KR20240129014A - 금속 재료의 표면 검사 방법, 금속 재료의 표면 검사 장치 및, 금속 재료 - Google Patents

금속 재료의 표면 검사 방법, 금속 재료의 표면 검사 장치 및, 금속 재료 Download PDF

Info

Publication number
KR20240129014A
KR20240129014A KR1020247025500A KR20247025500A KR20240129014A KR 20240129014 A KR20240129014 A KR 20240129014A KR 1020247025500 A KR1020247025500 A KR 1020247025500A KR 20247025500 A KR20247025500 A KR 20247025500A KR 20240129014 A KR20240129014 A KR 20240129014A
Authority
KR
South Korea
Prior art keywords
metal material
light
images
image
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020247025500A
Other languages
English (en)
Korean (ko)
Inventor
유야 니이즈마
히로아키 오노
Original Assignee
제이에프이 스틸 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 제이에프이 스틸 가부시키가이샤 filed Critical 제이에프이 스틸 가부시키가이샤
Publication of KR20240129014A publication Critical patent/KR20240129014A/ko
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8845—Multiple wavelengths of illumination or detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Textile Engineering (AREA)
  • Computing Systems (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Artificial Intelligence (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Signal Processing (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020247025500A 2022-03-03 2023-01-31 금속 재료의 표면 검사 방법, 금속 재료의 표면 검사 장치 및, 금속 재료 Pending KR20240129014A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2022-032278 2022-03-03
JP2022032278 2022-03-03
PCT/JP2023/003026 WO2023166898A1 (ja) 2022-03-03 2023-01-31 金属材料の表面検査方法、金属材料の表面検査装置、及び金属材料

Publications (1)

Publication Number Publication Date
KR20240129014A true KR20240129014A (ko) 2024-08-27

Family

ID=87883270

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020247025500A Pending KR20240129014A (ko) 2022-03-03 2023-01-31 금속 재료의 표면 검사 방법, 금속 재료의 표면 검사 장치 및, 금속 재료

Country Status (7)

Country Link
US (1) US20250116609A1 (https=)
EP (1) EP4443143A4 (https=)
JP (2) JP7741179B2 (https=)
KR (1) KR20240129014A (https=)
CN (1) CN118591726A (https=)
TW (1) TWI849729B (https=)
WO (1) WO2023166898A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102880634B1 (ko) * 2024-12-17 2025-11-04 (주)피앤씨네트워크 철강 금속표면 Shear Line 자동화 공정을 위한 지능형시스템

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119131014B (zh) * 2024-11-08 2025-03-14 宁德时代新能源科技股份有限公司 图像处理方法、缺陷检测方法及相关装置和存储介质

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5952735A (ja) 1982-09-20 1984-03-27 Kawasaki Steel Corp 熱間鋼片の表面欠陥検出方法
JPH1137949A (ja) 1997-07-22 1999-02-12 Sumitomo Metal Ind Ltd 表面疵検知方法及び装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0431753A (ja) * 1990-05-28 1992-02-03 Dainippon Printing Co Ltd 異物検査装置
JPH04113260A (ja) * 1990-09-03 1992-04-14 Nkk Corp 表面欠陥の検出方法及び装置
JP3452486B2 (ja) * 1998-05-25 2003-09-29 株式会社神戸製鋼所 圧延材の表面欠陥検出方法および装置
JP5659540B2 (ja) * 2009-04-15 2015-01-28 Ｊｆｅスチール株式会社 鋼板表面欠陥検査方法および装置
JP2011191252A (ja) * 2010-03-16 2011-09-29 Nippon Steel Engineering Co Ltd 金属の表面品質評価方法および金属の表面品質評価装置
KR101078404B1 (ko) * 2011-07-18 2011-11-01 주식회사 네드텍 금속 표면 결함 검출을 위한 카메라．카메라를 포함하는 금속 표면 결함 검출 장치，및 금속 표면 결함 검출 방법
JP6040930B2 (ja) 2013-12-27 2016-12-07 Ｊｆｅスチール株式会社 表面欠陥検出方法及び表面欠陥検出装置
CN107709977B (zh) 2015-06-25 2020-05-08 杰富意钢铁株式会社 表面缺陷检测装置及表面缺陷检测方法
JP6769182B2 (ja) * 2016-09-01 2020-10-14 日本製鉄株式会社 鋼材の表面検査装置及び表面検査方法
JPWO2019151393A1 (ja) * 2018-01-31 2020-12-03 株式会社ニチレイフーズ 食品検査システム、食品検査プログラム、食品検査方法および食品生産方法
EP3678143B1 (en) * 2018-10-01 2023-08-16 Sumitomo Electric Toyama Co., Ltd. Method and device for manufacturing plated wire
MX2022008936A (es) * 2020-01-20 2022-08-11 Jfe Steel Corp Dispositivo de inspeccion de superficie, metodo de inspeccion de superficie, metodo de fabricacion de material de acero, metodo de gestion de calidad del material de acero, e instalacion de fabricacion para material de acero.
TWM594136U (zh) * 2020-02-04 2020-04-21 國立高雄科技大學 金屬表面瑕疵檢測系統

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5952735A (ja) 1982-09-20 1984-03-27 Kawasaki Steel Corp 熱間鋼片の表面欠陥検出方法
JPH1137949A (ja) 1997-07-22 1999-02-12 Sumitomo Metal Ind Ltd 表面疵検知方法及び装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102880634B1 (ko) * 2024-12-17 2025-11-04 (주)피앤씨네트워크 철강 금속표면 Shear Line 자동화 공정을 위한 지능형시스템

Also Published As

Publication number Publication date
JPWO2023166898A1 (https=) 2023-09-07
TW202400996A (zh) 2024-01-01
WO2023166898A1 (ja) 2023-09-07
TWI849729B (zh) 2024-07-21
JP2025135005A (ja) 2025-09-17
JP7741179B2 (ja) 2025-09-17
EP4443143A1 (en) 2024-10-09
US20250116609A1 (en) 2025-04-10
EP4443143A4 (en) 2025-03-12
CN118591726A (zh) 2024-09-03

Similar Documents

Publication Publication Date Title
US10890537B2 (en) Appearance inspection device, lighting device, and imaging lighting device
KR101832081B1 (ko) 표면 결함 검출 방법 및 표면 결함 검출 장치
JP5031691B2 (ja) 表面疵検査装置
EP3179205B1 (en) Metal body shape inspection apparatus and metal body shape inspection method
JP2025135005A (ja) 鋼材の表面検査方法及び表面検査装置
JP2000241362A (ja) 表面品質検査装置及びその方法
JP2011047724A (ja) 欠陥検査装置およびその方法
US12467876B2 (en) Surface inspection device, surface inspection method, and manufacturing method of metal strip
CN101014850A (zh) 利用反射和荧光图像检查电路的系统和方法
WO2020110667A1 (ja) 表面欠陥検出方法、表面欠陥検出装置、鋼材の製造方法、鋼材の品質管理方法、鋼材の製造設備、表面欠陥判定モデルの生成方法、及び表面欠陥判定モデル
JP4024381B2 (ja) 欠陥検査方法および装置
CN101198858B (zh) 用于检测行进中的长产品的表面和结构缺陷的方法和设备
JP2008209211A (ja) 異物検査装置および異物検査方法
JP2010117322A (ja) 表面疵検査装置、表面疵検査方法及びプログラム
JP2001242091A (ja) 表面検査のための方法及び装置
JP2017040510A (ja) 検査装置、検査方法および物体製造方法
JP4932595B2 (ja) 表面疵検査装置
JP7136064B2 (ja) 被検査体の表面検査装置および被検査体の表面検査方法
JP7613336B2 (ja) 金属帯の表面検査装置、表面検査方法、及び製造方法
JP2004138417A (ja) 鋼板の疵検査方法およびその装置
CN118518674A (zh) 一种异型坯钢种表面监测装置、方法
JP7411155B2 (ja) 色ムラ検査装置および色ムラ検査方法
JP2025036089A (ja) 金属材料の表面検査方法、金属材料の表面検査装置、金属材料、金属材料の製造方法、金属材料の品質管理方法、及び金属材料の製造設備
KR100345724B1 (ko) 다파장 광원과 칼라씨씨디 카메라를 이용한 강판의 표면흠검출장치
JP2007205974A (ja) メッキの検査方法及びリードフレームの検査方法

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20240729

Patent event code: PA01051R01D

Comment text: International Patent Application

PA0201 Request for examination
PG1501 Laying open of application