CN114725014A - 导电结构及其制造方法 - Google Patents
导电结构及其制造方法 Download PDFInfo
- Publication number
- CN114725014A CN114725014A CN202210378829.XA CN202210378829A CN114725014A CN 114725014 A CN114725014 A CN 114725014A CN 202210378829 A CN202210378829 A CN 202210378829A CN 114725014 A CN114725014 A CN 114725014A
- Authority
- CN
- China
- Prior art keywords
- metal layer
- layer
- conductive
- substrate
- hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 13
- 239000010410 layer Substances 0.000 claims abstract description 265
- 229910052751 metal Inorganic materials 0.000 claims abstract description 197
- 239000002184 metal Substances 0.000 claims abstract description 197
- 239000000758 substrate Substances 0.000 claims abstract description 77
- 238000000034 method Methods 0.000 claims abstract description 36
- 239000011241 protective layer Substances 0.000 claims abstract description 20
- 239000000463 material Substances 0.000 claims abstract description 8
- 238000000059 patterning Methods 0.000 claims abstract description 5
- 238000005553 drilling Methods 0.000 claims description 28
- 238000004544 sputter deposition Methods 0.000 claims description 11
- 238000002161 passivation Methods 0.000 claims description 10
- 238000007639 printing Methods 0.000 claims description 9
- 238000009713 electroplating Methods 0.000 claims description 8
- 238000007747 plating Methods 0.000 claims description 8
- 239000000126 substance Substances 0.000 claims description 7
- 238000007772 electroless plating Methods 0.000 claims description 6
- 230000000149 penetrating effect Effects 0.000 claims description 4
- 238000004140 cleaning Methods 0.000 claims description 3
- 238000001704 evaporation Methods 0.000 claims description 3
- 230000008020 evaporation Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 8
- 239000004642 Polyimide Substances 0.000 description 3
- 229920001721 polyimide Polymers 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 239000002033 PVDF binder Substances 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 229920002981 polyvinylidene fluoride Polymers 0.000 description 2
- 229910000570 Cupronickel Inorganic materials 0.000 description 1
- 229910001069 Ti alloy Inorganic materials 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- XRBURMNBUVEAKD-UHFFFAOYSA-N chromium copper nickel Chemical compound [Cr].[Ni].[Cu] XRBURMNBUVEAKD-UHFFFAOYSA-N 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- YOCUPQPZWBBYIX-UHFFFAOYSA-N copper nickel Chemical compound [Ni].[Cu] YOCUPQPZWBBYIX-UHFFFAOYSA-N 0.000 description 1
- IUYOGGFTLHZHEG-UHFFFAOYSA-N copper titanium Chemical compound [Ti].[Cu] IUYOGGFTLHZHEG-UHFFFAOYSA-N 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000000615 nonconductor Substances 0.000 description 1
- -1 polyethylene terephthalate Polymers 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/481—Internal lead connections, e.g. via connections, feedthrough structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76877—Filling of holes, grooves or trenches, e.g. vias, with conductive material
- H01L21/76879—Filling of holes, grooves or trenches, e.g. vias, with conductive material by selective deposition of conductive material in the vias, e.g. selective C.V.D. on semiconductor material, plating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76898—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics formed through a semiconductor substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
Abstract
Description
Claims (12)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210378829.XA CN114725014B (zh) | 2022-04-12 | 2022-04-12 | 导电结构及其制造方法 |
TW111114586A TWI808727B (zh) | 2022-04-12 | 2022-04-18 | 導電結構及其製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210378829.XA CN114725014B (zh) | 2022-04-12 | 2022-04-12 | 导电结构及其制造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN114725014A true CN114725014A (zh) | 2022-07-08 |
CN114725014B CN114725014B (zh) | 2023-05-05 |
Family
ID=82244472
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202210378829.XA Active CN114725014B (zh) | 2022-04-12 | 2022-04-12 | 导电结构及其制造方法 |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN114725014B (zh) |
TW (1) | TWI808727B (zh) |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4118523A (en) * | 1975-10-22 | 1978-10-03 | International Computers Limited | Production of semiconductor devices |
EP0720227A2 (en) * | 1994-12-29 | 1996-07-03 | STMicroelectronics, Inc. | Electrical connection structure on an integrated circuit device comprising a plug with an enlarged head |
JP2005286294A (ja) * | 2004-03-03 | 2005-10-13 | Mitsubishi Paper Mills Ltd | 回路基板の製造方法 |
US20060107525A1 (en) * | 2004-11-22 | 2006-05-25 | Hamburgen William R | Method and system for creating alignment holes in a multilayer structure |
US20070218591A1 (en) * | 2006-03-20 | 2007-09-20 | Phoenix Precision Technology Corporation | Method for fabricating a metal protection layer on electrically connecting pad of circuit board |
US20140251663A1 (en) * | 2005-03-04 | 2014-09-11 | Sanmina Corporation | Simultaneous and selective wide gap partitioning of via structures using plating resist |
US20170086293A1 (en) * | 2015-09-18 | 2017-03-23 | Subtron Technology Co., Ltd. | Package carrier and manufacturing method thereof |
CN108696996A (zh) * | 2017-04-07 | 2018-10-23 | 南亚电路板股份有限公司 | 电路板结构及其制造方法 |
CN109634458A (zh) * | 2018-12-04 | 2019-04-16 | 业成科技(成都)有限公司 | 触控面板及其制造方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI321027B (en) * | 2007-03-14 | 2010-02-21 | Phoenix Prec Technology Corp | Circuit board structure and a manufacturing method thereof |
CN106304663B (zh) * | 2015-06-26 | 2019-03-15 | 健鼎(无锡)电子有限公司 | 图案化线路结构及其制作方法 |
CN109843000A (zh) * | 2019-03-26 | 2019-06-04 | 新华三技术有限公司 | Pcb板的制备方法及pcb板 |
TWI769459B (zh) * | 2020-05-22 | 2022-07-01 | 矽品精密工業股份有限公司 | 基板結構及其製法 |
-
2022
- 2022-04-12 CN CN202210378829.XA patent/CN114725014B/zh active Active
- 2022-04-18 TW TW111114586A patent/TWI808727B/zh active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4118523A (en) * | 1975-10-22 | 1978-10-03 | International Computers Limited | Production of semiconductor devices |
EP0720227A2 (en) * | 1994-12-29 | 1996-07-03 | STMicroelectronics, Inc. | Electrical connection structure on an integrated circuit device comprising a plug with an enlarged head |
JP2005286294A (ja) * | 2004-03-03 | 2005-10-13 | Mitsubishi Paper Mills Ltd | 回路基板の製造方法 |
US20060107525A1 (en) * | 2004-11-22 | 2006-05-25 | Hamburgen William R | Method and system for creating alignment holes in a multilayer structure |
US20140251663A1 (en) * | 2005-03-04 | 2014-09-11 | Sanmina Corporation | Simultaneous and selective wide gap partitioning of via structures using plating resist |
US20070218591A1 (en) * | 2006-03-20 | 2007-09-20 | Phoenix Precision Technology Corporation | Method for fabricating a metal protection layer on electrically connecting pad of circuit board |
US20170086293A1 (en) * | 2015-09-18 | 2017-03-23 | Subtron Technology Co., Ltd. | Package carrier and manufacturing method thereof |
CN108696996A (zh) * | 2017-04-07 | 2018-10-23 | 南亚电路板股份有限公司 | 电路板结构及其制造方法 |
CN109634458A (zh) * | 2018-12-04 | 2019-04-16 | 业成科技(成都)有限公司 | 触控面板及其制造方法 |
Also Published As
Publication number | Publication date |
---|---|
TWI808727B (zh) | 2023-07-11 |
TW202341829A (zh) | 2023-10-16 |
CN114725014B (zh) | 2023-05-05 |
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PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20240112 Address after: 518109, Building E4, 101, Foxconn Industrial Park, No. 2 East Ring 2nd Road, Fukang Community, Longhua Street, Longhua District, Shenzhen City, Guangdong Province (formerly Building 1, 1st Floor, G2 District), H3, H1, and H7 factories in K2 District, North Shenchao Optoelectronic Technology Park, Minqing Road, Guangdong Province Patentee after: INTERFACE OPTOELECTRONICS (SHENZHEN) Co.,Ltd. Patentee after: Interface Technology (Chengdu) Co., Ltd. Patentee after: GENERAL INTERFACE SOLUTION Ltd. Address before: No.689 Hezuo Road, West District, high tech Zone, Chengdu City, Sichuan Province Patentee before: Interface Technology (Chengdu) Co., Ltd. Patentee before: INTERFACE OPTOELECTRONICS (SHENZHEN) Co.,Ltd. Patentee before: Yicheng Photoelectric (Wuxi) Co.,Ltd. Patentee before: GENERAL INTERFACE SOLUTION Ltd. |
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TR01 | Transfer of patent right |