CN1149304C - 涂覆和退火大面积玻璃基底的方法 - Google Patents

涂覆和退火大面积玻璃基底的方法 Download PDF

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Publication number
CN1149304C
CN1149304C CNB998035572A CN99803557A CN1149304C CN 1149304 C CN1149304 C CN 1149304C CN B998035572 A CNB998035572 A CN B998035572A CN 99803557 A CN99803557 A CN 99803557A CN 1149304 C CN1149304 C CN 1149304C
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temperature
substrate
amorphous silicon
silicon layer
chamber
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CN1292040A (zh
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W��R����ʲ�ͽ�
W·R·哈什巴杰
蔡娟娟
竹原尚子
���˹���Ѷ���
R·邱
Y·勒格里斯
R·M·罗伯逊
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AKT Inc
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Applied Komatsu Technology Inc
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/24Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/22Surface treatment of glass, not in the form of fibres or filaments, by coating with other inorganic material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/02Pretreatment of the material to be coated
    • C23C16/0209Pretreatment of the material to be coated by heating
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/24Deposition of silicon only
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/56After-treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/29Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
    • H10P14/2901Materials
    • H10P14/2922Materials being non-crystalline insulating materials, e.g. glass or polymers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3402Deposited materials, e.g. layers characterised by the chemical composition
    • H10P14/3404Deposited materials, e.g. layers characterised by the chemical composition being Group IVA materials
    • H10P14/3411Silicon, silicon germanium or germanium
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/36Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by treatments done before the formation of the materials
    • H10P14/3602In-situ cleaning
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2217/00Coatings on glass
    • C03C2217/20Materials for coating a single layer on glass
    • C03C2217/28Other inorganic materials
    • C03C2217/282Carbides, silicides
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2218/00Methods for coating glass
    • C03C2218/10Deposition methods
    • C03C2218/15Deposition methods from the vapour phase
    • C03C2218/152Deposition methods from the vapour phase by cvd
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2218/00Methods for coating glass
    • C03C2218/30Aspects of methods for coating glass not covered above
    • C03C2218/32After-treatment

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  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Mechanical Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Chemical Vapour Deposition (AREA)
  • Recrystallisation Techniques (AREA)
  • Thin Film Transistor (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
CNB998035572A 1998-03-03 1999-03-01 涂覆和退火大面积玻璃基底的方法 Expired - Lifetime CN1149304C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/033,868 1998-03-03
US09/033,868 US6294219B1 (en) 1998-03-03 1998-03-03 Method of annealing large area glass substrates

Publications (2)

Publication Number Publication Date
CN1292040A CN1292040A (zh) 2001-04-18
CN1149304C true CN1149304C (zh) 2004-05-12

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Country Link
US (2) US6294219B1 (https=)
JP (3) JP2002505531A (https=)
KR (1) KR100658235B1 (https=)
CN (1) CN1149304C (https=)
TW (1) TW480245B (https=)
WO (1) WO1999045164A1 (https=)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6276072B1 (en) * 1997-07-10 2001-08-21 Applied Materials, Inc. Method and apparatus for heating and cooling substrates
US6294219B1 (en) * 1998-03-03 2001-09-25 Applied Komatsu Technology, Inc. Method of annealing large area glass substrates
US7192494B2 (en) 1999-03-05 2007-03-20 Applied Materials, Inc. Method and apparatus for annealing copper films
US6786935B1 (en) * 2000-03-10 2004-09-07 Applied Materials, Inc. Vacuum processing system for producing components
DE10112731A1 (de) * 2001-03-14 2002-10-02 Schott Glas Beschichtung von Substraten
US7067439B2 (en) 2002-06-14 2006-06-27 Applied Materials, Inc. ALD metal oxide deposition process using direct oxidation
KR20040021758A (ko) * 2002-09-04 2004-03-11 엘지.필립스 엘시디 주식회사 다결정 실리콘 박막트랜지스터 제조방법
US7199061B2 (en) * 2003-04-21 2007-04-03 Applied Materials, Inc. Pecvd silicon oxide thin film deposition
JP2004335715A (ja) * 2003-05-07 2004-11-25 Toppoly Optoelectronics Corp シリコン酸化層の形成方法
KR101041071B1 (ko) * 2003-12-30 2011-06-13 삼성전자주식회사 가열조리장치
US8119210B2 (en) 2004-05-21 2012-02-21 Applied Materials, Inc. Formation of a silicon oxynitride layer on a high-k dielectric material
US7879409B2 (en) * 2004-07-23 2011-02-01 Applied Materials, Inc. Repeatability of CVD film deposition during sequential processing of substrates in a deposition chamber
US20060105114A1 (en) * 2004-11-16 2006-05-18 White John M Multi-layer high quality gate dielectric for low-temperature poly-silicon TFTs
US7118784B1 (en) * 2005-06-27 2006-10-10 The Regents Of The University Of California Method and apparatus for controlling nucleation in self-assembled films
US7678710B2 (en) 2006-03-09 2010-03-16 Applied Materials, Inc. Method and apparatus for fabricating a high dielectric constant transistor gate using a low energy plasma system
US7837838B2 (en) 2006-03-09 2010-11-23 Applied Materials, Inc. Method of fabricating a high dielectric constant transistor gate using a low energy plasma apparatus
US7645710B2 (en) 2006-03-09 2010-01-12 Applied Materials, Inc. Method and apparatus for fabricating a high dielectric constant transistor gate using a low energy plasma system
JP4951301B2 (ja) * 2006-09-25 2012-06-13 富士フイルム株式会社 光学フィルムの乾燥方法及び装置並びに光学フィルムの製造方法
WO2008039845A2 (en) 2006-09-26 2008-04-03 Applied Materials, Inc. Fluorine plasma treatment of high-k gate stack for defect passivation
US20110177627A1 (en) * 2008-04-18 2011-07-21 Oerlikon Solar Ag, Trübbach Assembly line for photovoltaic devices
US9805641B2 (en) * 2009-09-04 2017-10-31 Semiconductor Energy Laboratory Co., Ltd. Display device and electronic device including the same
CN102971110B (zh) * 2010-06-30 2015-04-15 第一太阳能有限公司 高温活化工艺
DE102011089884B4 (de) * 2011-08-19 2016-03-10 Von Ardenne Gmbh Niedrigemittierende Beschichtung und Verfahren zur Herstellung eines niedrigemittierenden Schichtsystems
CN102655089B (zh) 2011-11-18 2015-08-12 京东方科技集团股份有限公司 一种低温多晶硅薄膜的制作方法
CN103820767B (zh) * 2013-12-27 2016-04-06 中国科学院上海微系统与信息技术研究所 一种改善多晶硅薄膜质量的前处理工艺
CN106064845B (zh) * 2016-05-25 2019-02-22 安徽普氏生态环境工程有限公司 一种用于污水处理的稀土元素掺杂石墨稀电极的制备方法
US10460922B2 (en) * 2017-05-19 2019-10-29 Applied Materials, Inc. Method and apparatus for substrate transfer in a thermal treatment chamber
US11318561B1 (en) 2017-06-14 2022-05-03 United States Of America As Represented By The Secretary Of The Air Force Laser surface melting for outgassing reduction
KR102509390B1 (ko) * 2017-07-24 2023-03-14 어플라이드 머티어리얼스, 인코포레이티드 산화규소 상의 초박형 비정질 규소 막의 연속성을 개선하기 위한 전처리 접근법
KR101977100B1 (ko) * 2018-11-15 2019-05-10 이지메카시스템(주) 렌즈 어셈블리 어닐링 시스템
US11562902B2 (en) * 2020-07-19 2023-01-24 Applied Materials, Inc. Hydrogen management in plasma deposited films

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4339340A (en) * 1975-11-26 1982-07-13 Tokyo Shibaura Electric Co., Ltd. Surface-treating agent adapted for intermediate products of a semiconductor device
JPS58124224A (ja) 1982-01-21 1983-07-23 Toshiba Corp 電子写真用アモルフアス水素化シリコンの製造法
US5259881A (en) 1991-05-17 1993-11-09 Materials Research Corporation Wafer processing cluster tool batch preheating and degassing apparatus
JPS60189971A (ja) * 1984-03-09 1985-09-27 Toshiba Corp 半導体装置の製造方法
JPS6321827A (ja) * 1986-07-15 1988-01-29 Mitsubishi Electric Corp 半導体製造装置
JPH0232531A (ja) * 1988-07-22 1990-02-02 Mitsubishi Electric Corp 半導体製造装置
US5213670A (en) 1989-06-30 1993-05-25 Siemens Aktiengesellschaft Method for manufacturing a polycrystalline layer on a substrate
EP0405451B1 (de) * 1989-06-30 1993-10-27 Siemens Aktiengesellschaft Herstellverfahren für eine polykristalline Siliziumschicht mit definierter Korngrösse und Textur
JP3110792B2 (ja) * 1990-05-15 2000-11-20 旭硝子株式会社 多結晶半導体薄膜トランジスタの製造方法及びアクティブマトリックス基板
US5766344A (en) * 1991-09-21 1998-06-16 Semiconductor Energy Laboratory Co., Ltd. Method for forming a semiconductor
JPH05198507A (ja) * 1991-09-21 1993-08-06 Semiconductor Energy Lab Co Ltd 半導体作製方法
US5372836A (en) * 1992-03-27 1994-12-13 Tokyo Electron Limited Method of forming polycrystalling silicon film in process of manufacturing LCD
US5607009A (en) 1993-01-28 1997-03-04 Applied Materials, Inc. Method of heating and cooling large area substrates and apparatus therefor
DE69304038T2 (de) 1993-01-28 1996-12-19 Applied Materials Inc Vorrichtung für ein Vakuumverfahren mit verbessertem Durchsatz
JPH0714849A (ja) * 1993-06-18 1995-01-17 Fujitsu Ltd 薄膜トランジスタの製造方法
US5492843A (en) * 1993-07-31 1996-02-20 Semiconductor Energy Laboratory Co., Ltd. Method of fabricating semiconductor device and method of processing substrate
KR970006723B1 (ko) * 1993-09-07 1997-04-29 한국과학기술원 입자 크기가 큰 다결정 규소 박막의 제조방법
JPH07183234A (ja) * 1993-12-24 1995-07-21 Semiconductor Energy Lab Co Ltd 多目的基板処理装置およびその動作方法および薄膜集積回路の作製方法
JP3320539B2 (ja) * 1993-12-17 2002-09-03 東京エレクトロン株式会社 被処理体の搬入、搬出装置
JPH07221035A (ja) * 1994-02-07 1995-08-18 Semiconductor Energy Lab Co Ltd 基板処理装置およびその動作方法
JPH0851077A (ja) * 1994-05-30 1996-02-20 Sanyo Electric Co Ltd 多結晶半導体の製造方法及び画像表示デバイスの製造方法及び多結晶半導体の製造装置
JP3072005B2 (ja) * 1994-08-25 2000-07-31 シャープ株式会社 半導体装置及びその製造方法
JP3881715B2 (ja) 1995-02-09 2007-02-14 セイコーエプソン株式会社 結晶性半導体膜の形成方法、アクティブマトリクス装置の製造方法、及び電子装置の製造方法
JPH0936376A (ja) * 1995-07-19 1997-02-07 Sony Corp 薄膜半導体装置の製造方法
WO1997022141A1 (en) 1995-12-14 1997-06-19 Seiko Epson Corporation Method of manufacturing thin film semiconductor device, and thin film semiconductor device
JPH09258247A (ja) * 1996-03-26 1997-10-03 Sharp Corp 液晶表示装置の製造方法および成膜装置
JPH09306837A (ja) * 1996-05-14 1997-11-28 Kanegafuchi Chem Ind Co Ltd 薄膜状半導体およびその製造方法
US6294219B1 (en) * 1998-03-03 2001-09-25 Applied Komatsu Technology, Inc. Method of annealing large area glass substrates

Also Published As

Publication number Publication date
CN1292040A (zh) 2001-04-18
JP2013140990A (ja) 2013-07-18
US6610374B2 (en) 2003-08-26
US20020018862A1 (en) 2002-02-14
KR20010041513A (ko) 2001-05-25
JP2002505531A (ja) 2002-02-19
TW480245B (en) 2002-03-21
WO1999045164A1 (en) 1999-09-10
US6294219B1 (en) 2001-09-25
JP2010272875A (ja) 2010-12-02
KR100658235B1 (ko) 2006-12-14

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