CN113618622B - 垫温度调节装置、垫温度调节方法及研磨装置 - Google Patents
垫温度调节装置、垫温度调节方法及研磨装置Info
- Publication number
- CN113618622B CN113618622B CN202110494699.1A CN202110494699A CN113618622B CN 113618622 B CN113618622 B CN 113618622B CN 202110494699 A CN202110494699 A CN 202110494699A CN 113618622 B CN113618622 B CN 113618622B
- Authority
- CN
- China
- Prior art keywords
- pad
- temperature
- heat exchanger
- polishing pad
- polishing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/015—Temperature control
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/14—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the temperature during grinding
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/02—Equipment for cooling the grinding surfaces, e.g. devices for feeding coolant
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020-082423 | 2020-05-08 | ||
| JP2020082423A JP7421413B2 (ja) | 2020-05-08 | 2020-05-08 | パッド温度調整装置、パッド温度調整方法、および研磨装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113618622A CN113618622A (zh) | 2021-11-09 |
| CN113618622B true CN113618622B (zh) | 2025-10-17 |
Family
ID=78377954
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110494699.1A Active CN113618622B (zh) | 2020-05-08 | 2021-05-07 | 垫温度调节装置、垫温度调节方法及研磨装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US11826871B2 (enExample) |
| JP (1) | JP7421413B2 (enExample) |
| KR (1) | KR102763996B1 (enExample) |
| CN (1) | CN113618622B (enExample) |
| SG (1) | SG10202104335VA (enExample) |
| TW (1) | TWI872241B (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102752330B1 (ko) * | 2021-04-30 | 2025-01-10 | 어플라이드 머티어리얼스, 인코포레이티드 | 열 이미지의 머신 러닝 기반 처리를 사용하는 화학 기계적 연마 공정 모니터링 |
| JP7781683B2 (ja) * | 2022-03-09 | 2025-12-08 | キオクシア株式会社 | 半導体製造装置及び半導体装置の製造方法 |
| CN118721017B (zh) * | 2024-06-27 | 2025-10-10 | 西安奕斯伟材料科技股份有限公司 | 一种抛光液补液设备、方法以及装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN207171777U (zh) * | 2016-03-08 | 2018-04-03 | 凯斯科技股份有限公司 | 化学机械研磨装置 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5390807A (en) | 1977-01-21 | 1978-08-10 | Nec Corp | Trunk circuit |
| JPH09123057A (ja) * | 1995-10-31 | 1997-05-13 | Sony Corp | 基板研磨装置 |
| JP3672685B2 (ja) * | 1996-11-29 | 2005-07-20 | 松下電器産業株式会社 | 研磨方法及び研磨装置 |
| JP2001062706A (ja) | 1999-08-25 | 2001-03-13 | Nikon Corp | 研磨装置 |
| EP1270148A1 (en) * | 2001-06-22 | 2003-01-02 | Infineon Technologies SC300 GmbH & Co. KG | Arrangement and method for conditioning a polishing pad |
| JP2005056987A (ja) * | 2003-08-01 | 2005-03-03 | Nitta Haas Inc | 研磨装置および研磨方法 |
| JP4902433B2 (ja) * | 2007-06-13 | 2012-03-21 | 株式会社荏原製作所 | 研磨装置の研磨面加熱、冷却装置 |
| JP2012245581A (ja) * | 2011-05-26 | 2012-12-13 | Mitsubishi Materials Corp | 表面被覆炭窒化チタン基サーメット製切削インサートおよびその製造方法 |
| JP5454513B2 (ja) | 2011-05-27 | 2014-03-26 | 信越半導体株式会社 | 研磨ヘッドの高さ方向の位置の調整方法及びワークの研磨方法 |
| JP5791987B2 (ja) | 2011-07-19 | 2015-10-07 | 株式会社荏原製作所 | 研磨装置および方法 |
| JP6161999B2 (ja) * | 2013-08-27 | 2017-07-12 | 株式会社荏原製作所 | 研磨方法および研磨装置 |
| JP6340205B2 (ja) * | 2014-02-20 | 2018-06-06 | 株式会社荏原製作所 | 研磨パッドのコンディショニング方法及び装置 |
| US10414018B2 (en) * | 2016-02-22 | 2019-09-17 | Ebara Corporation | Apparatus and method for regulating surface temperature of polishing pad |
| JP6929072B2 (ja) | 2016-02-22 | 2021-09-01 | 株式会社荏原製作所 | 研磨パッドの表面温度を調整するための装置および方法 |
| JP2018027582A (ja) | 2016-08-17 | 2018-02-22 | 株式会社荏原製作所 | 研磨方法、研磨装置、およびコンピュータプログラムを記録した記録媒体 |
| JP6752657B2 (ja) * | 2016-08-23 | 2020-09-09 | 株式会社荏原製作所 | 研磨方法および研磨装置 |
| US10350724B2 (en) | 2017-07-31 | 2019-07-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | Temperature control in chemical mechanical polish |
| KR102591906B1 (ko) * | 2017-10-31 | 2023-10-20 | 가부시키가이샤 에바라 세이사꾸쇼 | 연마 장치 및 연마 방법 |
| JP7059117B2 (ja) * | 2017-10-31 | 2022-04-25 | 株式会社荏原製作所 | 研磨パッドの研磨面の温度を調整するための熱交換器、該熱交換器を備えた研磨装置、該熱交換器を用いた基板の研磨方法、および研磨パッドの研磨面の温度を調整するためのプログラムを記録したコンピュータ読み取り可能な記録媒体 |
| JP6545244B2 (ja) * | 2017-12-15 | 2019-07-17 | ヤフー株式会社 | 決定装置、決定方法、および決定プログラム |
| CN111902924B (zh) * | 2018-03-13 | 2024-11-29 | 应用材料公司 | 用于半导体处理的监测的机器学习系统 |
| JP6975078B2 (ja) * | 2018-03-15 | 2021-12-01 | キオクシア株式会社 | 半導体製造装置および半導体装置の製造方法 |
-
2020
- 2020-05-08 JP JP2020082423A patent/JP7421413B2/ja active Active
-
2021
- 2021-04-28 SG SG10202104335VA patent/SG10202104335VA/en unknown
- 2021-04-28 TW TW110115344A patent/TWI872241B/zh active
- 2021-04-28 US US17/242,886 patent/US11826871B2/en active Active
- 2021-05-03 KR KR1020210057045A patent/KR102763996B1/ko active Active
- 2021-05-07 CN CN202110494699.1A patent/CN113618622B/zh active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN207171777U (zh) * | 2016-03-08 | 2018-04-03 | 凯斯科技股份有限公司 | 化学机械研磨装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP7421413B2 (ja) | 2024-01-24 |
| CN113618622A (zh) | 2021-11-09 |
| JP2021176664A (ja) | 2021-11-11 |
| US20210347004A1 (en) | 2021-11-11 |
| KR20210136859A (ko) | 2021-11-17 |
| TWI872241B (zh) | 2025-02-11 |
| KR102763996B1 (ko) | 2025-02-07 |
| SG10202104335VA (en) | 2021-12-30 |
| TW202146160A (zh) | 2021-12-16 |
| US11826871B2 (en) | 2023-11-28 |
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Legal Events
| Date | Code | Title | Description |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |