JPWO2023166898A1 - - Google Patents
Info
- Publication number
- JPWO2023166898A1 JPWO2023166898A1 JP2023528049A JP2023528049A JPWO2023166898A1 JP WO2023166898 A1 JPWO2023166898 A1 JP WO2023166898A1 JP 2023528049 A JP2023528049 A JP 2023528049A JP 2023528049 A JP2023528049 A JP 2023528049A JP WO2023166898 A1 JPWO2023166898 A1 JP WO2023166898A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/204—Structure thereof, e.g. crystal structure
- G01N33/2045—Defects
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8845—Multiple wavelengths of illumination or detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8858—Flaw counting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
- G01N2021/8918—Metal
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Theoretical Computer Science (AREA)
- Software Systems (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Textile Engineering (AREA)
- Computing Systems (AREA)
- Data Mining & Analysis (AREA)
- Evolutionary Computation (AREA)
- Medical Informatics (AREA)
- Artificial Intelligence (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Medicinal Chemistry (AREA)
- Food Science & Technology (AREA)
- Signal Processing (AREA)
- Crystallography & Structural Chemistry (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2025113885A JP2025135005A (ja) | 2022-03-03 | 2025-07-04 | 鋼材の表面検査方法及び表面検査装置 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022032278 | 2022-03-03 | ||
| JP2022032278 | 2022-03-03 | ||
| PCT/JP2023/003026 WO2023166898A1 (ja) | 2022-03-03 | 2023-01-31 | 金属材料の表面検査方法、金属材料の表面検査装置、及び金属材料 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025113885A Division JP2025135005A (ja) | 2022-03-03 | 2025-07-04 | 鋼材の表面検査方法及び表面検査装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2023166898A1 true JPWO2023166898A1 (https=) | 2023-09-07 |
| JPWO2023166898A5 JPWO2023166898A5 (https=) | 2024-02-07 |
| JP7741179B2 JP7741179B2 (ja) | 2025-09-17 |
Family
ID=87883270
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023528049A Active JP7741179B2 (ja) | 2022-03-03 | 2023-01-31 | 鋼材の表面検査方法及び表面検査装置 |
| JP2025113885A Pending JP2025135005A (ja) | 2022-03-03 | 2025-07-04 | 鋼材の表面検査方法及び表面検査装置 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025113885A Pending JP2025135005A (ja) | 2022-03-03 | 2025-07-04 | 鋼材の表面検査方法及び表面検査装置 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20250116609A1 (https=) |
| EP (1) | EP4443143A4 (https=) |
| JP (2) | JP7741179B2 (https=) |
| KR (1) | KR20240129014A (https=) |
| CN (1) | CN118591726A (https=) |
| TW (1) | TWI849729B (https=) |
| WO (1) | WO2023166898A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN119131014B (zh) * | 2024-11-08 | 2025-03-14 | 宁德时代新能源科技股份有限公司 | 图像处理方法、缺陷检测方法及相关装置和存储介质 |
| KR102880634B1 (ko) * | 2024-12-17 | 2025-11-04 | (주)피앤씨네트워크 | 철강 금속표면 Shear Line 자동화 공정을 위한 지능형시스템 |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0431753A (ja) * | 1990-05-28 | 1992-02-03 | Dainippon Printing Co Ltd | 異物検査装置 |
| JPH04113260A (ja) * | 1990-09-03 | 1992-04-14 | Nkk Corp | 表面欠陥の検出方法及び装置 |
| JPH11337502A (ja) * | 1998-05-25 | 1999-12-10 | Kobe Steel Ltd | 圧延材の表面欠陥検出方法および装置 |
| JP2010266430A (ja) * | 2009-04-15 | 2010-11-25 | Jfe Steel Corp | 鋼板表面欠陥検査方法および装置 |
| JP2011191252A (ja) * | 2010-03-16 | 2011-09-29 | Nippon Steel Engineering Co Ltd | 金属の表面品質評価方法および金属の表面品質評価装置 |
| WO2013012106A1 (ko) * | 2011-07-18 | 2013-01-24 | 동국대학교 경주캠퍼스 산학협력단 | 금속 표면 결함 검출을 위한 카메라, 카메라를 포함하는 금속 표면 결함 검출 장치, 및 금속 표면 결함 검출 방법 |
| JP2018036175A (ja) * | 2016-09-01 | 2018-03-08 | 新日鐵住金株式会社 | 鋼材の表面検査装置及び表面検査方法 |
| WO2019151393A1 (ja) * | 2018-01-31 | 2019-08-08 | 株式会社ニチレイフーズ | 食品検査システム、食品検査プログラム、食品検査方法および食品生産方法 |
| WO2021149588A1 (ja) * | 2020-01-20 | 2021-07-29 | Ｊｆｅスチール株式会社 | 表面検査装置、表面検査方法、鋼材の製造方法、鋼材の品質管理方法、及び鋼材の製造設備 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5952735A (ja) | 1982-09-20 | 1984-03-27 | Kawasaki Steel Corp | 熱間鋼片の表面欠陥検出方法 |
| JPH1137949A (ja) | 1997-07-22 | 1999-02-12 | Sumitomo Metal Ind Ltd | 表面疵検知方法及び装置 |
| JP6040930B2 (ja) | 2013-12-27 | 2016-12-07 | Ｊｆｅスチール株式会社 | 表面欠陥検出方法及び表面欠陥検出装置 |
| CN107709977B (zh) | 2015-06-25 | 2020-05-08 | 杰富意钢铁株式会社 | 表面缺陷检测装置及表面缺陷检测方法 |
| EP3678143B1 (en) * | 2018-10-01 | 2023-08-16 | Sumitomo Electric Toyama Co., Ltd. | Method and device for manufacturing plated wire |
| TWM594136U (zh) * | 2020-02-04 | 2020-04-21 | 國立高雄科技大學 | 金屬表面瑕疵檢測系統 |
-
2023
- 2023-01-31 KR KR1020247025500A patent/KR20240129014A/ko active Pending
- 2023-01-31 WO PCT/JP2023/003026 patent/WO2023166898A1/ja not_active Ceased
- 2023-01-31 CN CN202380018899.7A patent/CN118591726A/zh active Pending
- 2023-01-31 US US18/729,440 patent/US20250116609A1/en active Pending
- 2023-01-31 JP JP2023528049A patent/JP7741179B2/ja active Active
- 2023-01-31 EP EP23763160.1A patent/EP4443143A4/en active Pending
- 2023-02-08 TW TW112104422A patent/TWI849729B/zh active
-
2025
- 2025-07-04 JP JP2025113885A patent/JP2025135005A/ja active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0431753A (ja) * | 1990-05-28 | 1992-02-03 | Dainippon Printing Co Ltd | 異物検査装置 |
| JPH04113260A (ja) * | 1990-09-03 | 1992-04-14 | Nkk Corp | 表面欠陥の検出方法及び装置 |
| JPH11337502A (ja) * | 1998-05-25 | 1999-12-10 | Kobe Steel Ltd | 圧延材の表面欠陥検出方法および装置 |
| JP2010266430A (ja) * | 2009-04-15 | 2010-11-25 | Jfe Steel Corp | 鋼板表面欠陥検査方法および装置 |
| JP2011191252A (ja) * | 2010-03-16 | 2011-09-29 | Nippon Steel Engineering Co Ltd | 金属の表面品質評価方法および金属の表面品質評価装置 |
| WO2013012106A1 (ko) * | 2011-07-18 | 2013-01-24 | 동국대학교 경주캠퍼스 산학협력단 | 금속 표면 결함 검출을 위한 카메라, 카메라를 포함하는 금속 표면 결함 검출 장치, 및 금속 표면 결함 검출 방법 |
| JP2018036175A (ja) * | 2016-09-01 | 2018-03-08 | 新日鐵住金株式会社 | 鋼材の表面検査装置及び表面検査方法 |
| WO2019151393A1 (ja) * | 2018-01-31 | 2019-08-08 | 株式会社ニチレイフーズ | 食品検査システム、食品検査プログラム、食品検査方法および食品生産方法 |
| WO2021149588A1 (ja) * | 2020-01-20 | 2021-07-29 | Ｊｆｅスチール株式会社 | 表面検査装置、表面検査方法、鋼材の製造方法、鋼材の品質管理方法、及び鋼材の製造設備 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202400996A (zh) | 2024-01-01 |
| WO2023166898A1 (ja) | 2023-09-07 |
| TWI849729B (zh) | 2024-07-21 |
| JP2025135005A (ja) | 2025-09-17 |
| JP7741179B2 (ja) | 2025-09-17 |
| EP4443143A1 (en) | 2024-10-09 |
| US20250116609A1 (en) | 2025-04-10 |
| KR20240129014A (ko) | 2024-08-27 |
| EP4443143A4 (en) | 2025-03-12 |
| CN118591726A (zh) | 2024-09-03 |
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