CN110545957B - 工件的切断方法及接合部件 - Google Patents
工件的切断方法及接合部件 Download PDFInfo
- Publication number
- CN110545957B CN110545957B CN201880026727.3A CN201880026727A CN110545957B CN 110545957 B CN110545957 B CN 110545957B CN 201880026727 A CN201880026727 A CN 201880026727A CN 110545957 B CN110545957 B CN 110545957B
- Authority
- CN
- China
- Prior art keywords
- workpiece
- wire
- fixed abrasive
- grindstone
- joining member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005520 cutting process Methods 0.000 title claims abstract description 25
- 238000000034 method Methods 0.000 title claims abstract description 23
- 229910000831 Steel Inorganic materials 0.000 claims abstract description 30
- 239000010959 steel Substances 0.000 claims abstract description 30
- 239000006061 abrasive grain Substances 0.000 claims abstract description 25
- 238000005304 joining Methods 0.000 claims abstract description 23
- 239000000126 substance Substances 0.000 claims abstract description 3
- 239000004575 stone Substances 0.000 claims description 15
- 229920005989 resin Polymers 0.000 claims description 8
- 239000011347 resin Substances 0.000 claims description 8
- 229910052710 silicon Inorganic materials 0.000 claims description 6
- 239000010703 silicon Substances 0.000 claims description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 4
- 229910052799 carbon Inorganic materials 0.000 claims description 4
- 239000005361 soda-lime glass Substances 0.000 claims description 4
- 230000007246 mechanism Effects 0.000 description 11
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 239000002826 coolant Substances 0.000 description 3
- 239000010432 diamond Substances 0.000 description 3
- 229910003460 diamond Inorganic materials 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000000110 cooling liquid Substances 0.000 description 1
- 239000010431 corundum Substances 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/06—Grinders for cutting-off
- B24B27/0616—Grinders for cutting-off using a tool turning around the workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/06—Grinders for cutting-off
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/04—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D7/00—Accessories specially adapted for use with machines or devices of the preceding groups
- B28D7/04—Accessories specially adapted for use with machines or devices of the preceding groups for supporting or holding work or conveying or discharging work
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017-091908 | 2017-05-02 | ||
JP2017091908 | 2017-05-02 | ||
PCT/JP2018/010922 WO2018203448A1 (ja) | 2017-05-02 | 2018-03-20 | ワークの切断方法及び接合部材 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN110545957A CN110545957A (zh) | 2019-12-06 |
CN110545957B true CN110545957B (zh) | 2021-07-23 |
Family
ID=64016055
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201880026727.3A Active CN110545957B (zh) | 2017-05-02 | 2018-03-20 | 工件的切断方法及接合部件 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6835213B2 (ja) |
KR (1) | KR102476617B1 (ja) |
CN (1) | CN110545957B (ja) |
TW (1) | TWI717592B (ja) |
WO (1) | WO2018203448A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6969579B2 (ja) * | 2019-01-15 | 2021-11-24 | 信越半導体株式会社 | ワークの切断方法及びワイヤソー |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11240008A (ja) * | 1998-02-24 | 1999-09-07 | Sumitomo Metal Ind Ltd | ウェーハのスライス方法 |
JP2010058249A (ja) * | 2008-09-05 | 2010-03-18 | Shin Etsu Handotai Co Ltd | インゴット切断装置及び切断方法 |
JP2011031386A (ja) * | 2009-07-10 | 2011-02-17 | Mitsubishi Chemicals Corp | 電着式固定砥粒ワイヤーおよびこれを用いた結晶スライス方法 |
CN103240805A (zh) * | 2012-02-09 | 2013-08-14 | 硅电子股份公司 | 从工件同时切割多个切片的设备和方法 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53114583A (en) * | 1977-03-17 | 1978-10-06 | Sony Corp | Method of cutting ingot |
JPH0283163A (ja) * | 1988-09-19 | 1990-03-23 | Hitachi Ltd | 砥石ドレッシング方法 |
US5878737A (en) * | 1997-07-07 | 1999-03-09 | Laser Technology West Limited | Apparatus and method for slicing a workpiece utilizing a diamond impregnated wire |
AU2000251024A1 (en) * | 2000-05-31 | 2001-12-11 | Memc Electronic Materials S.P.A. | Wire saw and process for slicing multiple semiconductor ingots |
WO2005095076A1 (en) * | 2004-03-30 | 2005-10-13 | Solaicx, Inc. | Method and apparatus for cutting ultra thin silicon wafers |
JP2006268923A (ja) * | 2005-03-22 | 2006-10-05 | Fuji Photo Film Co Ltd | 磁気記録媒体の表面処理方法 |
JP5263536B2 (ja) | 2009-07-14 | 2013-08-14 | 信越半導体株式会社 | ワークの切断方法 |
JP5853946B2 (ja) * | 2012-01-06 | 2016-02-09 | 信越化学工業株式会社 | 外周切断刃の製造方法 |
US10252357B2 (en) * | 2012-12-04 | 2019-04-09 | Meyer Burger Ag | Wire management system |
DE102013219468B4 (de) * | 2013-09-26 | 2015-04-23 | Siltronic Ag | Verfahren zum gleichzeitigen Trennen einer Vielzahl von Scheiben von einem Werkstück |
JP5994766B2 (ja) * | 2013-11-21 | 2016-09-21 | 信越半導体株式会社 | ワークの切断方法 |
DE102015200198B4 (de) * | 2014-04-04 | 2020-01-16 | Siltronic Ag | Verfahren zum Abtrennen von Halbleiterscheiben von einem Werkstück mit einem Sägedraht |
DE102014208187B4 (de) * | 2014-04-30 | 2023-07-06 | Siltronic Ag | Verfahren zum gleichzeitigen Trennen einer Vielzahl von Scheiben mit besonders gleichmäßiger Dicke von einem Werkstück |
-
2018
- 2018-03-20 KR KR1020197031386A patent/KR102476617B1/ko active IP Right Grant
- 2018-03-20 CN CN201880026727.3A patent/CN110545957B/zh active Active
- 2018-03-20 JP JP2019516366A patent/JP6835213B2/ja active Active
- 2018-03-20 WO PCT/JP2018/010922 patent/WO2018203448A1/ja active Application Filing
- 2018-03-23 TW TW107109920A patent/TWI717592B/zh active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11240008A (ja) * | 1998-02-24 | 1999-09-07 | Sumitomo Metal Ind Ltd | ウェーハのスライス方法 |
JP2010058249A (ja) * | 2008-09-05 | 2010-03-18 | Shin Etsu Handotai Co Ltd | インゴット切断装置及び切断方法 |
JP2011031386A (ja) * | 2009-07-10 | 2011-02-17 | Mitsubishi Chemicals Corp | 電着式固定砥粒ワイヤーおよびこれを用いた結晶スライス方法 |
CN103240805A (zh) * | 2012-02-09 | 2013-08-14 | 硅电子股份公司 | 从工件同时切割多个切片的设备和方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20200002845A (ko) | 2020-01-08 |
WO2018203448A1 (ja) | 2018-11-08 |
JP6835213B2 (ja) | 2021-02-24 |
TWI717592B (zh) | 2021-02-01 |
KR102476617B1 (ko) | 2022-12-12 |
JPWO2018203448A1 (ja) | 2020-01-23 |
TW201843725A (zh) | 2018-12-16 |
CN110545957A (zh) | 2019-12-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR102545544B1 (ko) | 워크의 절단방법 및 와이어소 | |
KR20160048787A (ko) | 잉곳의 절단방법 및 와이어 쏘 | |
CN111511504B (zh) | 工件切断方法及线锯 | |
KR102471435B1 (ko) | 워크의 절단방법 | |
KR102100839B1 (ko) | 워크의 절단방법 | |
CN110545957B (zh) | 工件的切断方法及接合部件 | |
CN113226640B (zh) | 工件的切断方法及线锯 | |
JP7226286B2 (ja) | ワイヤソーの運転再開方法 | |
CN111670088B (zh) | 工件的切断方法及线锯 | |
CN113710397B (zh) | 工件的切断方法及线锯 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |