CN107728434B - 液浸构件及曝光装置 - Google Patents

液浸构件及曝光装置 Download PDF

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Publication number
CN107728434B
CN107728434B CN201711011972.0A CN201711011972A CN107728434B CN 107728434 B CN107728434 B CN 107728434B CN 201711011972 A CN201711011972 A CN 201711011972A CN 107728434 B CN107728434 B CN 107728434B
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liquid immersion
substrate
liquid
optical
disposed
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Chinese (zh)
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CN107728434A (zh
Inventor
柴崎祐一
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Nikon Corp
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Nikon Corp
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70341Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Microscoopes, Condenser (AREA)
CN201711011972.0A 2012-04-10 2013-03-15 液浸构件及曝光装置 Active CN107728434B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261622235P 2012-04-10 2012-04-10
US61/622,235 2012-04-10
US13/793,667 2013-03-11
US13/793,667 US9323160B2 (en) 2012-04-10 2013-03-11 Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium
CN201380029835.3A CN104350425B (zh) 2012-04-10 2013-03-15 液浸构件及曝光装置

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CN201380029835.3A Division CN104350425B (zh) 2012-04-10 2013-03-15 液浸构件及曝光装置

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CN107728434A CN107728434A (zh) 2018-02-23
CN107728434B true CN107728434B (zh) 2020-04-03

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CN201711011972.0A Active CN107728434B (zh) 2012-04-10 2013-03-15 液浸构件及曝光装置
CN201380029835.3A Active CN104350425B (zh) 2012-04-10 2013-03-15 液浸构件及曝光装置

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CN201380029835.3A Active CN104350425B (zh) 2012-04-10 2013-03-15 液浸构件及曝光装置

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US (4) US9323160B2 (https=)
EP (1) EP2836875B1 (https=)
JP (3) JP6245179B2 (https=)
KR (1) KR102158968B1 (https=)
CN (2) CN107728434B (https=)
HK (2) HK1204682A1 (https=)
TW (3) TWI611270B (https=)
WO (1) WO2013153939A1 (https=)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL2009692A (en) 2011-12-07 2013-06-10 Asml Netherlands Bv A lithographic apparatus and a device manufacturing method.
US9323160B2 (en) 2012-04-10 2016-04-26 Nikon Corporation Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium
US9268231B2 (en) 2012-04-10 2016-02-23 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9823580B2 (en) 2012-07-20 2017-11-21 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9494870B2 (en) 2012-10-12 2016-11-15 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9568828B2 (en) 2012-10-12 2017-02-14 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9651873B2 (en) 2012-12-27 2017-05-16 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
US9720331B2 (en) 2012-12-27 2017-08-01 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
JP6369472B2 (ja) 2013-10-08 2018-08-08 株式会社ニコン 液浸部材、露光装置及び露光方法、並びにデバイス製造方法
KR102206979B1 (ko) 2016-09-12 2021-01-25 에이에스엠엘 네델란즈 비.브이. 리소그래피 장치를 위한 유체 처리 구조물
CN110268334B (zh) 2017-02-03 2024-10-29 Asml荷兰有限公司 曝光设备
CN109856922B (zh) * 2017-11-30 2020-11-13 上海微电子装备(集团)股份有限公司 浸没流体控制装置、浸没式光刻系统与回收控制方法
CN118584764A (zh) 2017-12-15 2024-09-03 Asml荷兰有限公司 流体处置结构、光刻设备、以及使用流体处置结构的方法
JP6575629B2 (ja) * 2018-04-04 2019-09-18 株式会社ニコン 露光装置及び露光方法、並びにデバイス製造方法
CN117742084A (zh) * 2020-12-25 2024-03-22 浙江启尔机电技术有限公司 一种改善浸没流场压力特性的浸液供给回收装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1612292A (zh) * 2003-10-31 2005-05-04 株式会社尼康 定盘、载物台装置及曝光装置以及曝光方法
EP1780786A1 (en) * 2004-06-07 2007-05-02 Nikon Corporation Stage apparatus, exposure apparatus, and exposure method
CN101171668A (zh) * 2005-03-31 2008-04-30 株式会社尼康 曝光装置、曝光方法及元件制造方法
WO2009119898A1 (en) * 2008-03-27 2009-10-01 Nikon Corporation Immersion system, exposure apparatus, exposing method and device fabricating method

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG102627A1 (en) 1996-11-28 2004-03-26 Nikon Corp Lithographic device
EP0900412B1 (en) 1997-03-10 2005-04-06 ASML Netherlands B.V. Lithographic apparatus comprising a positioning device having two object holders
US6897963B1 (en) 1997-12-18 2005-05-24 Nikon Corporation Stage device and exposure apparatus
US6208407B1 (en) 1997-12-22 2001-03-27 Asm Lithography B.V. Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement
WO2001035168A1 (en) 1999-11-10 2001-05-17 Massachusetts Institute Of Technology Interference lithography utilizing phase-locked scanning beams
US6452292B1 (en) 2000-06-26 2002-09-17 Nikon Corporation Planar motor with linear coil arrays
EP1364257A1 (en) 2001-02-27 2003-11-26 ASML US, Inc. Simultaneous imaging of two reticles
TW529172B (en) 2001-07-24 2003-04-21 Asml Netherlands Bv Imaging apparatus
JP2005536775A (ja) 2002-08-23 2005-12-02 株式会社ニコン 投影光学系、フォトリソグラフィ方法および露光装置、並びに露光装置を用いた方法
WO2004093159A2 (en) * 2003-04-09 2004-10-28 Nikon Corporation Immersion lithography fluid control system
KR101523180B1 (ko) 2003-09-03 2015-05-26 가부시키가이샤 니콘 액침 리소그래피용 유체를 제공하기 위한 장치 및 방법
US7589822B2 (en) 2004-02-02 2009-09-15 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
CN1954408B (zh) * 2004-06-04 2012-07-04 尼康股份有限公司 曝光装置、曝光方法及元件制造方法
SG186621A1 (en) 2004-06-09 2013-01-30 Nikon Corp Substrate holding device, exposure apparatus having same, exposure method, method for producing device, and liquid repellent plate
US7423720B2 (en) 2004-11-12 2008-09-09 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
WO2006080516A1 (ja) * 2005-01-31 2006-08-03 Nikon Corporation 露光装置及びデバイス製造方法
JP5005226B2 (ja) * 2005-01-31 2012-08-22 株式会社ニコン 露光装置及びデバイス製造方法、液体保持方法
TWI424260B (zh) 2005-03-18 2014-01-21 尼康股份有限公司 A board member, a substrate holding device, an exposure apparatus and an exposure method, and a device manufacturing method
JP2007005571A (ja) * 2005-06-24 2007-01-11 Nikon Corp 露光装置及びデバイス製造方法
US7864292B2 (en) 2005-11-16 2011-01-04 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7656501B2 (en) 2005-11-16 2010-02-02 Asml Netherlands B.V. Lithographic apparatus
US7804577B2 (en) * 2005-11-16 2010-09-28 Asml Netherlands B.V. Lithographic apparatus
KR101323565B1 (ko) 2006-01-19 2013-10-29 가부시키가이샤 니콘 이동체 구동 방법 및 이동체 구동 시스템, 패턴 형성 방법및 패턴 형성 장치, 노광 방법 및 노광 장치, 그리고디바이스 제조 방법
JP2007335662A (ja) * 2006-06-15 2007-12-27 Canon Inc 露光装置
US8004651B2 (en) 2007-01-23 2011-08-23 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
US8237911B2 (en) 2007-03-15 2012-08-07 Nikon Corporation Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine
US8068209B2 (en) 2007-03-23 2011-11-29 Nikon Corporation Nozzle to help reduce the escape of immersion liquid from an immersion lithography tool
US8134685B2 (en) 2007-03-23 2012-03-13 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
US8300207B2 (en) * 2007-05-17 2012-10-30 Nikon Corporation Exposure apparatus, immersion system, exposing method, and device fabricating method
JP2009088037A (ja) * 2007-09-28 2009-04-23 Nikon Corp 露光方法及びデバイス製造方法、並びに露光装置
US8451425B2 (en) * 2007-12-28 2013-05-28 Nikon Corporation Exposure apparatus, exposure method, cleaning apparatus, and device manufacturing method
US8610873B2 (en) 2008-03-17 2013-12-17 Nikon Corporation Immersion lithography apparatus and method having movable liquid diverter between immersion liquid confinement member and substrate
US8289497B2 (en) 2008-03-18 2012-10-16 Nikon Corporation Apparatus and methods for recovering fluid in immersion lithography
JP2011086804A (ja) * 2009-10-16 2011-04-28 Nikon Corp 液浸部材、露光装置、露光方法、及びデバイス製造方法
JP5232901B2 (ja) * 2011-07-22 2013-07-10 株式会社ニコン 露光装置及びデバイス製造方法
NL2009271A (en) 2011-09-15 2013-03-18 Asml Netherlands Bv A fluid handling structure, a lithographic apparatus and a device manufacturing method.
US9268231B2 (en) 2012-04-10 2016-02-23 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9323160B2 (en) * 2012-04-10 2016-04-26 Nikon Corporation Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium
US9823580B2 (en) 2012-07-20 2017-11-21 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9568828B2 (en) 2012-10-12 2017-02-14 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9494870B2 (en) 2012-10-12 2016-11-15 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9720331B2 (en) 2012-12-27 2017-08-01 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
US9651873B2 (en) 2012-12-27 2017-05-16 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1612292A (zh) * 2003-10-31 2005-05-04 株式会社尼康 定盘、载物台装置及曝光装置以及曝光方法
EP1780786A1 (en) * 2004-06-07 2007-05-02 Nikon Corporation Stage apparatus, exposure apparatus, and exposure method
CN101171668A (zh) * 2005-03-31 2008-04-30 株式会社尼康 曝光装置、曝光方法及元件制造方法
WO2009119898A1 (en) * 2008-03-27 2009-10-01 Nikon Corporation Immersion system, exposure apparatus, exposing method and device fabricating method

Also Published As

Publication number Publication date
TWI658335B (zh) 2019-05-01
HK1204090A1 (en) 2015-11-06
US20180039186A1 (en) 2018-02-08
EP2836875A1 (en) 2015-02-18
JP6245179B2 (ja) 2017-12-13
JP6569717B2 (ja) 2019-09-04
US10139736B2 (en) 2018-11-27
WO2013153939A1 (en) 2013-10-17
US9323160B2 (en) 2016-04-26
JP2019191613A (ja) 2019-10-31
HK1245901A1 (zh) 2018-08-31
HK1204682A1 (en) 2015-11-27
KR102158968B1 (ko) 2020-09-23
CN107728434A (zh) 2018-02-23
US10520828B2 (en) 2019-12-31
US20190056672A1 (en) 2019-02-21
TW201344376A (zh) 2013-11-01
US20160223915A1 (en) 2016-08-04
US9810999B2 (en) 2017-11-07
TW201928530A (zh) 2019-07-16
JP2015515738A (ja) 2015-05-28
CN104350425A (zh) 2015-02-11
EP2836875B1 (en) 2020-11-18
TWI698720B (zh) 2020-07-11
TW201804261A (zh) 2018-02-01
TWI611270B (zh) 2018-01-11
CN104350425B (zh) 2017-11-28
JP2018022198A (ja) 2018-02-08
KR20150005603A (ko) 2015-01-14
US20130265555A1 (en) 2013-10-10

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