CN113016141A - 一种数字校准方法、装置及真随机数发生器电路 - Google Patents

一种数字校准方法、装置及真随机数发生器电路 Download PDF

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CN113016141A
CN113016141A CN201980002398.3A CN201980002398A CN113016141A CN 113016141 A CN113016141 A CN 113016141A CN 201980002398 A CN201980002398 A CN 201980002398A CN 113016141 A CN113016141 A CN 113016141A
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circuit
calibrated
calibration
value
test
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CN113016141B (zh
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苏源
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李铮
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Shenzhen Goodix Technology Co Ltd
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F7/58—Random or pseudo-random number generators
    • G06F7/588—Random number generators, i.e. based on natural stochastic processes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0602—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
    • H03M1/0604—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic at one point, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/0607—Offset or drift compensation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/84—Generating pulses having a predetermined statistical distribution of a parameter, e.g. random pulse generators
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

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  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Pure & Applied Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

一种数字校准方法、装置及真随机数发生器电路，通过数字校准方法校准待校准电路的补偿，对待校准电路的输出进行多次采样检测，从而根据输出结果为目标结果的概率判断出当前的测试补偿校准码值是否能够使待校准电路满足指定的精度。通过对待校准电路的输出进行多次采样，使得选出的补偿校准码能够具有更高的准确性，能够解决对补偿进行校准的电路的校准精度较低的问题。

Description

PCT国内申请，说明书已公开。

Claims (10)

  1. PCT国内申请，权利要求书已公开。
CN201980002398.3A 2019-10-14 2019-10-14 一种数字校准方法、装置及真随机数发生器电路 Active CN113016141B (zh)

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CN117738975B (zh) * 2024-02-06 2024-04-26 中科云谷科技有限公司 用于电磁阀的标定方法、标定装置及存储介质

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1473836A1 (en) * 2003-03-20 2004-11-03 Acacia Semiconductor, Lda. Digital-domain self-calibration and built-in self-testing techniques for high-speed integrated A/D converters using white gaussian noise
US20070036212A1 (en) * 2005-05-06 2007-02-15 Silicon Laboratories Inc. Digital Controller Based Power Factor Correction Circuit
CN101277113A (zh) * 2007-03-22 2008-10-01 科技资产股份有限公司 模数转换
US8031092B1 (en) * 2009-01-16 2011-10-04 President And Fellows Of Harvard College Dual-mode based digital background calibration of pipelined ADCs for gain variations and device mismatches
US20120194368A1 (en) * 2011-01-31 2012-08-02 Hynix Semiconductor Inc. Method and system for calibrating column parallel adcs
EP2966780A1 (en) * 2014-07-07 2016-01-13 STMicroelectronics International N.V. Analog-to-digital converter offset cancellation
TWI591969B (zh) * 2016-04-15 2017-07-11 瑞昱半導體股份有限公司 數位類比轉換器之校正電路及校正方法
CN110149117A (zh) * 2019-07-05 2019-08-20 成都博思微科技有限公司 一种自校准比较器失调电压消除电路

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6714886B2 (en) * 2002-02-13 2004-03-30 Eric C. Sung System and method of DC calibration of amplifiers
US8766832B1 (en) * 2012-11-05 2014-07-01 Xilinx, Inc. Background calibration scheme for analog-to-digital converters
CN104317552B (zh) 2014-11-06 2018-04-13 合肥濯新光电科技有限公司 真随机数发生器及方法、真随机数密钥加密系统及方法
US9654133B2 (en) * 2014-12-17 2017-05-16 Analog Devices, Inc. Microprocessor-assisted calibration for analog-to-digital converter
CN104461457B (zh) * 2014-12-30 2017-04-19 成都三零嘉微电子有限公司 一种真随机数发生器及其失调补偿控制方法
CN106155628B (zh) 2015-04-01 2018-12-28 北京南瑞智芯微电子科技有限公司 一种混沌随机数发生器及发生方法
CN107797789A (zh) 2017-11-11 2018-03-13 北京中电华大电子设计有限责任公司 一种可以消除失调的比较相等电阻热噪声的真随机数发生器电路
US10090848B1 (en) * 2018-01-14 2018-10-02 Shenzhen GOODIX Technology Co., Ltd. Data converters systematic error calibration using on chip generated precise reference signal
CN110138384B (zh) * 2018-02-08 2022-09-16 瑞昱半导体股份有限公司 连续逼近式模拟数字转换器的校正电路与校正方法
CN208999990U (zh) 2018-11-30 2019-06-18 紫光同芯微电子有限公司 真随机数发生器
CN110061743B (zh) * 2019-04-17 2021-01-22 中国电子科技集团公司第二十四研究所 一种流水线模数转换器前台数字校准的误差提取方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1473836A1 (en) * 2003-03-20 2004-11-03 Acacia Semiconductor, Lda. Digital-domain self-calibration and built-in self-testing techniques for high-speed integrated A/D converters using white gaussian noise
US20070036212A1 (en) * 2005-05-06 2007-02-15 Silicon Laboratories Inc. Digital Controller Based Power Factor Correction Circuit
CN101277113A (zh) * 2007-03-22 2008-10-01 科技资产股份有限公司 模数转换
US8031092B1 (en) * 2009-01-16 2011-10-04 President And Fellows Of Harvard College Dual-mode based digital background calibration of pipelined ADCs for gain variations and device mismatches
US20120194368A1 (en) * 2011-01-31 2012-08-02 Hynix Semiconductor Inc. Method and system for calibrating column parallel adcs
EP2966780A1 (en) * 2014-07-07 2016-01-13 STMicroelectronics International N.V. Analog-to-digital converter offset cancellation
TWI591969B (zh) * 2016-04-15 2017-07-11 瑞昱半導體股份有限公司 數位類比轉換器之校正電路及校正方法
CN110149117A (zh) * 2019-07-05 2019-08-20 成都博思微科技有限公司 一种自校准比较器失调电压消除电路

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
居水荣等: ""12位逐次逼近模数转换器关键设计技术研究"", 《电子器件》 *

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EP3836404A1 (en) 2021-06-16
EP3836404A4 (en) 2022-01-12
CN113016141B (zh) 2022-09-16
WO2021072598A1 (zh) 2021-04-22
US20210167788A1 (en) 2021-06-03
US11128309B2 (en) 2021-09-21
EP3836404B1 (en) 2022-12-07

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