CN118302856A - 具有阶梯形衬底迹线的多层封装衬底 - Google Patents

具有阶梯形衬底迹线的多层封装衬底 Download PDF

Info

Publication number
CN118302856A
CN118302856A CN202280077803.XA CN202280077803A CN118302856A CN 118302856 A CN118302856 A CN 118302856A CN 202280077803 A CN202280077803 A CN 202280077803A CN 118302856 A CN118302856 A CN 118302856A
Authority
CN
China
Prior art keywords
conductive trace
level
thickness
feature
conductive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280077803.XA
Other languages
English (en)
Chinese (zh)
Inventor
J·M·威廉森
罗春平
铃木裕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of CN118302856A publication Critical patent/CN118302856A/zh
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/68—Shapes or dispositions thereof
    • H10W70/685—Shapes or dispositions thereof comprising multiple insulating layers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/65—Shapes or dispositions of interconnections
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00—Arrangements for thermal protection or thermal control
    • H10W40/20—Arrangements for cooling
    • H10W40/22—Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00—Arrangements for thermal protection or thermal control
    • H10W40/20—Arrangements for cooling
    • H10W40/25—Arrangements for cooling characterised by their materials
    • H10W40/251—Organics
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/01—Manufacture or treatment
    • H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/099—Connecting interconnections to insulating or insulated package substrates, interposers or redistribution layers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/63—Vias, e.g. via plugs
    • H10W70/635—Through-vias
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/071—Connecting or disconnecting
    • H10W72/072—Connecting or disconnecting of bump connectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/251—Materials
    • H10W72/252—Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00—Package configurations
    • H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00—Package configurations
    • H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Structure Of Printed Boards (AREA)
CN202280077803.XA 2021-12-28 2022-12-28 具有阶梯形衬底迹线的多层封装衬底 Pending CN118302856A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US17/563,403 2021-12-28
US17/563,403 US12266597B2 (en) 2021-12-28 2021-12-28 Multilevel package substrate with stair shaped substrate traces
PCT/US2022/054139 WO2023129582A1 (en) 2021-12-28 2022-12-28 Multilevel package substrate with stair shaped substrate traces

Publications (1)

Publication Number Publication Date
CN118302856A true CN118302856A (zh) 2024-07-05

Family

ID=86897129

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280077803.XA Pending CN118302856A (zh) 2021-12-28 2022-12-28 具有阶梯形衬底迹线的多层封装衬底

Country Status (4)

Country Link
US (2) US12266597B2 (enExample)
JP (1) JP2025501951A (enExample)
CN (1) CN118302856A (enExample)
WO (1) WO2023129582A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12702007B2 (en) * 2023-06-29 2026-08-04 Texas Instruments Incorporated Multilevel package substrate for interlevel dielectric crack mitigation

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011138869A (ja) 2009-12-28 2011-07-14 Ngk Spark Plug Co Ltd 多層配線基板の製造方法及び多層配線基板
TWI528517B (zh) * 2013-03-26 2016-04-01 威盛電子股份有限公司 線路基板、半導體封裝結構及線路基板製程
JP6162458B2 (ja) 2013-04-05 2017-07-12 新光電気工業株式会社 配線基板、半導体装置及び配線基板の製造方法
US10867924B2 (en) 2017-07-06 2020-12-15 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor package with redistribution structure and pre-made substrate on opposing sides for dual-side metal routing
US11769719B2 (en) * 2018-06-25 2023-09-26 Intel Corporation Dual trace thickness for single layer routing
TWI738069B (zh) 2019-09-27 2021-09-01 恆勁科技股份有限公司 覆晶封裝基板及其製法

Also Published As

Publication number Publication date
US12266597B2 (en) 2025-04-01
JP2025501951A (ja) 2025-01-24
US20230207435A1 (en) 2023-06-29
WO2023129582A1 (en) 2023-07-06
US20250201689A1 (en) 2025-06-19

Similar Documents

Publication Publication Date Title
KR100891269B1 (ko) 반도체 장치 및 그 제조 방법
US7473992B2 (en) Multi-layer interconnection circuit module and manufacturing method thereof
KR100395862B1 (ko) 플립 칩형 반도체 장치 및 플립 칩형 반도체 장치 제조 방법
US7839649B2 (en) Circuit board structure having embedded semiconductor element and fabrication method thereof
CN104428892B (zh) 用于基板核心层的方法和装置
JP4701506B2 (ja) 回路ブロック体の製造方法、配線回路装置の製造方法並びに半導体装置の製造方法
TWI402954B (zh) Assembly board and semiconductor module
KR101255954B1 (ko) 인쇄회로기판 및 인쇄회로기판 제조 방법
US9324580B2 (en) Process for fabricating a circuit substrate
JP2008166821A (ja) Rfモジュールパッケージ及びその形成方法
KR20080093909A (ko) 히트 싱크 및 그라운드 차폐의 기능들을 개선하기 위한반도체 디바이스 패키지
CN114050132A (zh) 半导体设备封装及其制造方法
KR20110010015A (ko) 반도체 패키지 및 이의 제조 방법
US9247654B2 (en) Carrier substrate and manufacturing method thereof
JP2010239126A (ja) 半導体装置および半導体装置の製造方法
JP2011192726A (ja) 電子装置および電子装置の製造方法
US8436463B2 (en) Packaging substrate structure with electronic component embedded therein and method for manufacture of the same
JP2017050310A (ja) 電子部品装置及びその製造方法
TWI451548B (zh) 佈線基板及其製造方法,暨半導體裝置
KR20240017393A (ko) 반도체 장치 및 이의 제조 방법
US20250201689A1 (en) Multilevel package substrate with stair shaped substrate traces
KR20150065029A (ko) 인쇄회로기판, 그 제조방법 및 반도체 패키지
CN104167369B (zh) 芯片封装结构的制作方法
CN102711390A (zh) 线路板制作方法
US10269692B1 (en) Package structure and method of forming the same

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination