CN113661560B - 基于等离子体的反应器的冷却 - Google Patents
基于等离子体的反应器的冷却 Download PDFInfo
- Publication number
- CN113661560B CN113661560B CN202080027205.2A CN202080027205A CN113661560B CN 113661560 B CN113661560 B CN 113661560B CN 202080027205 A CN202080027205 A CN 202080027205A CN 113661560 B CN113661560 B CN 113661560B
- Authority
- CN
- China
- Prior art keywords
- dielectric window
- heat transfer
- transfer fluid
- heat
- tapered structure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
- H01J37/32119—Windows
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32522—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/002—Cooling arrangements
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Heat-Exchange Devices With Radiators And Conduit Assemblies (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201962830896P | 2019-04-08 | 2019-04-08 | |
| US62/830,896 | 2019-04-08 | ||
| PCT/US2020/027081 WO2020210240A1 (en) | 2019-04-08 | 2020-04-07 | Cooling for a plasma-based reactor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113661560A CN113661560A (zh) | 2021-11-16 |
| CN113661560B true CN113661560B (zh) | 2023-01-17 |
Family
ID=72751778
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202080027205.2A Active CN113661560B (zh) | 2019-04-08 | 2020-04-07 | 基于等离子体的反应器的冷却 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US11676798B2 (enExample) |
| JP (1) | JP7461965B2 (enExample) |
| KR (1) | KR102606056B1 (enExample) |
| CN (1) | CN113661560B (enExample) |
| TW (2) | TWI834857B (enExample) |
| WO (1) | WO2020210240A1 (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11676798B2 (en) | 2019-04-08 | 2023-06-13 | Lam Research Corporation | Cooling for a plasma-based reactor |
| US11894152B2 (en) * | 2021-05-05 | 2024-02-06 | Westinghouse Electric Company Llc | Modular thermal and radiation shielding with passive heat removal |
| CN116168997A (zh) * | 2021-11-24 | 2023-05-26 | 上海华力集成电路制造有限公司 | 一种改善刻蚀中等离子体分布的方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1561534A (zh) * | 2001-06-06 | 2005-01-05 | 东京毅力科创株式会社 | 感性耦合的等离子体处理系统 |
| CN102084727A (zh) * | 2008-07-04 | 2011-06-01 | 东京毅力科创株式会社 | 一种温度调节构造和使用温度调节构造的半导体制造装置 |
| CN206329930U (zh) * | 2016-11-29 | 2017-07-14 | 盐城市新亚自控设备股份有限公司 | 一种led阵列器件的冷却装置 |
Family Cites Families (33)
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| JPS5342266U (enExample) * | 1976-09-17 | 1978-04-12 | ||
| JPS57145167U (enExample) * | 1981-03-03 | 1982-09-11 | ||
| JPH0590214A (ja) * | 1991-09-30 | 1993-04-09 | Tokyo Ohka Kogyo Co Ltd | 同軸型プラズマ処理装置 |
| JPH05256589A (ja) * | 1992-01-14 | 1993-10-05 | Furukawa Electric Co Ltd:The | 筐体のヒ−トパイプ式冷却構造 |
| TW293983B (enExample) * | 1993-12-17 | 1996-12-21 | Tokyo Electron Co Ltd | |
| US5944899A (en) * | 1996-08-22 | 1999-08-31 | Applied Materials, Inc. | Inductively coupled plasma processing chamber |
| US6287435B1 (en) * | 1998-05-06 | 2001-09-11 | Tokyo Electron Limited | Method and apparatus for ionized physical vapor deposition |
| US6326597B1 (en) * | 1999-04-15 | 2001-12-04 | Applied Materials, Inc. | Temperature control system for process chamber |
| US7030335B2 (en) * | 2000-03-17 | 2006-04-18 | Applied Materials, Inc. | Plasma reactor with overhead RF electrode tuned to the plasma with arcing suppression |
| US6550531B1 (en) * | 2000-05-16 | 2003-04-22 | Intel Corporation | Vapor chamber active heat sink |
| FR2815888B1 (fr) * | 2000-10-27 | 2003-05-30 | Air Liquide | Dispositif de traitement de gaz par plasma |
| JP2002270599A (ja) | 2001-03-13 | 2002-09-20 | Canon Inc | プラズマ処理装置 |
| JP4008728B2 (ja) * | 2002-03-20 | 2007-11-14 | 株式会社 液晶先端技術開発センター | プラズマ処理装置 |
| JP4163437B2 (ja) * | 2002-04-17 | 2008-10-08 | 松下電器産業株式会社 | プラズマ処理装置用誘電体窓 |
| US7163603B2 (en) * | 2002-06-24 | 2007-01-16 | Tokyo Electron Limited | Plasma source assembly and method of manufacture |
| JP4381963B2 (ja) * | 2003-11-19 | 2009-12-09 | パナソニック株式会社 | プラズマ処理装置 |
| KR20050079860A (ko) * | 2004-02-07 | 2005-08-11 | 삼성전자주식회사 | 마이크로 웨이브 공급장치, 이를 이용한 플라즈마공정장치 및 플라즈마 공정방법 |
| JP2005322771A (ja) | 2004-05-10 | 2005-11-17 | Matsushita Electric Ind Co Ltd | 熱拡散装置 |
| US7527713B2 (en) * | 2004-05-26 | 2009-05-05 | Applied Materials, Inc. | Variable quadruple electromagnet array in plasma processing |
| US20060222034A1 (en) * | 2005-03-31 | 2006-10-05 | Cymer, Inc. | 6 Khz and above gas discharge laser system |
| US8440049B2 (en) * | 2006-05-03 | 2013-05-14 | Applied Materials, Inc. | Apparatus for etching high aspect ratio features |
| EP2231324B1 (en) * | 2007-12-18 | 2016-06-29 | Dow Technology Investments LLC | Tube reactor |
| GB201013881D0 (en) * | 2010-08-19 | 2010-10-06 | Oxford Yasa Motors Ltd | Electric machine - construction |
| US20120062866A1 (en) * | 2010-09-03 | 2012-03-15 | Nikon Corporation | Microchannel-cooled coils of electromagnetic actuators exhibiting reduced eddy-current drag |
| CN102141351B (zh) | 2011-04-24 | 2012-08-08 | 广州大学 | 一种热管 |
| US9530656B2 (en) | 2011-10-07 | 2016-12-27 | Lam Research Corporation | Temperature control in RF chamber with heater and air amplifier |
| US9978565B2 (en) | 2011-10-07 | 2018-05-22 | Lam Research Corporation | Systems for cooling RF heated chamber components |
| EP2994926A1 (en) | 2013-05-06 | 2016-03-16 | Greatcell Solar S.A. | Organic-inorganic perovskite based solar cell |
| US10249475B2 (en) | 2014-04-01 | 2019-04-02 | Applied Materials, Inc. | Cooling mechanism utlized in a plasma reactor with enhanced temperature regulation |
| KR102262657B1 (ko) * | 2014-10-13 | 2021-06-08 | 삼성전자주식회사 | 플라즈마 처리 장치 |
| KR20180025838A (ko) * | 2014-12-23 | 2018-03-09 | 시텍 게엠베하 | 기계적으로 유동화되는 증착 시스템들 및 방법들 |
| GB201619987D0 (en) | 2016-11-25 | 2017-01-11 | Iceotope Ltd | Fluid cooling system |
| US11676798B2 (en) | 2019-04-08 | 2023-06-13 | Lam Research Corporation | Cooling for a plasma-based reactor |
-
2020
- 2020-04-07 US US17/601,911 patent/US11676798B2/en active Active
- 2020-04-07 KR KR1020217036312A patent/KR102606056B1/ko active Active
- 2020-04-07 WO PCT/US2020/027081 patent/WO2020210240A1/en not_active Ceased
- 2020-04-07 JP JP2021559101A patent/JP7461965B2/ja active Active
- 2020-04-07 CN CN202080027205.2A patent/CN113661560B/zh active Active
- 2020-04-08 TW TW109111730A patent/TWI834857B/zh active
- 2020-04-08 TW TW113106270A patent/TWI899850B/zh active
-
2023
- 2023-05-02 US US18/142,570 patent/US20230274912A1/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1561534A (zh) * | 2001-06-06 | 2005-01-05 | 东京毅力科创株式会社 | 感性耦合的等离子体处理系统 |
| CN102084727A (zh) * | 2008-07-04 | 2011-06-01 | 东京毅力科创株式会社 | 一种温度调节构造和使用温度调节构造的半导体制造装置 |
| CN206329930U (zh) * | 2016-11-29 | 2017-07-14 | 盐城市新亚自控设备股份有限公司 | 一种led阵列器件的冷却装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20230274912A1 (en) | 2023-08-31 |
| US11676798B2 (en) | 2023-06-13 |
| JP7461965B2 (ja) | 2024-04-04 |
| TWI834857B (zh) | 2024-03-11 |
| TW202106122A (zh) | 2021-02-01 |
| KR102606056B1 (ko) | 2023-11-23 |
| TW202425717A (zh) | 2024-06-16 |
| WO2020210240A1 (en) | 2020-10-15 |
| CN113661560A (zh) | 2021-11-16 |
| JP2022526980A (ja) | 2022-05-27 |
| KR20210137585A (ko) | 2021-11-17 |
| TWI899850B (zh) | 2025-10-01 |
| US20220139671A1 (en) | 2022-05-05 |
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| GR01 | Patent grant | ||
| GR01 | Patent grant |