CN112917386A - 板状物保持器具 - Google Patents

板状物保持器具 Download PDF

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CN112917386A
CN112917386A CN202011398218.9A CN202011398218A CN112917386A CN 112917386 A CN112917386 A CN 112917386A CN 202011398218 A CN202011398218 A CN 202011398218A CN 112917386 A CN112917386 A CN 112917386A
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吉井俊悟
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Disco Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/06Work supports, e.g. adjustable steadies
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/005Feeding or manipulating devices specially adapted to grinding machines
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/20Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
    • B24B7/22Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
    • B24B7/228Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J15/00Gripping heads and other end effectors
    • B25J15/06Gripping heads and other end effectors with vacuum or magnetic holding means
    • B25J15/0616Gripping heads and other end effectors with vacuum or magnetic holding means with vacuum
    • B25J15/0683Details of suction cup structure, e.g. grooves or ridges
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67706Mechanical details, e.g. roller, belt

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Abstract

提供板状物保持器具,能够可靠地对存在凹凸或起伏的晶片等板状物进行吸引保持。板状物保持器具包含:保持基台,其具有保持面和与吸引源连结的连结口;第一O环,其配设在保持面;第二O环,其配设在第一O环的内侧;吸引孔,其在第一O环与第二O环之间开口并与连结口连通;以及液体提供机构,其在第一O环的外周使保持面与板状物之间形成液体密封。

Description

板状物保持器具
技术领域
本发明涉及对晶片等板状物进行吸引保持的板状物保持器具。
背景技术
由交叉的多条分割预定线划分而在正面形成有IC、LSI等多个器件的晶片被切割装置、激光加工装置分割成各个器件芯片,分割得到的各器件芯片被用于移动电话、个人计算机等电子设备。
形成器件的晶片是通过对硅锭、SiC锭等锭进行线切割、通过激光加工装置进行切片而生成的。从锭切片出的晶片的正面和背面通过磨削和研磨而被精加工成镜面(例如参照专利文献1和2)。
专利文献1:日本特开2000-94221号公报
专利文献2:日本特开2016-111143号公报
但是,存在如下的问题:在从锭切片出的晶片上存在凹凸或起伏,在通过具有对晶片进行吸引保持的保持面的保持器具来搬送晶片时,在晶片与保持面之间形成间隙,晶片由于外部气体从该间隙流入而从保持器具的保持面落下。
发明内容
因此,本发明的目的在于,提供能够可靠地对存在凹凸或起伏的晶片等板状物进行吸引保持的板状物保持器具。
根据本发明,提供板状物保持器具,该板状物保持器具具有:保持基台,其具有保持面和与吸引源连结的连结口;第一O环,其配设在该保持面;第二O环,其配设在该第一O环的内侧;吸引孔,其在该第一O环与该第二O环之间开口并与该连结口连通;以及液体提供机构,其在该第一O环的外周使该保持面与该板状物之间形成液体密封。
根据本发明,即使在第一和第二O环与板状物之间形成有间隙的情况下,第一O环的外周也被液体密封,因此,抑制了外部气体从第一和第二O环与晶片之间的间隙流入,能够可靠地对存在凹凸或起伏的晶片等板状物进行吸引保持。
附图说明
图1是本发明实施方式的板状物保持器具的立体图。
图2是图1所示的板状物保持器具的剖视图。
图3是从下方观察图1所示的保持基台的立体图。
图4是示出利用图1所示的板状物保持器具对板状物进行保持的状态的剖视图。
图5是具有图1所示的板状物保持器具的磨削装置的立体图。
标号说明
2:板状物保持器具;4:保持基台;14:连结口;18:吸引源;28:第一O环;30:第二O环;32:吸引孔;34:液体提供机构;S:液体密封。
具体实施方式
以下,参照附图对本发明实施方式的板状物保持器具进行说明。
当参照图1和图2来进行说明时,用标号2表示整体的板状物保持器具具有:保持基台4,其具有与吸引源连结的连结口并且具有保持面;以及移动机构6,其使保持基台4移动。如图2所示,保持基台4包含:圆板状的主部8;圆筒部10,其从主部8的上表面中央部向上方延伸;圆形状止动片12,其固定于圆筒部10的上端,直径比圆筒部10大。在圆筒部10附设有向径向外侧突出的圆筒状的连结口14,该连结口14经由流路16而与吸引源18连结。
如图2所示,本实施方式的吸引源18具有:整体上呈圆筒状的喷射器20;空气提供源24,其经由流路22而与喷射器20连结,并且向喷射器20提供空气;以及阀26,其对流路22进行开闭。在喷射器20的轴向中间部设置有内径比其他部分小的小直径部20a。在该小直径部20a连接有延伸到保持基台4的连结口14的流路16,在喷射器20的轴向一端部连接有延伸到空气提供源24的流路22。
而且,在吸引源18中,在打开阀26的状态下使空气提供源24进行动作,当从空气提供源24经由流路22向喷射器20提供高压空气时,小直径部20a的压力下降,由此在小直径部20a产生负压而从流路16吸引空气。另外,吸引源18也可以由吸引泵构成,但由于存在后述的吸入液体提供机构34的液体的情况,所以吸引源18优选包含从喷射器20的轴向另一端部与高压空气一起排出液体的上述喷射器20的结构。
当参照图2和图3进行说明时,板状物保持器具2还具有:第一O环28,其配设在构成保持面的主部8的下表面;第二O环30,其配设在第一O环28的内侧;吸引孔32,其在第一O环28与第二O环30之间开口并与连结口14连通;以及液体提供机构34,其在第一O环28的外周使保持面与板状物之间形成液体密封。
第一O环28和第二O环30均由合成橡胶等可弹性变形的适当的材料形成,第二O环30的直径比第一O环28的直径小。如图2所示,在主部8的下表面形成有第一环状槽36和配置在第一环状槽36的内侧并且直径比第一环状槽36小的第二环状槽38。而且,在第一环状槽36中配设有第一O环28,在第二环状槽38中配设有第二O环30。
如图2和图3所示,在主部8的下表面开口的吸引孔32在第一O环28与第二O环30之间沿主部8的周向隔开间隔地形成有多个(在本实施方式中为4个)。如参照图2理解的那样,各吸引孔32与圆筒部10的内部和连结口14连通。
而且,在板状物保持器具2中,使吸引源18动作而使吸引孔32生成吸引力,从而利用主部8的下表面对晶片等板状物进行吸引保持。这样,保持基台4的主部8的下表面构成保持板状物的保持面。并且,在利用主部8的下表面对板状物进行吸引保持时,第一和第二O环28、30各自的下端与板状物的上表面接触,在主部8的下表面与板状物的上表面之间存在间隙(参照图4)。
如图2和图3所示,液体提供机构34包含固定在保持基台4的主部8的外周的环状部件40。在该环状部件40上沿周向隔开间隔地形成有在下表面开口的多个喷出孔40a,并且设置有与多个喷出孔40a连通的提供口40b(参照图1和图2)。如图2所示,液体提供机构34还包含:液体提供源44,其经由流路42而与提供口40b连结;以及阀46,其对流路42进行开闭。
而且,如图4所示,在液体提供机构34中,在利用保持基台4的主部8的下表面(保持面)对板状物进行吸引保持的状态下,通过打开阀46而从多个喷出孔40a喷出从液体提供源44经由流路42提供到提供口40b的水等液体,在第一O环28的外周使保持基台4的下表面(保持面)与晶片W等板状物的上表面之间形成环状的液体密封S。另外,在本实施方式的板状物保持器具2中,保持基台4的主部8和液体提供机构34的环状部件40由单独的部件构成,但主部8和环状部件40也可以由单一的共同部件构成。
参照图1和图2对移动机构6进行说明。如图1所示,移动机构6具有:臂48,其从与保持基台4连结的一端部起实际上水平延伸;旋转轴50,其固定于臂48的另一端部并沿上下方向延伸;电动机(未图示),其使旋转轴50以沿上下方向延伸的轴线为中心进行旋转;以及电动缸等升降单元(未图示),其使旋转轴50升降。
如图2所示,在臂48的一端部形成有沿上下方向延伸的贯通开口52,在贯通开口52中插入有保持基台4的圆筒部10。在贯通开口52的上端侧周缘形成有直径比贯通开口52大的凹处54。保持基台4的止动片12被定位在该凹处54,由此保持基台4不会从臂48脱落。
如参照图2理解的那样,在臂48的一端部的下表面与保持基台4的主部8的上表面之间附设有线圈弹簧56。在将保持基台4的下表面定位于板状物的上表面时,随着线圈弹簧56压缩,保持基台4上升,由此,从保持基台4的下表面作用于板状物的冲击被缓和,并且保持基台4的下表面与晶片W等板状物的吸附面的亲和良好。
参照图4,对使用上述那样的板状物保持器具2搬送作为板状物的圆板状的晶片W的搬送方法进行说明。
在使用板状物保持器具2的搬送方法中,首先,利用电动机使旋转轴50适当旋转并且利用升降单元使旋转轴50适当升降,从而将保持基台4的主部8的下表面(保持面)定位于放置在适当的工作台(未图示)上的晶片W的上方。接着,利用升降单元使旋转轴50下降,使保持基台4的第一和第二O环28、30与晶片W的上表面密接。
接着,在打开流路22的阀26的状态下使空气提供源24进行动作而通过喷射器18的作用使保持基台4的吸引孔32生成吸引力,利用保持基台4的主部8的下表面对晶片W的上表面进行吸引保持。接着,如图4所示,打开流路42的阀46而从喷出孔40a喷出水等液体,在第一O环28的外周使主部8的下表面与晶片W的上表面之间形成环状的液体密封S。
接着,利用电动机使旋转轴50适当旋转并且利用升降单元使旋转轴50适当升降,由此对保持基台4所保持的晶片W进行搬送,使晶片W的下表面与待载置晶片W的适当的工作台(未图示)的上表面接触。然后,停止吸引源18的动作而解除保持基台4对晶片W的吸引保持,将晶片W载置在工作台的上表面。这样,利用板状物保持器具2对晶片W进行搬送。
如以上那样,在本实施方式的板状物保持器具2中,即使在第一和第二O环28、30的下端与晶片W的上表面之间形成有间隙的情况下,第一O环28的外周也被液体密封,因此,抑制了外部气体从第一和第二O环28、30与晶片W之间的间隙流入,能够可靠地对存在凹凸或起伏的晶片W进行吸引保持。
另外,上述板状物保持器具2例如被安装于图5所示的磨削装置60。磨削装置60具有:第一盒载置部64a,其载置收纳有磨削加工前的多个晶片W的第一盒62a;第二盒载置部64b,其载置收纳有磨削加工后的多个晶片W的第二盒62b;搬出搬入单元66,其从第一盒62a搬出磨削加工前的晶片W并且向第二盒62b搬入磨削加工后的晶片W;暂放单元68,其暂时放置被搬出搬入单元66搬出的磨削加工前的晶片W;第一搬送单元,其将暂时放置于暂放单元68的磨削加工前的晶片W搬送到卡盘工作台70;磨削单元72,其对卡盘工作台70所保持的晶片W的上表面进行磨削;以及第二搬送单元,其将磨削加工后的晶片W从卡盘工作台70搬出并搬送到清洗单元74,上述第一和第二搬送单元可由上述板状物保持器具2构成。
在图5所示的例子中,板状物保持器具2的移动机构6的旋转轴50的下端旋转自如地安装在磨削装置60的基台76。由于第一搬送单元所搬送的晶片W是磨削加工前的晶片,所以有时存在凹凸或起伏,但如上所述,在板状物保持器具2中,即使是存在凹凸或起伏的晶片W,也能够可靠地进行吸引保持,因此在搬送晶片W时晶片W不会落下。

Claims (1)

1.一种板状物保持器具,其对板状物进行吸引保持,其中,
该板状物保持器具具有:
保持基台,其具有保持面和与吸引源连结的连结口;
第一O环,其配设在该保持面;
第二O环,其配设在该第一O环的内侧;
吸引孔,其在该第一O环与该第二O环之间开口并与该连结口连通;以及
液体提供机构,其在该第一O环的外周使该保持面与该板状物之间形成液体密封。
CN202011398218.9A 2019-12-06 2020-12-04 板状物保持器具 Pending CN112917386A (zh)

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