B1 (ko) * 2002-11-06 2006-09-27 마츠시타 덴끼 산교 가부시키가이샤 변위 검출 기능을 구비한 마이크로 액츄에이터, 및 당해마이크로 액츄에이터를 구비한 가변형 미러
US6956683B2 (en) * 2003-06-11 2005-10-18 Texas Instruments Incorporated Pivoting platform having a piezoelectric drive
US20070132681A1 (en) * 2005-12-09 2007-06-14 Chih-Liang Chen Passive micro-mirror-array spatial light modulation

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5382961A (en) * 1992-10-15 1995-01-17 Texas Instruments Incorporated Bistable DMD addressing method
CN1115067A (zh) * 1993-07-27 1996-01-17 德克萨斯仪器股份有限公司 微型单片可变电气器件以及含有这类器件的装置
US6044705A (en) * 1993-10-18 2000-04-04 Xros, Inc. Micromachined members coupled for relative rotation by torsion bars
US5771116A (en) * 1996-10-21 1998-06-23 Texas Instruments Incorporated Multiple bias level reset waveform for enhanced DMD control
JP2001228552A (ja) * 2000-02-17 2001-08-24 Fuji Photo Film Co Ltd プリンタ

Also Published As

Publication number Publication date
ATE403175T1 (de) 2008-08-15
WO2003079090A1 (en) 2003-09-25
US20050122558A1 (en) 2005-06-09
EP1485746B1 (en) 2008-07-30
SE0200787D0 (sv) 2002-03-15
AU2003215999A1 (en) 2003-09-29
DE60322517D1 (de) 2008-09-11
US20060187517A1 (en) 2006-08-24
US7075693B2 (en) 2006-07-11
EP1485746A1 (en) 2004-12-15
JP4243546B2 (ja) 2009-03-25
JP2005521078A (ja) 2005-07-14
CN1643432A (zh) 2005-07-20

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