JP6747487B2 - 放射線検出装置 - Google Patents

放射線検出装置 Download PDF

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Publication number
JP6747487B2
JP6747487B2 JP2018201765A JP2018201765A JP6747487B2 JP 6747487 B2 JP6747487 B2 JP 6747487B2 JP 2018201765 A JP2018201765 A JP 2018201765A JP 2018201765 A JP2018201765 A JP 2018201765A JP 6747487 B2 JP6747487 B2 JP 6747487B2
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Japan
Prior art keywords
electrode
wiring
radiation detection
radiation
circuit
Prior art date
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Application number
JP2018201765A
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English (en)
Japanese (ja)
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JP2020067415A (ja
JP2020067415A5 (enExample
Inventor
島田　修
修 島田
本村　知久
知久 本村
達 谷森
達 谷森
淳史 高田
淳史 高田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dai Nippon Printing Co Ltd filed Critical Dai Nippon Printing Co Ltd
Priority to JP2018201765A priority Critical patent/JP6747487B2/ja
Priority to CN201980069231.9A priority patent/CN112912769B/zh
Priority to EP19875060.6A priority patent/EP3872530A4/en
Priority to PCT/JP2019/040712 priority patent/WO2020085167A1/ja
Publication of JP2020067415A publication Critical patent/JP2020067415A/ja
Publication of JP2020067415A5 publication Critical patent/JP2020067415A5/ja
Application granted granted Critical
Publication of JP6747487B2 publication Critical patent/JP6747487B2/ja
Priority to US17/237,696 priority patent/US11573337B2/en
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Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2935—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using ionisation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/185—Measuring radiation intensity with ionisation chamber arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/242—Stacked detectors, e.g. for depth information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/06—Proportional counter tubes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
  • Light Receiving Elements (AREA)
JP2018201765A 2018-10-26 2018-10-26 放射線検出装置 Active JP6747487B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2018201765A JP6747487B2 (ja) 2018-10-26 2018-10-26 放射線検出装置
CN201980069231.9A CN112912769B (zh) 2018-10-26 2019-10-16 放射线检测装置
EP19875060.6A EP3872530A4 (en) 2018-10-26 2019-10-16 RADIATION DETECTION DEVICE
PCT/JP2019/040712 WO2020085167A1 (ja) 2018-10-26 2019-10-16 放射線検出装置
US17/237,696 US11573337B2 (en) 2018-10-26 2021-04-22 Radiation detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018201765A JP6747487B2 (ja) 2018-10-26 2018-10-26 放射線検出装置

Publications (3)

Publication Number Publication Date
JP2020067415A JP2020067415A (ja) 2020-04-30
JP2020067415A5 JP2020067415A5 (enExample) 2020-07-02
JP6747487B2 true JP6747487B2 (ja) 2020-08-26

Family

ID=70331938

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018201765A Active JP6747487B2 (ja) 2018-10-26 2018-10-26 放射線検出装置

Country Status (5)

Country Link
US (1) US11573337B2 (enExample)
EP (1) EP3872530A4 (enExample)
JP (1) JP6747487B2 (enExample)
CN (1) CN112912769B (enExample)
WO (1) WO2020085167A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11953452B2 (en) * 2021-03-01 2024-04-09 Redlen Technologies, Inc. Ionizing radiation detector with reduced street width and improved count rate stability
CN119698565A (zh) * 2022-08-31 2025-03-25 大日本印刷株式会社 检测装置、放射线确定装置以及中子成像装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5515881B2 (enExample) 1973-04-17 1980-04-26
US4255659A (en) * 1978-03-27 1981-03-10 The Regents Of The University Of California Semiconductor radiation detector
US6121622A (en) * 1995-07-14 2000-09-19 Yeda Research And Development Co., Ltd. Imager or particle detector and method of manufacturing the same
US6046454A (en) * 1995-10-13 2000-04-04 Digirad Corporation Semiconductor radiation detector with enhanced charge collection
JP3354551B2 (ja) * 2000-06-27 2002-12-09 科学技術振興事業団 ピクセル型電極によるガス増幅を用いた粒子線画像検出器
JP4237966B2 (ja) * 2002-03-08 2009-03-11 浜松ホトニクス株式会社 検出器
JP4138529B2 (ja) * 2003-02-24 2008-08-27 浜松ホトニクス株式会社 半導体装置、及びそれを用いた放射線検出器
JP3935091B2 (ja) * 2003-02-27 2007-06-20 浜松ホトニクス株式会社 半導体装置、及びそれを用いた放射線検出器
JP4365844B2 (ja) 2006-09-08 2009-11-18 三菱電機株式会社 荷電粒子線の線量分布測定装置
JP2009206057A (ja) * 2008-02-29 2009-09-10 Scienergy Co Ltd ガス電子増幅器及びこれを使用した放射線検出器
JP5471051B2 (ja) * 2008-06-23 2014-04-16 大日本印刷株式会社 ガス増幅を用いた放射線検出器、及び放射線検出器の製造方法
JP5515881B2 (ja) * 2010-03-11 2014-06-11 大日本印刷株式会社 放射線検出センサ、放射線検出センサの製造方法
JP2012168170A (ja) * 2011-01-25 2012-09-06 Dainippon Printing Co Ltd ガス増幅を用いた放射線検出器
US9529099B2 (en) * 2012-11-14 2016-12-27 Integrated Sensors, Llc Microcavity plasma panel radiation detector
JP5790750B2 (ja) 2013-12-13 2015-10-07 大日本印刷株式会社 放射線検出センサ
JP6821935B2 (ja) * 2016-03-30 2021-01-27 大日本印刷株式会社 検出素子及び放射線検出装置
JP6555380B2 (ja) * 2018-04-09 2019-08-07 大日本印刷株式会社 ガス増幅を用いた放射線検出器

Also Published As

Publication number Publication date
US11573337B2 (en) 2023-02-07
EP3872530A4 (en) 2022-07-27
US20210263172A1 (en) 2021-08-26
CN112912769B (zh) 2024-08-16
CN112912769A (zh) 2021-06-04
JP2020067415A (ja) 2020-04-30
WO2020085167A1 (ja) 2020-04-30
EP3872530A1 (en) 2021-09-01

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