CN109863410A - 上电复位时间的测量方法及系统 - Google Patents

上电复位时间的测量方法及系统 Download PDF

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CN109863410A
CN109863410A CN201780001326.8A CN201780001326A CN109863410A CN 109863410 A CN109863410 A CN 109863410A CN 201780001326 A CN201780001326 A CN 201780001326A CN 109863410 A CN109863410 A CN 109863410A
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time
reset
time point
chip
measured
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CN109863410B (zh
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李庆斌
陈德坤
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Shenzhen Goodix Technology Co Ltd
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Shenzhen Goodix Technology Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/175—Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16576—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R22/00—Arrangements for measuring time integral of electric power or current, e.g. electricity meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/22—Modifications for ensuring a predetermined initial state when the supply voltage has been applied

Abstract

一种上电复位时间(T(P))的测量方法及系统，涉及电路技术领域。上电复位时间(T(P))的测量方法包括：检测待测芯片的电源脚电压，将电源脚电压达到预设电压的时间点，记为第一时间点(T1)(101，201)；检测待测芯片的预设管脚的输出信号，将预设管脚在待测芯片上电后第一次完成脉冲输出的时间点，记为第二时间点(T2)，并将预设管脚在待测芯片上电后第二次完成脉冲输出的时间点，记为第三时间点(T3)(102，202)；其中，第一次输出的脉冲与第二次输出的脉冲的宽度相同；根据第一时间点(T1)、第二时间点(T2)和第三时间点(T3)计算得到待测芯片的上电复位时间(T(P))(103，203)；相应的上电复位时间(T(P))的测量系统能够较为准确的测量上电复位时间，提高了上电复位电路的验证效率。

Description

PCT国内申请，说明书已公开。

Claims (12)

  1. PCT国内申请，权利要求书已公开。
CN201780001326.8A 2017-09-19 2017-09-19 上电复位时间的测量方法及系统 Active CN109863410B (zh)

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PCT/CN2017/102344 WO2019056192A1 (zh) 2017-09-19 2017-09-19 上电复位时间的测量方法及系统

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Publication number Publication date
CN109863410B (zh) 2021-03-05
EP3480608A1 (en) 2019-05-08
US11287453B2 (en) 2022-03-29
US20190086451A1 (en) 2019-03-21
EP3480608B1 (en) 2021-01-13
EP3480608A4 (en) 2019-09-25
WO2019056192A1 (zh) 2019-03-28

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