ES2975299T3 - Procedimiento de unión por soldadura que permite mejorar la resistencia a la fatiga de uniones soldadas - Google Patents
Procedimiento de unión por soldadura que permite mejorar la resistencia a la fatiga de uniones soldadasInfo
- Publication number
- ES2975299T3 ES2975299T3 ES19203628T ES19203628T ES2975299T3 ES 2975299 T3 ES2975299 T3 ES 2975299T3 ES 19203628 T ES19203628 T ES 19203628T ES 19203628 T ES19203628 T ES 19203628T ES 2975299 T3 ES2975299 T3 ES 2975299T3
- Authority
- ES
- Spain
- Prior art keywords
- improves
- fatigue resistance
- welded joints
- joining procedure
- welding joining
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title 1
- 238000003466 welding Methods 0.000 title 1
Classifications
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- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
- B23K1/0016—Brazing of electronic components
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
- B23K3/06—Solder feeding devices; Solder melting pans
- B23K3/0607—Solder feeding devices
- B23K3/0623—Solder feeding devices for shaped solder piece feeding, e.g. preforms, bumps, balls, pellets, droplets
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
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- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/818—Bonding techniques
- H01L2224/81801—Soldering or alloying
- H01L2224/81815—Reflow soldering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/206—Length ranges
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1801162A FR3088018B1 (fr) | 2018-11-06 | 2018-11-06 | Procede de liaison par brassage permettant d'ameliorer la tenue en fatigue de joints brases |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2975299T3 true ES2975299T3 (es) | 2024-07-04 |
Family
ID=66166001
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES19203628T Active ES2975299T3 (es) | 2018-11-06 | 2019-10-16 | Procedimiento de unión por soldadura que permite mejorar la resistencia a la fatiga de uniones soldadas |
Country Status (6)
Country | Link |
---|---|
US (1) | US20220001475A1 (es) |
EP (1) | EP3651190B1 (es) |
ES (1) | ES2975299T3 (es) |
FR (1) | FR3088018B1 (es) |
IL (1) | IL282857A (es) |
WO (1) | WO2020094936A1 (es) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20220254750A1 (en) * | 2021-02-05 | 2022-08-11 | Raytheon Company | Ball bond impedance matching |
Family Cites Families (31)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH06302645A (ja) * | 1993-04-15 | 1994-10-28 | Fuji Xerox Co Ltd | 電子部品の端子接続方法とこの接続方法で接続した電子機器およびその端子接続用バンプ |
JP3030201B2 (ja) * | 1994-04-26 | 2000-04-10 | 富士通株式会社 | 半導体装置の製造方法及び半導体装置の製造装置 |
DE4442960C1 (de) * | 1994-12-02 | 1995-12-21 | Fraunhofer Ges Forschung | Lothöcker für die Flip-Chip-Montage und Verfahren zu dessen Herstellung |
JP2735022B2 (ja) * | 1995-03-22 | 1998-04-02 | 日本電気株式会社 | バンプ製造方法 |
JPH09219421A (ja) * | 1996-02-14 | 1997-08-19 | Hitachi Ltd | 半導体電子部品の製造方法およびウエハ |
JP3558449B2 (ja) * | 1996-06-10 | 2004-08-25 | 松下電器産業株式会社 | 電子部品構体 |
JPH10256259A (ja) * | 1997-03-11 | 1998-09-25 | Mitsubishi Electric Corp | マルチチップモジュールの製造方法 |
TW465064B (en) * | 2000-12-22 | 2001-11-21 | Advanced Semiconductor Eng | Bonding process and the structure thereof |
JP3833136B2 (ja) * | 2002-04-10 | 2006-10-11 | 株式会社カイジョー | 半導体構造およびボンディング方法 |
KR20050001159A (ko) * | 2003-06-27 | 2005-01-06 | 삼성전자주식회사 | 복수개의 플립 칩들을 갖는 멀티칩 패키지 및 그 제조방법 |
KR100574223B1 (ko) * | 2004-10-04 | 2006-04-27 | 삼성전자주식회사 | 멀티칩 패키지 및 그 제조방법 |
JP2006108408A (ja) * | 2004-10-06 | 2006-04-20 | Seiko Epson Corp | 半導体装置及びその製造方法 |
US20070202680A1 (en) * | 2006-02-28 | 2007-08-30 | Aminuddin Ismail | Semiconductor packaging method |
JP2008066363A (ja) * | 2006-09-05 | 2008-03-21 | Nec Tokin Corp | 非接触ic媒体およびその製造方法 |
KR100834804B1 (ko) * | 2006-12-21 | 2008-06-05 | 한국과학기술원 | 금속 스터드 스택 또는 칼럼을 이용한 플립칩 접속방법 및전자회로기판 |
KR20080062565A (ko) * | 2006-12-29 | 2008-07-03 | 주식회사 하이닉스반도체 | 플립 칩 패키지 |
US20090091027A1 (en) * | 2007-10-05 | 2009-04-09 | Powertech Technology Inc. | Semiconductor package having restraining ring surfaces against soldering crack |
US8080884B2 (en) * | 2008-06-27 | 2011-12-20 | Panasonic Corporation | Mounting structure and mounting method |
MY149251A (en) * | 2008-10-23 | 2013-07-31 | Carsem M Sdn Bhd | Wafer-level package using stud bump coated with solder |
US20120153444A1 (en) * | 2009-06-18 | 2012-06-21 | Rohm Co., Ltd | Semiconductor device |
TWI397157B (zh) * | 2009-12-28 | 2013-05-21 | 矽品精密工業股份有限公司 | 具微機電元件之封裝結構及其製法 |
US8502377B2 (en) * | 2010-08-06 | 2013-08-06 | Mediatek Inc. | Package substrate for bump on trace interconnection |
CN102456630B (zh) * | 2010-10-27 | 2014-01-01 | 中国科学院微电子研究所 | 制备微电子器件凸点多组分钎料层的方法 |
JP2012114256A (ja) * | 2010-11-25 | 2012-06-14 | Sony Corp | はんだバンプの製造方法、及び半導体装置 |
KR102007780B1 (ko) * | 2012-07-31 | 2019-10-21 | 삼성전자주식회사 | 멀티 범프 구조의 전기적 연결부를 포함하는 반도체 소자의 제조방법 |
WO2014063281A1 (en) * | 2012-10-22 | 2014-05-01 | Sandisk Information Technology (Shanghai) Co., Ltd. | Semiconductor device including stacked bumps for emi/rfi shielding |
TWI395313B (zh) * | 2012-11-07 | 2013-05-01 | Wire technology co ltd | 銲球凸塊結構及其形成方法 |
TWI555105B (zh) * | 2014-03-31 | 2016-10-21 | 英凡薩斯公司 | 具延伸通過密封連接器所耦接之堆疊端子的微電子組件的製造 |
CN104485292A (zh) * | 2014-12-10 | 2015-04-01 | 华进半导体封装先导技术研发中心有限公司 | 基板上通过引线键合互叠凸块实现小间距凸点及PoP互叠的方法 |
CN104659005A (zh) * | 2015-01-23 | 2015-05-27 | 三星半导体(中国)研究开发有限公司 | 封装、包括该封装的封装堆叠结构及其制造方法 |
US10026707B2 (en) * | 2016-09-23 | 2018-07-17 | Microchip Technology Incorportated | Wafer level package and method |
-
2018
- 2018-11-06 FR FR1801162A patent/FR3088018B1/fr active Active
-
2019
- 2019-10-16 US US17/291,262 patent/US20220001475A1/en active Pending
- 2019-10-16 EP EP19203628.3A patent/EP3651190B1/fr active Active
- 2019-10-16 WO PCT/FR2019/052448 patent/WO2020094936A1/fr active Application Filing
- 2019-10-16 ES ES19203628T patent/ES2975299T3/es active Active
-
2021
- 2021-05-02 IL IL282857A patent/IL282857A/en unknown
Also Published As
Publication number | Publication date |
---|---|
EP3651190B1 (fr) | 2024-02-21 |
FR3088018A1 (fr) | 2020-05-08 |
WO2020094936A1 (fr) | 2020-05-14 |
FR3088018B1 (fr) | 2023-01-13 |
IL282857A (en) | 2021-06-30 |
US20220001475A1 (en) | 2022-01-06 |
EP3651190A1 (fr) | 2020-05-13 |
EP3651190C0 (fr) | 2024-02-21 |
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