CN113811938A - 显示基板及其测试方法 - Google Patents
显示基板及其测试方法 Download PDFInfo
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- CN113811938A CN113811938A CN202080000442.XA CN202080000442A CN113811938A CN 113811938 A CN113811938 A CN 113811938A CN 202080000442 A CN202080000442 A CN 202080000442A CN 113811938 A CN113811938 A CN 113811938A
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- PFNQVRZLDWYSCW-UHFFFAOYSA-N (fluoren-9-ylideneamino) n-naphthalen-1-ylcarbamate Chemical compound C12=CC=CC=C2C2=CC=CC=C2C1=NOC(=O)NC1=CC=CC2=CC=CC=C12 PFNQVRZLDWYSCW-UHFFFAOYSA-N 0.000 description 1
- WUPHOULIZUERAE-UHFFFAOYSA-N 3-(oxolan-2-yl)propanoic acid Chemical compound OC(=O)CCC1CCCO1 WUPHOULIZUERAE-UHFFFAOYSA-N 0.000 description 1
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910000673 Indium arsenide Inorganic materials 0.000 description 1
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052980 cadmium sulfide Inorganic materials 0.000 description 1
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 1
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- 230000005484 gravity Effects 0.000 description 1
- 230000005525 hole transport Effects 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
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- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
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- GGYFMLJDMAMTAB-UHFFFAOYSA-N selanylidenelead Chemical compound [Pb]=[Se] GGYFMLJDMAMTAB-UHFFFAOYSA-N 0.000 description 1
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Images
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/131—Interconnections, e.g. wiring lines or terminals
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/30—Devices specially adapted for multicolour light emission
- H10K59/35—Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels
- H10K59/353—Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels characterised by the geometrical arrangement of the RGB subpixels
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/04—Structural and physical details of display devices
- G09G2300/0421—Structural details of the set of electrodes
- G09G2300/0426—Layout of electrodes and connections
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2310/00—Command of the display device
- G09G2310/02—Addressing, scanning or driving the display screen or processing steps related thereto
- G09G2310/0264—Details of driving circuits
- G09G2310/0297—Special arrangements with multiplexing or demultiplexing of display data in the drivers for data electrodes, in a pre-processing circuitry delivering display data to said drivers or in the matrix panel, e.g. multiplexing plural data signals to one D/A converter or demultiplexing the D/A converter output to multiple columns
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/04—Display protection
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
一种显示基板及其测试方法。该显示基板包括:衬底基板(10)、多条数据线(13)、多条数据引线(14)、第一测试电路(50)以及第二测试电路(60)。衬底基板(10)包括显示区(11)以及周边区(12),显示区(11)包括像素阵列(30),像素阵列(30)包括多个子像素(310);第一测试电路(50)配置为在第一测试阶段对多个子像素(310)施加第一测试信号以进行第一测试;第二测试电路(60)配置为在第二测试阶段对多个子像素(310)施加第二测试信号以进行第二测试,第一测试电路(50)包括第一测试开关电路(510)以及第一测试控制信号施加电路(520),第一测试控制信号施加电路(520)的第一测试控制信号垫(521)以及第一测试控制信号旁路(523)分别与第一测试开关电路(510)的控制端电连接,第一测试控制信号旁路(523)配置为与外接信号施加电路(70)电连接。
Description
PCT国内申请,说明书已公开。
Claims (18)
- PCT国内申请,权利要求书已公开。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2020/082472 WO2021195974A1 (zh) | 2020-03-31 | 2020-03-31 | 显示基板及其测试方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN113811938A true CN113811938A (zh) | 2021-12-17 |
CN113811938B CN113811938B (zh) | 2023-12-19 |
Family
ID=77927934
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202080000442.XA Active CN113811938B (zh) | 2020-03-31 | 2020-03-31 | 显示基板及其测试方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20220328598A1 (zh) |
EP (1) | EP4131226A4 (zh) |
CN (1) | CN113811938B (zh) |
WO (1) | WO2021195974A1 (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111508369B (zh) * | 2020-05-19 | 2022-07-15 | 云谷(固安)科技有限公司 | 显示面板和显示装置 |
KR20220147764A (ko) * | 2021-04-27 | 2022-11-04 | 삼성디스플레이 주식회사 | 표시 패널, 이를 포함하는 전자 장치, 및 전자 장치 제조 방법 |
CN113889012A (zh) * | 2021-11-17 | 2022-01-04 | 维信诺科技股份有限公司 | 显示面板及显示装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090244429A1 (en) * | 2008-03-31 | 2009-10-01 | Te-Chen Chung | Thin film transistor substrate and liquid crystal display device using the same |
CN104217672A (zh) * | 2013-05-31 | 2014-12-17 | 三星显示有限公司 | 有机发光显示面板 |
US20150084666A1 (en) * | 2013-09-25 | 2015-03-26 | Samsung Display Co., Ltd. | Mother substrate, array test method thereof and display substrate |
CN104992651A (zh) * | 2015-07-24 | 2015-10-21 | 上海和辉光电有限公司 | 一种amoled面板测试电路 |
CN107561752A (zh) * | 2017-09-28 | 2018-01-09 | 上海天马微电子有限公司 | 一种阵列基板、其驱动方法及显示面板 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6191770B1 (en) * | 1997-12-11 | 2001-02-20 | Lg. Philips Lcd Co., Ltd. | Apparatus and method for testing driving circuit in liquid crystal display |
KR100732819B1 (ko) * | 2006-08-30 | 2007-06-27 | 삼성에스디아이 주식회사 | 유기전계발광 표시장치 및 그의 모기판 |
CN101515442B (zh) * | 2008-02-21 | 2012-06-06 | 中华映管股份有限公司 | 周边电路 |
TWI435093B (zh) * | 2012-08-23 | 2014-04-21 | Au Optronics Corp | 顯示面板的檢測電路 |
CN103871341A (zh) * | 2014-03-19 | 2014-06-18 | 深圳市华星光电技术有限公司 | 一种测试电路及显示面板 |
KR102409881B1 (ko) * | 2016-03-21 | 2022-06-17 | 삼성디스플레이 주식회사 | 표시 장치 및 쇼트 검사 방법 |
CN108257540A (zh) * | 2018-01-26 | 2018-07-06 | 鄂尔多斯市源盛光电有限责任公司 | 显示基板、显示基板的测试方法和显示装置 |
KR102549000B1 (ko) * | 2018-11-08 | 2023-06-29 | 삼성디스플레이 주식회사 | 전자 패널, 전자 패널의 검사 장치 및 그것의 검사 방법 |
CN113066408A (zh) * | 2020-01-02 | 2021-07-02 | 京东方科技集团股份有限公司 | 一种显示基板及其制作方法、显示装置 |
-
2020
- 2020-03-31 US US17/434,972 patent/US20220328598A1/en active Pending
- 2020-03-31 EP EP20920751.3A patent/EP4131226A4/en active Pending
- 2020-03-31 CN CN202080000442.XA patent/CN113811938B/zh active Active
- 2020-03-31 WO PCT/CN2020/082472 patent/WO2021195974A1/zh unknown
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090244429A1 (en) * | 2008-03-31 | 2009-10-01 | Te-Chen Chung | Thin film transistor substrate and liquid crystal display device using the same |
CN104217672A (zh) * | 2013-05-31 | 2014-12-17 | 三星显示有限公司 | 有机发光显示面板 |
US20150084666A1 (en) * | 2013-09-25 | 2015-03-26 | Samsung Display Co., Ltd. | Mother substrate, array test method thereof and display substrate |
CN104992651A (zh) * | 2015-07-24 | 2015-10-21 | 上海和辉光电有限公司 | 一种amoled面板测试电路 |
CN107561752A (zh) * | 2017-09-28 | 2018-01-09 | 上海天马微电子有限公司 | 一种阵列基板、其驱动方法及显示面板 |
Also Published As
Publication number | Publication date |
---|---|
EP4131226A4 (en) | 2023-04-26 |
WO2021195974A1 (zh) | 2021-10-07 |
EP4131226A1 (en) | 2023-02-08 |
US20220328598A1 (en) | 2022-10-13 |
CN113811938B (zh) | 2023-12-19 |
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