CN110036283A - X射线检查系统以及x射线接收装置 - Google Patents

X射线检查系统以及x射线接收装置 Download PDF

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Publication number
CN110036283A
CN110036283A CN201880004784.1A CN201880004784A CN110036283A CN 110036283 A CN110036283 A CN 110036283A CN 201880004784 A CN201880004784 A CN 201880004784A CN 110036283 A CN110036283 A CN 110036283A
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CN
China
Prior art keywords
ray
mounting surface
reception device
contact site
inspection object
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201880004784.1A
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English (en)
Chinese (zh)
Inventor
小林裕信
住川健
水谷博成
横岛伸
二阶堂羊司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Publication of CN110036283A publication Critical patent/CN110036283A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201880004784.1A 2017-08-18 2018-03-12 X射线检查系统以及x射线接收装置 Pending CN110036283A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2017-157806 2017-08-18
JP2017157806 2017-08-18
PCT/JP2018/009497 WO2019035233A1 (ja) 2017-08-18 2018-03-12 Ｘ線検査システム及びｘ線受像装置

Publications (1)

Publication Number Publication Date
CN110036283A true CN110036283A (zh) 2019-07-19

Family

ID=65362808

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201880004784.1A Pending CN110036283A (zh) 2017-08-18 2018-03-12 X射线检查系统以及x射线接收装置

Country Status (3)

Country Link
KR (1) KR102257665B1 (ko)
CN (1) CN110036283A (ko)
WO (1) WO2019035233A1 (ko)

Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10246710A (ja) * 1997-03-05 1998-09-14 Hitachi Building Syst Co Ltd 小荷物内部のｘ線透視装置
US5943388A (en) * 1996-07-30 1999-08-24 Nova R & D, Inc. Radiation detector and non-destructive inspection
JP2005147800A (ja) * 2003-11-13 2005-06-09 Ishikawajima Harima Heavy Ind Co Ltd Ｘ線撮影用の支持台
CN201199235Y (zh) * 2008-05-12 2009-02-25 丁青 新型x射线通道式安检系统结构
CN101802594A (zh) * 2007-09-11 2010-08-11 株式会社石田 X射线检查装置
CN102313753A (zh) * 2010-06-30 2012-01-11 清华大学 物品检测设备及其检测方法
US20120093288A1 (en) * 2010-10-15 2012-04-19 American Science And Engineering, Inc. Remotely-Aligned Arcuate Detector Array for High Energy X-ray Imaging
CN102949198A (zh) * 2011-08-22 2013-03-06 佳能株式会社 放射线摄像设备、手柄单元和x射线摄像设备
CN103558644A (zh) * 2013-08-15 2014-02-05 北京紫方启研科技有限公司 一种多功能手持式高清x射线检测仪
US20140341343A1 (en) * 2002-07-23 2014-11-20 Rapiscan Systems, Inc. Cargo Scanning System with Boom Structure
US20160061989A1 (en) * 2014-09-02 2016-03-03 Tsinghua University Vehicle-mounted inspection system
CN105417070A (zh) * 2010-04-19 2016-03-23 凤凰传送带系统有限公司 通过高能辐射、特别是x射线对传送带进行无损性检测的系统
CN106645225A (zh) * 2016-12-29 2017-05-10 同方威视技术股份有限公司 可移动物品检查系统
KR20170079793A (ko) * 2015-12-31 2017-07-10 주식회사 시큐어텍 폭발물 확인 시스템 및 그 동작 방법
CN206339666U (zh) * 2016-12-26 2017-07-18 同方威视技术股份有限公司 移动式排爆透射成像装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0933450A (ja) 1995-07-20 1997-02-07 Hitachi Medical Corp Ｘ線透視像取込用枠体及び可搬形ｘ線検査装置
JP2001027617A (ja) 1999-07-13 2001-01-30 Hitachi Engineering & Services Co Ltd Ｘ線検査装置
CN102668553B (zh) * 2009-11-25 2015-02-04 虚拟成像股份有限公司 便携式辐射成像系统
US9274065B2 (en) 2012-02-08 2016-03-01 Rapiscan Systems, Inc. High-speed security inspection system
JP2015021784A (ja) * 2013-07-17 2015-02-02 株式会社島津製作所 二次元画像検出システム

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5943388A (en) * 1996-07-30 1999-08-24 Nova R & D, Inc. Radiation detector and non-destructive inspection
JPH10246710A (ja) * 1997-03-05 1998-09-14 Hitachi Building Syst Co Ltd 小荷物内部のｘ線透視装置
US20140341343A1 (en) * 2002-07-23 2014-11-20 Rapiscan Systems, Inc. Cargo Scanning System with Boom Structure
JP2005147800A (ja) * 2003-11-13 2005-06-09 Ishikawajima Harima Heavy Ind Co Ltd Ｘ線撮影用の支持台
CN101802594A (zh) * 2007-09-11 2010-08-11 株式会社石田 X射线检查装置
CN201199235Y (zh) * 2008-05-12 2009-02-25 丁青 新型x射线通道式安检系统结构
CN105417070A (zh) * 2010-04-19 2016-03-23 凤凰传送带系统有限公司 通过高能辐射、特别是x射线对传送带进行无损性检测的系统
CN102313753A (zh) * 2010-06-30 2012-01-11 清华大学 物品检测设备及其检测方法
US20120093288A1 (en) * 2010-10-15 2012-04-19 American Science And Engineering, Inc. Remotely-Aligned Arcuate Detector Array for High Energy X-ray Imaging
CN102949198A (zh) * 2011-08-22 2013-03-06 佳能株式会社 放射线摄像设备、手柄单元和x射线摄像设备
CN103558644A (zh) * 2013-08-15 2014-02-05 北京紫方启研科技有限公司 一种多功能手持式高清x射线检测仪
US20160061989A1 (en) * 2014-09-02 2016-03-03 Tsinghua University Vehicle-mounted inspection system
KR20170079793A (ko) * 2015-12-31 2017-07-10 주식회사 시큐어텍 폭발물 확인 시스템 및 그 동작 방법
CN206339666U (zh) * 2016-12-26 2017-07-18 同方威视技术股份有限公司 移动式排爆透射成像装置
CN106645225A (zh) * 2016-12-29 2017-05-10 同方威视技术股份有限公司 可移动物品检查系统

Also Published As

Publication number Publication date
WO2019035233A1 (ja) 2019-02-21
KR20190079658A (ko) 2019-07-05
KR102257665B1 (ko) 2021-05-31

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Effective date of abandoning: 20220405