CN118591726A - 金属材料的表面检查方法、金属材料的表面检查装置和金属材料 - Google Patents

金属材料的表面检查方法、金属材料的表面检查装置和金属材料 Download PDF

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Publication number
CN118591726A
CN118591726A CN202380018899.7A CN202380018899A CN118591726A CN 118591726 A CN118591726 A CN 118591726A CN 202380018899 A CN202380018899 A CN 202380018899A CN 118591726 A CN118591726 A CN 118591726A
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CN
China
Prior art keywords
metal material
light
images
surface inspection
photographing
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Pending
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CN202380018899.7A
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English (en)
Chinese (zh)
Inventor
新妻勇哉
大野纮明
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JFE Steel Corp
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JFE Steel Corp
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Application filed by JFE Steel Corp filed Critical JFE Steel Corp
Publication of CN118591726A publication Critical patent/CN118591726A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8845—Multiple wavelengths of illumination or detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Textile Engineering (AREA)
  • Computing Systems (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Artificial Intelligence (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Signal Processing (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN202380018899.7A 2022-03-03 2023-01-31 金属材料的表面检查方法、金属材料的表面检查装置和金属材料 Pending CN118591726A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022-032278 2022-03-03
JP2022032278 2022-03-03
PCT/JP2023/003026 WO2023166898A1 (ja) 2022-03-03 2023-01-31 金属材料の表面検査方法、金属材料の表面検査装置、及び金属材料

Publications (1)

Publication Number Publication Date
CN118591726A true CN118591726A (zh) 2024-09-03

Family

ID=87883270

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202380018899.7A Pending CN118591726A (zh) 2022-03-03 2023-01-31 金属材料的表面检查方法、金属材料的表面检查装置和金属材料

Country Status (7)

Country Link
US (1) US20250116609A1 (https=)
EP (1) EP4443143A4 (https=)
JP (2) JP7741179B2 (https=)
KR (1) KR20240129014A (https=)
CN (1) CN118591726A (https=)
TW (1) TWI849729B (https=)
WO (1) WO2023166898A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119131014A (zh) * 2024-11-08 2024-12-13 宁德时代新能源科技股份有限公司 图像处理方法、缺陷检测方法及相关装置和存储介质

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102880634B1 (ko) * 2024-12-17 2025-11-04 (주)피앤씨네트워크 철강 금속표면 Shear Line 자동화 공정을 위한 지능형시스템

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5952735A (ja) 1982-09-20 1984-03-27 Kawasaki Steel Corp 熱間鋼片の表面欠陥検出方法
JPH0431753A (ja) * 1990-05-28 1992-02-03 Dainippon Printing Co Ltd 異物検査装置
JPH04113260A (ja) * 1990-09-03 1992-04-14 Nkk Corp 表面欠陥の検出方法及び装置
JPH1137949A (ja) 1997-07-22 1999-02-12 Sumitomo Metal Ind Ltd 表面疵検知方法及び装置
JP3452486B2 (ja) * 1998-05-25 2003-09-29 株式会社神戸製鋼所 圧延材の表面欠陥検出方法および装置
JP5659540B2 (ja) * 2009-04-15 2015-01-28 Ｊｆｅスチール株式会社 鋼板表面欠陥検査方法および装置
JP2011191252A (ja) * 2010-03-16 2011-09-29 Nippon Steel Engineering Co Ltd 金属の表面品質評価方法および金属の表面品質評価装置
KR101078404B1 (ko) * 2011-07-18 2011-11-01 주식회사 네드텍 금속 표면 결함 검출을 위한 카메라．카메라를 포함하는 금속 표면 결함 검출 장치，및 금속 표면 결함 검출 방법
JP6040930B2 (ja) 2013-12-27 2016-12-07 Ｊｆｅスチール株式会社 表面欠陥検出方法及び表面欠陥検出装置
CN107709977B (zh) 2015-06-25 2020-05-08 杰富意钢铁株式会社 表面缺陷检测装置及表面缺陷检测方法
JP6769182B2 (ja) * 2016-09-01 2020-10-14 日本製鉄株式会社 鋼材の表面検査装置及び表面検査方法
JPWO2019151393A1 (ja) * 2018-01-31 2020-12-03 株式会社ニチレイフーズ 食品検査システム、食品検査プログラム、食品検査方法および食品生産方法
EP3678143B1 (en) * 2018-10-01 2023-08-16 Sumitomo Electric Toyama Co., Ltd. Method and device for manufacturing plated wire
MX2022008936A (es) * 2020-01-20 2022-08-11 Jfe Steel Corp Dispositivo de inspeccion de superficie, metodo de inspeccion de superficie, metodo de fabricacion de material de acero, metodo de gestion de calidad del material de acero, e instalacion de fabricacion para material de acero.
TWM594136U (zh) * 2020-02-04 2020-04-21 國立高雄科技大學 金屬表面瑕疵檢測系統

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119131014A (zh) * 2024-11-08 2024-12-13 宁德时代新能源科技股份有限公司 图像处理方法、缺陷检测方法及相关装置和存储介质
CN119131014B (zh) * 2024-11-08 2025-03-14 宁德时代新能源科技股份有限公司 图像处理方法、缺陷检测方法及相关装置和存储介质

Also Published As

Publication number Publication date
JPWO2023166898A1 (https=) 2023-09-07
TW202400996A (zh) 2024-01-01
WO2023166898A1 (ja) 2023-09-07
TWI849729B (zh) 2024-07-21
JP2025135005A (ja) 2025-09-17
JP7741179B2 (ja) 2025-09-17
EP4443143A1 (en) 2024-10-09
US20250116609A1 (en) 2025-04-10
KR20240129014A (ko) 2024-08-27
EP4443143A4 (en) 2025-03-12

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