CN107946180B - 一种在碳化硅基片上快速生长氧化层的方法 - Google Patents
一种在碳化硅基片上快速生长氧化层的方法 Download PDFInfo
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- CN107946180B CN107946180B CN201711203679.4A CN201711203679A CN107946180B CN 107946180 B CN107946180 B CN 107946180B CN 201711203679 A CN201711203679 A CN 201711203679A CN 107946180 B CN107946180 B CN 107946180B
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- 229910010271 silicon carbide Inorganic materials 0.000 title claims abstract description 70
- 238000000034 method Methods 0.000 title claims abstract description 36
- 239000000758 substrate Substances 0.000 title claims abstract description 36
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 title abstract description 55
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 84
- 239000001301 oxygen Substances 0.000 claims abstract description 84
- -1 oxygen ions Chemical class 0.000 claims abstract description 75
- 230000003647 oxidation Effects 0.000 claims abstract description 52
- 238000007254 oxidation reaction Methods 0.000 claims abstract description 52
- 238000002347 injection Methods 0.000 claims abstract description 19
- 239000007924 injection Substances 0.000 claims abstract description 19
- 239000013078 crystal Substances 0.000 claims abstract description 14
- 150000002500 ions Chemical class 0.000 claims abstract description 10
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 28
- 238000002513 implantation Methods 0.000 claims description 15
- 239000007789 gas Substances 0.000 claims description 6
- 238000005468 ion implantation Methods 0.000 claims description 5
- 229910052757 nitrogen Inorganic materials 0.000 claims description 4
- 229910018540 Si C Inorganic materials 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- 229910052796 boron Inorganic materials 0.000 claims description 3
- 230000000694 effects Effects 0.000 claims description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Substances N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 3
- 125000004430 oxygen atom Chemical group O* 0.000 claims description 3
- 229910052698 phosphorus Inorganic materials 0.000 claims description 3
- 239000011574 phosphorus Substances 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- 239000000463 material Substances 0.000 description 12
- 230000006872 improvement Effects 0.000 description 9
- 230000008569 process Effects 0.000 description 7
- 239000000243 solution Substances 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 239000012535 impurity Substances 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000036632 reaction speed Effects 0.000 description 2
- 239000013589 supplement Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 230000002301 combined effect Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000007943 implant Substances 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 230000026683 transduction Effects 0.000 description 1
- 238000010361 transduction Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02164—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon oxide, e.g. SiO2
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
- H01L21/0223—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate
- H01L21/02233—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer
- H01L21/02236—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer group IV semiconductor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02299—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer pre-treatment
- H01L21/02312—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer pre-treatment treatment by exposure to a gas or vapour
- H01L21/02315—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer pre-treatment treatment by exposure to a gas or vapour treatment by exposure to a plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/0445—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising crystalline silicon carbide
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Plasma & Fusion (AREA)
- Crystallography & Structural Chemistry (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Formation Of Insulating Films (AREA)
- Physical Vapour Deposition (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Element Separation (AREA)
Abstract
Description
Claims (9)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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CN201711203679.4A CN107946180B (zh) | 2017-11-27 | 2017-11-27 | 一种在碳化硅基片上快速生长氧化层的方法 |
PCT/CN2018/115868 WO2019101008A1 (zh) | 2017-11-27 | 2018-11-16 | 一种在碳化硅基片上快速生长氧化层的方法 |
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CN201711203679.4A CN107946180B (zh) | 2017-11-27 | 2017-11-27 | 一种在碳化硅基片上快速生长氧化层的方法 |
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CN107946180A CN107946180A (zh) | 2018-04-20 |
CN107946180B true CN107946180B (zh) | 2020-05-29 |
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CN (1) | CN107946180B (zh) |
WO (1) | WO2019101008A1 (zh) |
Families Citing this family (5)
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CN107946180B (zh) * | 2017-11-27 | 2020-05-29 | 北京品捷电子科技有限公司 | 一种在碳化硅基片上快速生长氧化层的方法 |
CN108847384A (zh) * | 2018-06-11 | 2018-11-20 | 重庆伟特森电子科技有限公司 | 一种在碳化硅基片上生长氧化层的方法 |
CN111129155A (zh) * | 2019-12-25 | 2020-05-08 | 重庆伟特森电子科技有限公司 | 一种低栅漏电容碳化硅di-mosfet制备方法 |
CN113497140A (zh) * | 2020-03-20 | 2021-10-12 | 江苏中科汉韵半导体有限公司 | 碳化硅场效应晶体管及其制备方法、碳化硅功率器件 |
CN113130298A (zh) * | 2021-04-12 | 2021-07-16 | 中国科学院微电子研究所 | 一种半导体器件的制造方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102420130A (zh) * | 2011-07-01 | 2012-04-18 | 上海华力微电子有限公司 | 通过离子注入工艺来控制氧化膜厚度的方法 |
CN103472533A (zh) * | 2013-09-26 | 2013-12-25 | 山东建筑大学 | 一种离子注入制备掺铒碳化硅光波导的方法 |
CN105810722A (zh) * | 2016-03-16 | 2016-07-27 | 中国科学院半导体研究所 | 一种碳化硅mosfet器件及其制备方法 |
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JP2989051B2 (ja) * | 1991-09-24 | 1999-12-13 | ローム株式会社 | 炭化シリコンバイポーラ半導体装置およびその製造方法 |
JP2003282845A (ja) * | 2002-03-20 | 2003-10-03 | Mitsubishi Electric Corp | 炭化ケイ素基板の製造方法およびその製造方法により製造された炭化ケイ素基板、ならびに、ショットキーバリアダイオードおよび炭化ケイ素薄膜の製造方法 |
JP3808814B2 (ja) * | 2002-08-26 | 2006-08-16 | 株式会社ルネサステクノロジ | 半導体装置の製造方法 |
CN102347265B (zh) * | 2010-07-28 | 2014-07-02 | 中芯国际集成电路制造(上海)有限公司 | 防止存储器穿通电压降低的方法及存储器 |
CN107946180B (zh) * | 2017-11-27 | 2020-05-29 | 北京品捷电子科技有限公司 | 一种在碳化硅基片上快速生长氧化层的方法 |
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2017
- 2017-11-27 CN CN201711203679.4A patent/CN107946180B/zh active Active
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- 2018-11-16 WO PCT/CN2018/115868 patent/WO2019101008A1/zh active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102420130A (zh) * | 2011-07-01 | 2012-04-18 | 上海华力微电子有限公司 | 通过离子注入工艺来控制氧化膜厚度的方法 |
CN103472533A (zh) * | 2013-09-26 | 2013-12-25 | 山东建筑大学 | 一种离子注入制备掺铒碳化硅光波导的方法 |
CN105810722A (zh) * | 2016-03-16 | 2016-07-27 | 中国科学院半导体研究所 | 一种碳化硅mosfet器件及其制备方法 |
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WO2019101008A1 (zh) | 2019-05-31 |
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Effective date of registration: 20200602 Address after: 400700 No. 117-237, Yunhan Avenue, Beibei District, Chongqing Co-patentee after: BEIJING PINJIE ELECTRONIC TECHNOLOGY Co.,Ltd. Patentee after: CHONGQING WEITESEN ELECTRONIC TECHNOLOGY Co.,Ltd. Address before: 101302 Zhongguancun Technology Park, Shunyi District, Beijing, Shunyi garden, No. two road 1 Patentee before: BEIJING PINJIE ELECTRONIC TECHNOLOGY Co.,Ltd. |
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Effective date of registration: 20230103 Address after: 400700 No. 117-237, Yunhan Avenue, Beibei District, Chongqing Patentee after: CHONGQING WEITESEN ELECTRONIC TECHNOLOGY Co.,Ltd. Address before: 400700 No. 117-237, Yunhan Avenue, Beibei District, Chongqing Patentee before: CHONGQING WEITESEN ELECTRONIC TECHNOLOGY Co.,Ltd. Patentee before: BEIJING PINJIE ELECTRONIC TECHNOLOGY Co.,Ltd. |
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