CN112119352B - 大型光掩模 - Google Patents
大型光掩模 Download PDFInfo
- Publication number
- CN112119352B CN112119352B CN201980032507.6A CN201980032507A CN112119352B CN 112119352 B CN112119352 B CN 112119352B CN 201980032507 A CN201980032507 A CN 201980032507A CN 112119352 B CN112119352 B CN 112119352B
- Authority
- CN
- China
- Prior art keywords
- light
- film
- pattern
- low reflection
- exposure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
- G03F1/46—Antireflective coatings
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/54—Absorbers, e.g. of opaque materials
- G03F1/58—Absorbers, e.g. of opaque materials having two or more different absorber layers, e.g. stacked multilayer absorbers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018-048085 | 2018-03-15 | ||
| JP2018048085 | 2018-03-15 | ||
| JP2018238508 | 2018-12-20 | ||
| JP2018-238508 | 2018-12-20 | ||
| PCT/JP2019/010647 WO2019177116A1 (ja) | 2018-03-15 | 2019-03-14 | 大型フォトマスク |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112119352A CN112119352A (zh) | 2020-12-22 |
| CN112119352B true CN112119352B (zh) | 2024-07-26 |
Family
ID=67906680
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201980032507.6A Active CN112119352B (zh) | 2018-03-15 | 2019-03-14 | 大型光掩模 |
Country Status (5)
| Country | Link |
|---|---|
| JP (3) | JP7420065B2 (https=) |
| KR (2) | KR102653366B1 (https=) |
| CN (1) | CN112119352B (https=) |
| TW (1) | TWI711878B (https=) |
| WO (1) | WO2019177116A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL2025258A (en) * | 2019-05-02 | 2020-11-05 | Asml Netherlands Bv | A patterning device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016188997A (ja) * | 2015-03-27 | 2016-11-04 | Hoya株式会社 | フォトマスクブランク及びこれを用いたフォトマスクの製造方法、並びに表示装置の製造方法 |
Family Cites Families (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4178403A (en) * | 1977-08-04 | 1979-12-11 | Konishiroku Photo Industry Co., Ltd. | Mask blank and mask |
| JPH11125896A (ja) * | 1997-08-19 | 1999-05-11 | Toppan Printing Co Ltd | フォトマスクブランクス及びフォトマスク |
| JP4088742B2 (ja) | 2000-12-26 | 2008-05-21 | 信越化学工業株式会社 | フォトマスクブランクス、フォトマスク及びフォトマスクブランクスの製造方法 |
| ATE487255T1 (de) * | 2001-05-31 | 2010-11-15 | Nichia Corp | Halbleiterlaserelement |
| JP4389440B2 (ja) * | 2002-10-29 | 2009-12-24 | 凸版印刷株式会社 | 転写マスク及びその作製方法 |
| WO2004070472A1 (ja) * | 2003-02-03 | 2004-08-19 | Hoya Corporation | フォトマスクブランク及びフォトマスク、並びにフォトマスクを用いたパターン転写方法 |
| JP2007156365A (ja) * | 2005-12-09 | 2007-06-21 | Canon Inc | 反射防止膜、光学素子、光学系、露光装置及びデバイス製造方法 |
| TW200745630A (en) * | 2006-04-24 | 2007-12-16 | Asahi Glass Co Ltd | Blank, black matrix, and color filter |
| JP4005622B1 (ja) * | 2006-09-04 | 2007-11-07 | ジオマテック株式会社 | フォトマスク用基板及びフォトマスク並びにその製造方法 |
| US8198118B2 (en) * | 2006-10-31 | 2012-06-12 | Taiwan Semiconductor Manufacturing Co. | Method for forming a robust mask with reduced light scattering |
| JP2008311498A (ja) * | 2007-06-15 | 2008-12-25 | Orc Mfg Co Ltd | 反射型露光装置 |
| WO2008139904A1 (ja) * | 2007-04-27 | 2008-11-20 | Hoya Corporation | フォトマスクブランク及びフォトマスク |
| JP2009229868A (ja) * | 2008-03-24 | 2009-10-08 | Hoya Corp | グレートーンマスクの製造方法及びグレートーンマスク、並びにパターン転写方法 |
| KR20090110240A (ko) * | 2008-04-16 | 2009-10-21 | 지오마텍 가부시키가이샤 | 포토마스크용 기판, 포토마스크 및 그의 제조방법 |
| KR20110115058A (ko) * | 2010-04-14 | 2011-10-20 | 주식회사 에스앤에스텍 | 포토마스크 블랭크, 포토마스크 및 패턴 형성 방법 |
| CN110083008A (zh) * | 2011-10-21 | 2019-08-02 | 大日本印刷株式会社 | 大型相移掩模及大型相移掩模的制造方法 |
| KR101473163B1 (ko) * | 2013-07-26 | 2014-12-16 | 주식회사 에스앤에스텍 | 플랫 패널 디스플레이용 블랭크 마스크 및 포토 마스크 |
| JP6106579B2 (ja) * | 2013-11-25 | 2017-04-05 | Hoya株式会社 | フォトマスクの製造方法、フォトマスク及びパターン転写方法 |
| JP6080915B2 (ja) * | 2014-08-25 | 2017-02-15 | エスアンドエス テック カンパニー リミテッド | 位相反転ブランクマスク及びフォトマスク |
| JP6594742B2 (ja) * | 2014-11-20 | 2019-10-23 | Hoya株式会社 | フォトマスクブランク及びそれを用いたフォトマスクの製造方法、並びに表示装置の製造方法 |
| KR101846065B1 (ko) * | 2015-03-27 | 2018-04-05 | 호야 가부시키가이샤 | 포토마스크 블랭크 및 이것을 사용한 포토마스크의 제조 방법, 및 표시 장치의 제조 방법 |
| KR20160129789A (ko) * | 2015-04-30 | 2016-11-09 | 주식회사 에스앤에스텍 | 플랫 패널 디스플레이용 위상반전 블랭크 마스크 및 포토마스크 |
| JP6352224B2 (ja) * | 2015-07-17 | 2018-07-04 | Hoya株式会社 | 位相シフトマスクブランク及びこれを用いた位相シフトマスクの製造方法、並びに表示装置の製造方法 |
| CN107848946A (zh) * | 2015-07-23 | 2018-03-27 | 三菱瓦斯化学株式会社 | 新型(甲基)丙烯酰基化合物及其制造方法 |
| JP6451561B2 (ja) * | 2015-09-03 | 2019-01-16 | 信越化学工業株式会社 | フォトマスクブランク |
| JP7125835B2 (ja) * | 2016-04-05 | 2022-08-25 | 旭化成株式会社 | ペリクル |
| JP6891099B2 (ja) * | 2017-01-16 | 2021-06-18 | Hoya株式会社 | 位相シフトマスクブランクおよびこれを用いた位相シフトマスクの製造方法、並びに表示装置の製造方法 |
-
2019
- 2019-03-14 TW TW108108561A patent/TWI711878B/zh active
- 2019-03-14 CN CN201980032507.6A patent/CN112119352B/zh active Active
- 2019-03-14 JP JP2020506656A patent/JP7420065B2/ja active Active
- 2019-03-14 KR KR1020207029308A patent/KR102653366B1/ko active Active
- 2019-03-14 WO PCT/JP2019/010647 patent/WO2019177116A1/ja not_active Ceased
- 2019-03-14 KR KR1020247010297A patent/KR102944085B1/ko active Active
-
2023
- 2023-10-24 JP JP2023182390A patent/JP2024001250A/ja active Pending
-
2025
- 2025-05-26 JP JP2025087066A patent/JP2025122138A/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016188997A (ja) * | 2015-03-27 | 2016-11-04 | Hoya株式会社 | フォトマスクブランク及びこれを用いたフォトマスクの製造方法、並びに表示装置の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2024001250A (ja) | 2024-01-09 |
| JP2025122138A (ja) | 2025-08-20 |
| TW201945832A (zh) | 2019-12-01 |
| WO2019177116A1 (ja) | 2019-09-19 |
| KR102653366B1 (ko) | 2024-04-02 |
| KR20200128141A (ko) | 2020-11-11 |
| JP7420065B2 (ja) | 2024-01-23 |
| KR102944085B1 (ko) | 2026-03-27 |
| CN112119352A (zh) | 2020-12-22 |
| JPWO2019177116A1 (ja) | 2021-02-25 |
| KR20240046289A (ko) | 2024-04-08 |
| TWI711878B (zh) | 2020-12-01 |
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| GR01 | Patent grant |