CN1156851C - 具有位线参考电压的集成存储器和产生该电压的方法 - Google Patents
具有位线参考电压的集成存储器和产生该电压的方法 Download PDFInfo
- Publication number
- CN1156851C CN1156851C CNB01111908XA CN01111908A CN1156851C CN 1156851 C CN1156851 C CN 1156851C CN B01111908X A CNB01111908X A CN B01111908XA CN 01111908 A CN01111908 A CN 01111908A CN 1156851 C CN1156851 C CN 1156851C
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- China
- Prior art keywords
- bit line
- bli
- bit lines
- reference voltage
- reference bit
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000015654 memory Effects 0.000 title claims abstract description 31
- 238000000034 method Methods 0.000 title claims description 15
- 239000003990 capacitor Substances 0.000 claims abstract description 31
- 230000005540 biological transmission Effects 0.000 claims description 2
- 238000012546 transfer Methods 0.000 abstract description 9
- 239000004065 semiconductor Substances 0.000 abstract 2
- 230000003071 parasitic effect Effects 0.000 description 14
- 238000010586 diagram Methods 0.000 description 3
- 230000010287 polarization Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000011017 operating method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
Abstract
Description
Claims (7)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10014387.3 | 2000-03-23 | ||
DE10014387A DE10014387C1 (de) | 2000-03-23 | 2000-03-23 | Integrierter Speicher mit Bitleitungsreferenzspannung und Verfahren zum Erzeugen der Bitleitungsreferenzspannung |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1317798A CN1317798A (zh) | 2001-10-17 |
CN1156851C true CN1156851C (zh) | 2004-07-07 |
Family
ID=7636019
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB01111908XA Expired - Fee Related CN1156851C (zh) | 2000-03-23 | 2001-03-23 | 具有位线参考电压的集成存储器和产生该电压的方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US6347059B2 (zh) |
EP (1) | EP1137009A3 (zh) |
JP (1) | JP3636991B2 (zh) |
KR (1) | KR20010103585A (zh) |
CN (1) | CN1156851C (zh) |
DE (1) | DE10014387C1 (zh) |
TW (1) | TW518605B (zh) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100385571C (zh) * | 2001-11-28 | 2008-04-30 | 旺宏电子股份有限公司 | 铁电电容的参考电压产生方法、逻辑判断方式与装置 |
US6603693B2 (en) * | 2001-12-12 | 2003-08-05 | Micron Technology, Inc. | DRAM with bias sensing |
KR100463602B1 (ko) * | 2001-12-29 | 2004-12-29 | 주식회사 하이닉스반도체 | 불휘발성 강유전체 메모리의 배선 |
KR100500944B1 (ko) | 2002-12-11 | 2005-07-14 | 주식회사 하이닉스반도체 | 전류 이득 트랜지스터의 크기 조절을 통해 기준 전압을생성하는 강유전체 메모리 장치 |
JP2004213722A (ja) * | 2002-12-27 | 2004-07-29 | Matsushita Electric Ind Co Ltd | 半導体記憶装置及び半導体集積回路装置 |
US6856535B2 (en) * | 2003-01-21 | 2005-02-15 | Texas Instruments Incorporated | Reference voltage generator for ferroelectric memory |
US6826094B1 (en) * | 2003-06-02 | 2004-11-30 | Hewlett-Packard Development Company, L.P. | Magnetic memory cell sensing with first and second currents |
JP2006024263A (ja) * | 2004-07-07 | 2006-01-26 | Seiko Epson Corp | 強誘電体記憶装置、電子機器 |
US7200027B2 (en) * | 2004-12-29 | 2007-04-03 | Texas Instruments Incorporated | Ferroelectric memory reference generator systems using staging capacitors |
JP2008047189A (ja) | 2006-08-11 | 2008-02-28 | Matsushita Electric Ind Co Ltd | 半導体記憶装置 |
US8223571B2 (en) * | 2010-07-20 | 2012-07-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | Generating and amplifying differential signals |
US10082964B2 (en) * | 2016-04-27 | 2018-09-25 | Micron Technology, Inc | Data caching for ferroelectric memory |
US9886991B1 (en) | 2016-09-30 | 2018-02-06 | Micron Technology, Inc. | Techniques for sensing logic values stored in memory cells using sense amplifiers that are selectively isolated from digit lines |
CN106739400B (zh) * | 2016-11-28 | 2019-10-22 | 宁波视睿迪光电有限公司 | 一种光学透明胶贴合方法 |
CN107783871B (zh) * | 2017-10-19 | 2021-06-11 | 郑州云海信息技术有限公司 | 一种usb信号一致性码型切换器、测试系统 |
US10699783B1 (en) * | 2018-12-26 | 2020-06-30 | Micron Technology | Sensing techniques using a moving reference |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4937476A (en) * | 1988-06-16 | 1990-06-26 | Intel Corporation | Self-biased, high-gain differential amplifier with feedback |
KR940004406B1 (ko) * | 1991-09-27 | 1994-05-25 | 현대전자산업 주식회사 | Nand형 셀의 감지증폭기 |
US5572459A (en) * | 1994-09-16 | 1996-11-05 | Ramtron International Corporation | Voltage reference for a ferroelectric 1T/1C based memory |
DE19903199A1 (de) * | 1999-01-27 | 1999-08-05 | Siemens Ag | Integrierter Speicher |
KR100296917B1 (ko) * | 1999-06-28 | 2001-07-12 | 박종섭 | 강유전체 메모리 소자의 기준 전압 발생 장치 |
-
2000
- 2000-03-23 DE DE10014387A patent/DE10014387C1/de not_active Expired - Fee Related
-
2001
- 2001-03-13 EP EP01106086A patent/EP1137009A3/de not_active Withdrawn
- 2001-03-22 JP JP2001083633A patent/JP3636991B2/ja not_active Expired - Fee Related
- 2001-03-22 TW TW090106782A patent/TW518605B/zh not_active IP Right Cessation
- 2001-03-23 KR KR1020010015123A patent/KR20010103585A/ko active Search and Examination
- 2001-03-23 CN CNB01111908XA patent/CN1156851C/zh not_active Expired - Fee Related
- 2001-03-23 US US09816925A patent/US6347059B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1317798A (zh) | 2001-10-17 |
KR20010103585A (ko) | 2001-11-23 |
US6347059B2 (en) | 2002-02-12 |
EP1137009A3 (de) | 2001-12-05 |
JP2001307478A (ja) | 2001-11-02 |
DE10014387C1 (de) | 2001-09-27 |
US20010024396A1 (en) | 2001-09-27 |
JP3636991B2 (ja) | 2005-04-06 |
TW518605B (en) | 2003-01-21 |
EP1137009A2 (de) | 2001-09-26 |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee |
Owner name: INFINEON TECHNOLOGIES AG Free format text: FORMER NAME: INFENNIAN TECHNOLOGIES AG |
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CP01 | Change in the name or title of a patent holder |
Address after: Munich, Germany Patentee after: Infineon Technologies AG Address before: Munich, Germany Patentee before: INFINEON TECHNOLOGIES AG |
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TR01 | Transfer of patent right |
Effective date of registration: 20130703 Address after: Munich, Germany Patentee after: QIMONDA AG Address before: Munich, Germany Patentee before: Infineon Technologies AG |
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C41 | Transfer of patent application or patent right or utility model | ||
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Effective date of registration: 20160113 Address after: German Berg, Laura Ibiza Patentee after: Infineon Technologies AG Address before: Munich, Germany Patentee before: QIMONDA AG |
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CF01 | Termination of patent right due to non-payment of annual fee |