CN112912769B - 放射线检测装置 - Google Patents
放射线检测装置 Download PDFInfo
- Publication number
- CN112912769B CN112912769B CN201980069231.9A CN201980069231A CN112912769B CN 112912769 B CN112912769 B CN 112912769B CN 201980069231 A CN201980069231 A CN 201980069231A CN 112912769 B CN112912769 B CN 112912769B
- Authority
- CN
- China
- Prior art keywords
- electrode
- wiring
- radiation detection
- anode
- detection device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2935—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using ionisation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/185—Measuring radiation intensity with ionisation chamber arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/242—Stacked detectors, e.g. for depth information
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
- H01J47/06—Proportional counter tubes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018201765A JP6747487B2 (ja) | 2018-10-26 | 2018-10-26 | 放射線検出装置 |
| JP2018-201765 | 2018-10-26 | ||
| PCT/JP2019/040712 WO2020085167A1 (ja) | 2018-10-26 | 2019-10-16 | 放射線検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112912769A CN112912769A (zh) | 2021-06-04 |
| CN112912769B true CN112912769B (zh) | 2024-08-16 |
Family
ID=70331938
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201980069231.9A Active CN112912769B (zh) | 2018-10-26 | 2019-10-16 | 放射线检测装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US11573337B2 (enExample) |
| EP (1) | EP3872530A4 (enExample) |
| JP (1) | JP6747487B2 (enExample) |
| CN (1) | CN112912769B (enExample) |
| WO (1) | WO2020085167A1 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11953452B2 (en) * | 2021-03-01 | 2024-04-09 | Redlen Technologies, Inc. | Ionizing radiation detector with reduced street width and improved count rate stability |
| WO2024048761A1 (ja) * | 2022-08-31 | 2024-03-07 | 大日本印刷株式会社 | 検出装置、放射線特定装置及び中性子画像化装置 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4255659A (en) * | 1978-03-27 | 1981-03-10 | The Regents Of The University Of California | Semiconductor radiation detector |
| US6333504B1 (en) * | 1995-10-13 | 2001-12-25 | Digirad Corp | Semiconductor radiation detector with enhanced charge collection |
| CN1606808A (zh) * | 2002-03-08 | 2005-04-13 | 浜松光子学株式会社 | 检测器 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5515881B2 (enExample) | 1973-04-17 | 1980-04-26 | ||
| US6121622A (en) * | 1995-07-14 | 2000-09-19 | Yeda Research And Development Co., Ltd. | Imager or particle detector and method of manufacturing the same |
| JP3354551B2 (ja) | 2000-06-27 | 2002-12-09 | 科学技術振興事業団 | ピクセル型電極によるガス増幅を用いた粒子線画像検出器 |
| JP4138529B2 (ja) * | 2003-02-24 | 2008-08-27 | 浜松ホトニクス株式会社 | 半導体装置、及びそれを用いた放射線検出器 |
| JP3935091B2 (ja) * | 2003-02-27 | 2007-06-20 | 浜松ホトニクス株式会社 | 半導体装置、及びそれを用いた放射線検出器 |
| JP4365844B2 (ja) * | 2006-09-08 | 2009-11-18 | 三菱電機株式会社 | 荷電粒子線の線量分布測定装置 |
| JP2009206057A (ja) * | 2008-02-29 | 2009-09-10 | Scienergy Co Ltd | ガス電子増幅器及びこれを使用した放射線検出器 |
| JP5471051B2 (ja) * | 2008-06-23 | 2014-04-16 | 大日本印刷株式会社 | ガス増幅を用いた放射線検出器、及び放射線検出器の製造方法 |
| JP5515881B2 (ja) * | 2010-03-11 | 2014-06-11 | 大日本印刷株式会社 | 放射線検出センサ、放射線検出センサの製造方法 |
| JP2012168170A (ja) * | 2011-01-25 | 2012-09-06 | Dainippon Printing Co Ltd | ガス増幅を用いた放射線検出器 |
| US9529099B2 (en) * | 2012-11-14 | 2016-12-27 | Integrated Sensors, Llc | Microcavity plasma panel radiation detector |
| JP5790750B2 (ja) | 2013-12-13 | 2015-10-07 | 大日本印刷株式会社 | 放射線検出センサ |
| JP6821935B2 (ja) * | 2016-03-30 | 2021-01-27 | 大日本印刷株式会社 | 検出素子及び放射線検出装置 |
| JP6555380B2 (ja) * | 2018-04-09 | 2019-08-07 | 大日本印刷株式会社 | ガス増幅を用いた放射線検出器 |
-
2018
- 2018-10-26 JP JP2018201765A patent/JP6747487B2/ja active Active
-
2019
- 2019-10-16 CN CN201980069231.9A patent/CN112912769B/zh active Active
- 2019-10-16 EP EP19875060.6A patent/EP3872530A4/en active Pending
- 2019-10-16 WO PCT/JP2019/040712 patent/WO2020085167A1/ja not_active Ceased
-
2021
- 2021-04-22 US US17/237,696 patent/US11573337B2/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4255659A (en) * | 1978-03-27 | 1981-03-10 | The Regents Of The University Of California | Semiconductor radiation detector |
| US6333504B1 (en) * | 1995-10-13 | 2001-12-25 | Digirad Corp | Semiconductor radiation detector with enhanced charge collection |
| CN1606808A (zh) * | 2002-03-08 | 2005-04-13 | 浜松光子学株式会社 | 检测器 |
Also Published As
| Publication number | Publication date |
|---|---|
| US11573337B2 (en) | 2023-02-07 |
| JP6747487B2 (ja) | 2020-08-26 |
| WO2020085167A1 (ja) | 2020-04-30 |
| CN112912769A (zh) | 2021-06-04 |
| EP3872530A4 (en) | 2022-07-27 |
| US20210263172A1 (en) | 2021-08-26 |
| EP3872530A1 (en) | 2021-09-01 |
| JP2020067415A (ja) | 2020-04-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |