CN120500746A - 绝缘基板及半导体装置 - Google Patents
绝缘基板及半导体装置Info
- Publication number
- CN120500746A CN120500746A CN202380090039.4A CN202380090039A CN120500746A CN 120500746 A CN120500746 A CN 120500746A CN 202380090039 A CN202380090039 A CN 202380090039A CN 120500746 A CN120500746 A CN 120500746A
- Authority
- CN
- China
- Prior art keywords
- circuit pattern
- ceramic substrate
- semiconductor element
- semiconductor device
- insulating substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
Landscapes
- Structure Of Printed Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/000594 WO2024150370A1 (ja) | 2023-01-12 | 2023-01-12 | 絶縁基板および半導体装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN120500746A true CN120500746A (zh) | 2025-08-15 |
Family
ID=91896560
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202380090039.4A Pending CN120500746A (zh) | 2023-01-12 | 2023-01-12 | 绝缘基板及半导体装置 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JPWO2024150370A1 (https=) |
| CN (1) | CN120500746A (https=) |
| DE (1) | DE112023005604T5 (https=) |
| WO (1) | WO2024150370A1 (https=) |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3932343B2 (ja) * | 1996-08-27 | 2007-06-20 | Dowaメタルテック株式会社 | 半導体用基板およびその製造方法 |
| JP4904916B2 (ja) * | 2006-05-18 | 2012-03-28 | 三菱マテリアル株式会社 | パワーモジュール用基板およびパワーモジュール用基板の製造方法並びにパワーモジュール |
| JP4926033B2 (ja) * | 2007-12-25 | 2012-05-09 | 京セラ株式会社 | 回路基板及びこれを用いたパッケージ並びに電子装置 |
| JP2014027221A (ja) * | 2012-07-30 | 2014-02-06 | Kyocera Corp | 回路基板およびそれを用いた電子装置 |
| JP6201490B2 (ja) * | 2013-07-30 | 2017-09-27 | 株式会社豊田自動織機 | 半導体装置 |
| JP6210818B2 (ja) * | 2013-09-30 | 2017-10-11 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| US10170433B2 (en) * | 2014-12-18 | 2019-01-01 | Mitsubishi Electric Corporation | Insulated circuit board, power module and power unit |
| EP3358614B1 (en) * | 2015-09-28 | 2022-12-14 | Kabushiki Kaisha Toshiba | Circuit substrate and semiconductor device |
-
2023
- 2023-01-12 CN CN202380090039.4A patent/CN120500746A/zh active Pending
- 2023-01-12 JP JP2024569943A patent/JPWO2024150370A1/ja active Pending
- 2023-01-12 WO PCT/JP2023/000594 patent/WO2024150370A1/ja not_active Ceased
- 2023-01-12 DE DE112023005604.8T patent/DE112023005604T5/de active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2024150370A1 (https=) | 2024-07-18 |
| DE112023005604T5 (de) | 2025-11-06 |
| WO2024150370A1 (ja) | 2024-07-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |