CN107528593B - 电容器电路、电路装置、物理量检测装置、电子设备和移动体 - Google Patents

电容器电路、电路装置、物理量检测装置、电子设备和移动体 Download PDF

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Publication number
CN107528593B
CN107528593B CN201710433512.0A CN201710433512A CN107528593B CN 107528593 B CN107528593 B CN 107528593B CN 201710433512 A CN201710433512 A CN 201710433512A CN 107528593 B CN107528593 B CN 107528593B
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China
Prior art keywords
circuit
switch
capacitor
array
control signal
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CN201710433512.0A
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English (en)
Chinese (zh)
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CN107528593A (zh
Inventor
田中敦嗣
羽田秀生
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Seiko Epson Corp
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Seiko Epson Corp
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00—Fixed capacitors; Processes of their manufacture
    • H01G4/40—Structural combinations of fixed capacitors with other electric elements, the structure mainly consisting of a capacitor, e.g. RC combinations
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00—Measuring or testing not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/54—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using means specified in two or more of groups G01D5/02, G01D5/12, G01D5/26, G01D5/42, and G01D5/48
    • G01D5/56—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using means specified in two or more of groups G01D5/02, G01D5/12, G01D5/26, G01D5/42, and G01D5/48 using electric or magnetic means
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/001—Analogue/digital/analogue conversion
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
    • H03M1/1061—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values using digitally programmable trimming circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00—Subject matter not provided for in other groups of this subclass
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/68—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/80—Simultaneous conversion using weighted impedances
    • H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
    • H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Nonlinear Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
  • Gyroscopes (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
CN201710433512.0A 2016-06-15 2017-06-09 电容器电路、电路装置、物理量检测装置、电子设备和移动体 Active CN107528593B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016-118443 2016-06-15
JP2016118443A JP6717071B2 (ja) 2016-06-15 2016-06-15 キャパシター回路、回路装置、物理量検出装置、電子機器及び移動体

Publications (2)

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CN107528593A CN107528593A (zh) 2017-12-29
CN107528593B true CN107528593B (zh) 2023-06-02

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US (2) US9892857B2 (enExample)
JP (1) JP6717071B2 (enExample)
CN (1) CN107528593B (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6500522B2 (ja) * 2015-03-16 2019-04-17 セイコーエプソン株式会社 回路装置、物理量検出装置、電子機器及び移動体
TWI656744B (zh) * 2017-05-19 2019-04-11 瑞昱半導體股份有限公司 積體電路電容布局
US10410934B2 (en) * 2017-12-07 2019-09-10 Micron Technology, Inc. Apparatuses having an interconnect extending from an upper conductive structure, through a hole in another conductive structure, and to an underlying structure
JP7077617B2 (ja) * 2017-12-28 2022-05-31 セイコーエプソン株式会社 回路装置、振動デバイス、電子機器及び移動体
US10840232B2 (en) 2018-06-27 2020-11-17 Silicon Laboratories Inc. Shielding in a unit capacitor array
JP7314553B2 (ja) * 2019-03-22 2023-07-26 セイコーエプソン株式会社 回路装置、発振器、電子機器及び移動体
US11012079B1 (en) * 2019-12-19 2021-05-18 Bae Systems Information And Electronic Systems Integration Inc. Continuous tuning of digitally switched voltage-controlled oscillator frequency bands
JP7226470B2 (ja) * 2021-04-26 2023-02-21 セイコーエプソン株式会社 電気光学装置および電子機器

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007142379A (ja) * 2005-10-21 2007-06-07 Matsushita Electric Ind Co Ltd アナログディジタル変換器
CN103713787A (zh) * 2012-10-04 2014-04-09 株式会社和冠 信号处理电路、信号处理方法、位置检测装置及电子设备

Family Cites Families (8)

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US6016019A (en) * 1998-05-28 2000-01-18 Microchip Technology Incorporated Capacitor array arrangement for improving capacitor array matching
US6452778B1 (en) * 2000-06-19 2002-09-17 Cygnal Integrated Products, Inc. Parasitic insensitive capacitor in d/a converter
JP4463528B2 (ja) 2003-10-29 2010-05-19 パナソニック株式会社 半導体集積回路装置およびデルタ・シグマａｄ変換装置
JP2004214692A (ja) * 2004-02-16 2004-07-29 Matsushita Electric Ind Co Ltd 半導体集積回路装置ならびにｄ／ａ変換装置およびａ／ｄ変換装置
FR2965942B1 (fr) * 2010-10-08 2013-02-22 Commissariat Energie Atomique Afficheur a cristal liquide de type transmissif en technologie cmos avec capacite de stockage auxiliaire
JP2014120615A (ja) * 2012-12-17 2014-06-30 Fujitsu Semiconductor Ltd 容量素子、容量アレイおよびａ／ｄ変換器
JP6287433B2 (ja) * 2014-03-25 2018-03-07 セイコーエプソン株式会社 逐次比較型アナログ−デジタル変換器、物理量検出センサー、電子機器及び移動体並びに逐次比較型アナログ−デジタル変換方法
JP6615565B2 (ja) * 2014-10-24 2019-12-04 株式会社半導体エネルギー研究所 半導体装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007142379A (ja) * 2005-10-21 2007-06-07 Matsushita Electric Ind Co Ltd アナログディジタル変換器
CN103713787A (zh) * 2012-10-04 2014-04-09 株式会社和冠 信号处理电路、信号处理方法、位置检测装置及电子设备

Also Published As

Publication number Publication date
JP2017224692A (ja) 2017-12-21
US20180130606A1 (en) 2018-05-10
US10008333B2 (en) 2018-06-26
US20170365414A1 (en) 2017-12-21
US9892857B2 (en) 2018-02-13
CN107528593A (zh) 2017-12-29
JP6717071B2 (ja) 2020-07-01

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