CN107717719B - 研磨头、cmp研磨装置、和半导体集成电路装置的制造方法 - Google Patents
研磨头、cmp研磨装置、和半导体集成电路装置的制造方法 Download PDFInfo
- Publication number
- CN107717719B CN107717719B CN201710679978.9A CN201710679978A CN107717719B CN 107717719 B CN107717719 B CN 107717719B CN 201710679978 A CN201710679978 A CN 201710679978A CN 107717719 B CN107717719 B CN 107717719B
- Authority
- CN
- China
- Prior art keywords
- wafer
- spherical shape
- polishing
- grinding head
- airbag
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/04—Headstocks; Working-spindles; Features relating thereto
- B24B41/047—Grinding heads for working on plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/006—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the speed
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/10—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving electrical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
- H10P52/40—Chemomechanical polishing [CMP]
- H10P52/402—Chemomechanical polishing [CMP] of semiconductor materials
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016157371A JP6713377B2 (ja) | 2016-08-10 | 2016-08-10 | 研磨ヘッド、研磨ヘッドを有するcmp研磨装置およびそれを用いた半導体集積回路装置の製造方法 |
| JP2016-157371 | 2016-08-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107717719A CN107717719A (zh) | 2018-02-23 |
| CN107717719B true CN107717719B (zh) | 2021-03-12 |
Family
ID=61160010
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710679978.9A Expired - Fee Related CN107717719B (zh) | 2016-08-10 | 2017-08-10 | 研磨头、cmp研磨装置、和半导体集成电路装置的制造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10300577B2 (https=) |
| JP (1) | JP6713377B2 (https=) |
| KR (1) | KR102366241B1 (https=) |
| CN (1) | CN107717719B (https=) |
| TW (1) | TWI730154B (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7158223B2 (ja) * | 2018-09-20 | 2022-10-21 | 株式会社荏原製作所 | 研磨ヘッドおよび研磨装置 |
| CN111168561B (zh) * | 2019-12-26 | 2022-05-13 | 西安奕斯伟材料科技有限公司 | 研磨头及晶圆研磨装置 |
| KR102304948B1 (ko) * | 2020-01-13 | 2021-09-24 | (주)제이쓰리 | 반도체 웨이퍼 형상을 제어하는 웨이퍼 가공용 헤드 장치 |
| CN111993268A (zh) * | 2020-08-24 | 2020-11-27 | 台州市老林装饰有限公司 | 一种晶圆研磨头装置 |
| CN112677047A (zh) * | 2020-12-09 | 2021-04-20 | 杭州蒙托机械科技有限公司 | 一种避免摇晃且能够吹散灰尘的小型抛光头保护装置 |
| CN116117683A (zh) * | 2021-11-15 | 2023-05-16 | 成都高真科技有限公司 | 晶圆抓取机构、抛光装置及应用 |
| CN115673908B (zh) * | 2023-01-03 | 2023-03-10 | 北京特思迪半导体设备有限公司 | 一种半导体基材抛光设备中晶圆压头及其设计方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005268566A (ja) * | 2004-03-19 | 2005-09-29 | Ebara Corp | 化学機械研磨装置の基板把持機構のヘッド構造 |
| JP3770956B2 (ja) * | 1996-05-20 | 2006-04-26 | 松下電器産業株式会社 | 研磨装置及び研磨方法 |
| JP2007005463A (ja) * | 2005-06-22 | 2007-01-11 | Tokyo Seimitsu Co Ltd | 研磨装置及び研磨方法 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4909877A (en) * | 1987-01-31 | 1990-03-20 | Kabushiki Kaisha Cubic Engineering | Method for manufacturing sheet-formed buffer material using gelled material |
| US5643053A (en) * | 1993-12-27 | 1997-07-01 | Applied Materials, Inc. | Chemical mechanical polishing apparatus with improved polishing control |
| JP3183388B2 (ja) * | 1996-07-12 | 2001-07-09 | 株式会社東京精密 | 半導体ウェーハ研磨装置 |
| JPH10230455A (ja) * | 1997-02-17 | 1998-09-02 | Nec Corp | 研磨装置 |
| KR100475845B1 (ko) * | 1997-04-04 | 2005-06-17 | 도쿄 세이미츄 코퍼레이션 리미티드 | 연마장치 |
| EP0881039B1 (en) * | 1997-05-28 | 2003-04-16 | Tokyo Seimitsu Co.,Ltd. | Wafer polishing apparatus with retainer ring |
| WO1999048645A1 (en) * | 1998-03-23 | 1999-09-30 | Speedfam-Ipec Corporation | Backing pad for workpiece carrier |
| US6290584B1 (en) * | 1999-08-13 | 2001-09-18 | Speedfam-Ipec Corporation | Workpiece carrier with segmented and floating retaining elements |
| JP2001345297A (ja) * | 2000-05-30 | 2001-12-14 | Hitachi Ltd | 半導体集積回路装置の製造方法及び研磨装置 |
| KR20010007867A (ko) * | 2000-10-12 | 2001-02-05 | 김종옥 | 연삭 숫돌용 자동 밸런스 장치 |
| JP3922887B2 (ja) * | 2001-03-16 | 2007-05-30 | 株式会社荏原製作所 | ドレッサ及びポリッシング装置 |
| US6568991B2 (en) * | 2001-08-28 | 2003-05-27 | Speedfam-Ipec Corporation | Method and apparatus for sensing a wafer in a carrier |
| US6758726B2 (en) * | 2002-06-28 | 2004-07-06 | Lam Research Corporation | Partial-membrane carrier head |
| JP2004237373A (ja) * | 2003-02-04 | 2004-08-26 | Mitsubishi Electric Corp | Cmp研磨装置 |
| JP4718107B2 (ja) * | 2003-05-20 | 2011-07-06 | 株式会社荏原製作所 | 基板保持装置及び研磨装置 |
| JP4086722B2 (ja) * | 2003-06-24 | 2008-05-14 | 株式会社荏原製作所 | 基板保持装置及び研磨装置 |
| CN102172868B (zh) * | 2011-02-16 | 2012-11-14 | 厦门大学 | 气浮式大口径平面光学元件抛光夹具 |
| US8545289B2 (en) * | 2011-04-13 | 2013-10-01 | Nanya Technology Corporation | Distance monitoring device |
| WO2014034612A1 (ja) * | 2012-08-31 | 2014-03-06 | 新光電子株式会社 | 包囲体を備える台秤 |
| JP6338946B2 (ja) * | 2014-06-30 | 2018-06-06 | 東芝メモリ株式会社 | 研磨装置、及び研磨方法 |
-
2016
- 2016-08-10 JP JP2016157371A patent/JP6713377B2/ja not_active Expired - Fee Related
-
2017
- 2017-08-04 KR KR1020170099002A patent/KR102366241B1/ko not_active Expired - Fee Related
- 2017-08-07 US US15/670,504 patent/US10300577B2/en active Active
- 2017-08-09 TW TW106126866A patent/TWI730154B/zh not_active IP Right Cessation
- 2017-08-10 CN CN201710679978.9A patent/CN107717719B/zh not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3770956B2 (ja) * | 1996-05-20 | 2006-04-26 | 松下電器産業株式会社 | 研磨装置及び研磨方法 |
| JP2005268566A (ja) * | 2004-03-19 | 2005-09-29 | Ebara Corp | 化学機械研磨装置の基板把持機構のヘッド構造 |
| JP2007005463A (ja) * | 2005-06-22 | 2007-01-11 | Tokyo Seimitsu Co Ltd | 研磨装置及び研磨方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6713377B2 (ja) | 2020-06-24 |
| TW201805109A (zh) | 2018-02-16 |
| TWI730154B (zh) | 2021-06-11 |
| KR102366241B1 (ko) | 2022-02-22 |
| CN107717719A (zh) | 2018-02-23 |
| KR20180018356A (ko) | 2018-02-21 |
| US20180043496A1 (en) | 2018-02-15 |
| US10300577B2 (en) | 2019-05-28 |
| JP2018026453A (ja) | 2018-02-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: Chiba County, Japan Applicant after: ABLIC Inc. Address before: Chiba County, Japan Applicant before: DynaFine Semiconductor Co.,Ltd. |
|
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20210312 |