CN109001174B - 表面增强拉曼散射元件 - Google Patents
表面增强拉曼散射元件 Download PDFInfo
- Publication number
- CN109001174B CN109001174B CN201810538346.5A CN201810538346A CN109001174B CN 109001174 B CN109001174 B CN 109001174B CN 201810538346 A CN201810538346 A CN 201810538346A CN 109001174 B CN109001174 B CN 109001174B
- Authority
- CN
- China
- Prior art keywords
- conductor layer
- raman scattering
- enhanced raman
- substrate
- recessed region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N2021/651—Cuvettes therefore
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- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012-178773 | 2012-08-10 | ||
| JP2012178773A JP5945192B2 (ja) | 2012-08-10 | 2012-08-10 | 表面増強ラマン散乱ユニット |
| CN201380040187.1A CN104508464B (zh) | 2012-08-10 | 2013-08-09 | 表面增强拉曼散射元件 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201380040187.1A Division CN104508464B (zh) | 2012-08-10 | 2013-08-09 | 表面增强拉曼散射元件 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109001174A CN109001174A (zh) | 2018-12-14 |
| CN109001174B true CN109001174B (zh) | 2022-01-07 |
Family
ID=50068243
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810538346.5A Expired - Fee Related CN109001174B (zh) | 2012-08-10 | 2013-08-09 | 表面增强拉曼散射元件 |
| CN201380040187.1A Expired - Fee Related CN104508464B (zh) | 2012-08-10 | 2013-08-09 | 表面增强拉曼散射元件 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201380040187.1A Expired - Fee Related CN104508464B (zh) | 2012-08-10 | 2013-08-09 | 表面增强拉曼散射元件 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9857306B2 (enExample) |
| EP (1) | EP2889605B1 (enExample) |
| JP (1) | JP5945192B2 (enExample) |
| CN (2) | CN109001174B (enExample) |
| WO (1) | WO2014025027A1 (enExample) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5908370B2 (ja) * | 2012-08-10 | 2016-04-26 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱ユニット |
| WO2014025037A1 (ja) | 2012-08-10 | 2014-02-13 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱素子及びその製造方法 |
| US10132755B2 (en) | 2012-08-10 | 2018-11-20 | Hamamatsu Photonics K.K. | Surface-enhanced Raman scattering element, and method for manufacturing surface-enhanced Raman scattering element |
| JP6023509B2 (ja) * | 2012-08-10 | 2016-11-09 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱ユニット |
| CN104508466B (zh) | 2012-08-10 | 2018-07-17 | 浜松光子学株式会社 | 表面增强拉曼散射元件 |
| JP6294797B2 (ja) * | 2014-09-10 | 2018-03-14 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱ユニット |
| US10527494B2 (en) * | 2014-09-26 | 2020-01-07 | Korea Intitute of Machinery & Materials | Substrate on which multiple nanogaps are formed, and manufacturing method therefor |
| JP6564203B2 (ja) | 2015-02-26 | 2019-08-21 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱素子及びその製造方法 |
| KR101776103B1 (ko) * | 2016-04-01 | 2017-09-08 | 한국생산기술연구원 | 합성수지를 이용한 sers 기판 및 이의 제조방법 |
| EP3401670A1 (en) * | 2017-05-10 | 2018-11-14 | ETH Zurich | Method, uses of and device for surface enhanced raman spectroscopy |
| CN109001173B (zh) * | 2017-06-06 | 2021-01-26 | 清华大学 | 单分子检测的方法 |
| CN109470682B (zh) | 2017-09-08 | 2024-12-10 | 清华大学 | 用于分子检测的分子载体 |
| CN109470679B (zh) | 2017-09-08 | 2021-04-23 | 清华大学 | 用于分子检测的分子载体 |
| CN109470677B (zh) | 2017-09-08 | 2021-11-05 | 清华大学 | 分子检测装置 |
| CN109470680B (zh) * | 2017-09-08 | 2022-02-08 | 清华大学 | 用于分子检测的分子载体的制备方法 |
| CN109470681B (zh) | 2017-09-08 | 2022-02-08 | 清华大学 | 一种分子检测方法 |
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| JPH0544867U (ja) | 1991-11-18 | 1993-06-15 | 三洋電機株式会社 | 測定装置の包装体 |
| JPH07260646A (ja) | 1994-03-17 | 1995-10-13 | Nikon Corp | 試料容器 |
| US20040023046A1 (en) | 1998-08-04 | 2004-02-05 | Falko Schlottig | Carrier substrate for Raman spectrometric analysis |
| JP2003026232A (ja) | 2001-07-18 | 2003-01-29 | Seiko Epson Corp | 梱包方法及び緩衝材 |
| US7460224B2 (en) | 2005-12-19 | 2008-12-02 | Opto Trace Technologies, Inc. | Arrays of nano structures for surface-enhanced Raman scattering |
| CN100357738C (zh) | 2004-03-26 | 2007-12-26 | 博奥生物有限公司 | 一种检测小分子化合物的方法 |
| KR101168654B1 (ko) | 2004-05-19 | 2012-07-25 | 브이피 호울딩 엘엘씨 | 표면 증강 라만 산란에 의한 화학기의 증강된 검출을 위한 층상의 플라즈몬 구조를 가진 광센서 |
| JP2005337771A (ja) | 2004-05-25 | 2005-12-08 | National Institute For Materials Science | ナノ構造を有する集積化ピラー構造光学素子 |
| GB0424458D0 (en) * | 2004-11-04 | 2004-12-08 | Mesophotonics Ltd | Metal nano-void photonic crystal for enhanced raman spectroscopy |
| EP1817571B1 (en) * | 2004-11-04 | 2011-09-07 | Renishaw Diagnostics Limited | Metal nano-void photonic crystal for enhanced raman spectroscopy |
| US7245370B2 (en) | 2005-01-06 | 2007-07-17 | Hewlett-Packard Development Company, L.P. | Nanowires for surface-enhanced Raman scattering molecular sensors |
| US7651863B2 (en) * | 2005-07-14 | 2010-01-26 | 3M Innovative Properties Company | Surface-enhanced spectroscopic method, flexible structured substrate, and method of making the same |
| GB0606088D0 (en) * | 2006-03-27 | 2006-05-03 | E2V Biosensors Ltd | Improved serrs substrate |
| US7528948B2 (en) | 2006-07-25 | 2009-05-05 | Hewlett-Packard Development Company, L.P. | Controllable surface enhanced Raman spectroscopy |
| US8131832B1 (en) | 2006-09-28 | 2012-03-06 | Rockwell Automation Technologies, Inc. | Message engine searching and classification |
| US9128084B2 (en) | 2006-10-12 | 2015-09-08 | Koninklijke Philips N.V. | Fast biosensor with reagent layer |
| US7388661B2 (en) | 2006-10-20 | 2008-06-17 | Hewlett-Packard Development Company, L.P. | Nanoscale structures, systems, and methods for use in nano-enhanced raman spectroscopy (NERS) |
| JP2008196992A (ja) * | 2007-02-14 | 2008-08-28 | National Institute Of Information & Communication Technology | 表面プラズモンの電場増強構造 |
| JP5397577B2 (ja) | 2007-03-05 | 2014-01-22 | オムロン株式会社 | 表面プラズモン共鳴センサ及び当該センサ用チップ |
| JP2008268059A (ja) | 2007-04-23 | 2008-11-06 | St Japan Inc | 試料ホルダ |
| US8049896B2 (en) * | 2007-05-31 | 2011-11-01 | Canon Kabushiki Kaisha | Detecting element, detecting device, and method of producing the detecting element |
| JP4993360B2 (ja) | 2007-06-08 | 2012-08-08 | 富士フイルム株式会社 | 微細構造体及びその製造方法、光電場増強デバイス |
| JP2009047623A (ja) | 2007-08-22 | 2009-03-05 | Jiyasuko Eng Kk | 透過測定用ホルダ |
| JP4406452B2 (ja) * | 2007-09-27 | 2010-01-27 | 株式会社日立製作所 | ベルト状金型およびそれを用いたナノインプリント装置 |
| JP2009103643A (ja) | 2007-10-25 | 2009-05-14 | Fujifilm Corp | 表面増強ラマン分光装置 |
| US8115920B2 (en) | 2007-11-14 | 2012-02-14 | 3M Innovative Properties Company | Method of making microarrays |
| JP2009222507A (ja) | 2008-03-14 | 2009-10-01 | National Institute Of Advanced Industrial & Technology | 微量物質検出素子 |
| JP2009236830A (ja) | 2008-03-28 | 2009-10-15 | Sumitomo Precision Prod Co Ltd | 被分析物担体、及び、その製造方法 |
| CN101281133B (zh) | 2008-05-12 | 2010-08-18 | 中国科学院合肥物质科学研究院 | 具有大面积微纳树状结构阵列的表面增强拉曼活性基底的制备方法 |
| JP4980324B2 (ja) | 2008-09-30 | 2012-07-18 | テルモ株式会社 | 成分測定装置 |
| US8531658B2 (en) | 2008-10-30 | 2013-09-10 | Nippon Telegraph And Telephone Corporation | Measuring chip device using magnets for installation/removal |
| US8547549B2 (en) | 2008-11-17 | 2013-10-01 | Hewlett-Packard Development Company, L.P. | Substrate for surface enhanced Raman scattering (SERS) |
| CN101408513A (zh) * | 2008-11-28 | 2009-04-15 | 长春理工大学 | 表面规则凹凸起伏的样品台及其制作方法 |
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| JP2011021085A (ja) | 2009-07-15 | 2011-02-03 | Yokohama Rubber Co Ltd:The | 空気入りタイヤ用ゴム組成物 |
| JP2011033518A (ja) | 2009-08-04 | 2011-02-17 | Toray Res Center:Kk | 表面増強ラマン分光分析方法 |
| US8659391B2 (en) * | 2009-08-18 | 2014-02-25 | Indian Institute Of Technology Madras | Multielement and multiproperty tagging |
| CN102483354B (zh) * | 2009-09-17 | 2015-12-16 | 惠普发展公司,有限责任合伙企业 | 用于表面增强拉曼光谱术的电驱动设备 |
| TWI523950B (zh) | 2009-09-30 | 2016-03-01 | 凸版印刷股份有限公司 | 核酸分析裝置 |
| JP2011075348A (ja) | 2009-09-30 | 2011-04-14 | Nidek Co Ltd | 試験片の製造方法 |
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| CN102103086B (zh) * | 2009-12-16 | 2012-12-26 | 中国科学院理化技术研究所 | 基于表面增强拉曼效应的单根硅纳米线实时检测单分子的方法 |
| JP5574783B2 (ja) | 2010-03-31 | 2014-08-20 | 富士フイルム株式会社 | 蛍光検出装置および方法 |
| KR20130062274A (ko) * | 2010-03-31 | 2013-06-12 | 가부시키가이샤 가네카 | 구조체, 국재형 표면 플라즈몬 공명 센서용 칩 및 국재형 표면 플라즈몬 공명 센서, 및 이들의 제조 방법 |
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| CN102169088B (zh) | 2010-12-31 | 2013-02-13 | 清华大学 | 单分子检测方法 |
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| EP2889606A4 (en) | 2012-08-10 | 2016-04-20 | Hamamatsu Photonics Kk | SURFACE-REINFORCED RAM APPLICATION UNIT AND USE METHOD THEREFOR |
| US10551322B2 (en) | 2012-08-10 | 2020-02-04 | Hamamatsu Photonics K.K. | Surface-enhanced Raman scattering unit including integrally formed handling board |
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-
2012
- 2012-08-10 JP JP2012178773A patent/JP5945192B2/ja not_active Expired - Fee Related
-
2013
- 2013-08-09 CN CN201810538346.5A patent/CN109001174B/zh not_active Expired - Fee Related
- 2013-08-09 CN CN201380040187.1A patent/CN104508464B/zh not_active Expired - Fee Related
- 2013-08-09 WO PCT/JP2013/071696 patent/WO2014025027A1/ja not_active Ceased
- 2013-08-09 US US14/420,556 patent/US9857306B2/en active Active
- 2013-08-09 EP EP13827159.8A patent/EP2889605B1/en not_active Not-in-force
Also Published As
| Publication number | Publication date |
|---|---|
| US9857306B2 (en) | 2018-01-02 |
| US20150233833A1 (en) | 2015-08-20 |
| EP2889605B1 (en) | 2022-02-09 |
| EP2889605A4 (en) | 2016-08-17 |
| WO2014025027A1 (ja) | 2014-02-13 |
| JP2014037974A (ja) | 2014-02-27 |
| CN104508464B (zh) | 2018-06-26 |
| CN104508464A (zh) | 2015-04-08 |
| JP5945192B2 (ja) | 2016-07-05 |
| CN109001174A (zh) | 2018-12-14 |
| EP2889605A1 (en) | 2015-07-01 |
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Legal Events
| Date | Code | Title | Description |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20220107 |