CN1072840C - 用于将半导体器件安装到基片上的方法 - Google Patents
用于将半导体器件安装到基片上的方法 Download PDFInfo
- Publication number
- CN1072840C CN1072840C CN96109653A CN96109653A CN1072840C CN 1072840 C CN1072840 C CN 1072840C CN 96109653 A CN96109653 A CN 96109653A CN 96109653 A CN96109653 A CN 96109653A CN 1072840 C CN1072840 C CN 1072840C
- Authority
- CN
- China
- Prior art keywords
- semiconductor device
- filler layer
- substrate
- solder ball
- bottom filler
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 40
- 239000000758 substrate Substances 0.000 title claims abstract description 8
- 229910000679 solder Inorganic materials 0.000 claims abstract description 23
- 238000000034 method Methods 0.000 claims abstract description 15
- 239000000945 filler Substances 0.000 claims description 21
- 238000010438 heat treatment Methods 0.000 claims description 4
- 239000000126 substance Substances 0.000 abstract 2
- 239000010410 layer Substances 0.000 description 15
- 229920006336 epoxy molding compound Polymers 0.000 description 3
- 238000005538 encapsulation Methods 0.000 description 2
- 239000011229 interlayer Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/563—Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/2901—Shape
- H01L2224/29011—Shape comprising apertures or cavities
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/731—Location prior to the connecting process
- H01L2224/73101—Location prior to the connecting process on the same surface
- H01L2224/73103—Bump and layer connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/8119—Arrangement of the bump connectors prior to mounting
- H01L2224/81191—Arrangement of the bump connectors prior to mounting wherein the bump connectors are disposed only on the semiconductor or solid-state body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/818—Bonding techniques
- H01L2224/81801—Soldering or alloying
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/831—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus
- H01L2224/83102—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus using surface energy, e.g. capillary forces
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83191—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on the semiconductor or solid-state body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/91—Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
- H01L2224/92—Specific sequence of method steps
- H01L2224/921—Connecting a surface with connectors of different types
- H01L2224/9212—Sequential connecting processes
- H01L2224/92122—Sequential connecting processes the first connecting process involving a bump connector
- H01L2224/92125—Sequential connecting processes the first connecting process involving a bump connector the second connecting process involving a layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01015—Phosphorus [P]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
Abstract
Description
Claims (3)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR31431/1995 | 1995-09-22 | ||
KR31431/95 | 1995-09-22 | ||
KR1019950031431A KR0157899B1 (ko) | 1995-09-22 | 1995-09-22 | 기판에 반도체 장치를 부착시키기 위한 연결구조 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1149764A CN1149764A (zh) | 1997-05-14 |
CN1072840C true CN1072840C (zh) | 2001-10-10 |
Family
ID=19427613
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN96109653A Expired - Lifetime CN1072840C (zh) | 1995-09-22 | 1996-09-11 | 用于将半导体器件安装到基片上的方法 |
Country Status (4)
Country | Link |
---|---|
US (2) | US5703406A (zh) |
JP (1) | JPH09172038A (zh) |
KR (1) | KR0157899B1 (zh) |
CN (1) | CN1072840C (zh) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6329711B1 (en) * | 1995-11-08 | 2001-12-11 | Fujitsu Limited | Semiconductor device and mounting structure |
US5891795A (en) * | 1996-03-18 | 1999-04-06 | Motorola, Inc. | High density interconnect substrate |
JPH1032221A (ja) * | 1996-07-12 | 1998-02-03 | Nec Corp | プリント配線基板 |
JP3578581B2 (ja) * | 1997-02-28 | 2004-10-20 | 富士通株式会社 | ベアチップの実装構造および実装方法およびそれに用いるインターポーザ |
US6610430B1 (en) | 1997-07-18 | 2003-08-26 | Plexus Services Corp. | Method of attaching a device to a circuit board |
US6114769A (en) * | 1997-07-18 | 2000-09-05 | Mcms, Inc. | Solder paste brick |
KR100246366B1 (ko) * | 1997-12-04 | 2000-03-15 | 김영환 | 에리어 어레이형 반도체 패키지 및 그 제조방법 |
US6140827A (en) | 1997-12-18 | 2000-10-31 | Micron Technology, Inc. | Method and apparatus for testing bumped die |
US6075710A (en) * | 1998-02-11 | 2000-06-13 | Express Packaging Systems, Inc. | Low-cost surface-mount compatible land-grid array (LGA) chip scale package (CSP) for packaging solder-bumped flip chips |
US5933713A (en) * | 1998-04-06 | 1999-08-03 | Micron Technology, Inc. | Method of forming overmolded chip scale package and resulting product |
JP3975569B2 (ja) * | 1998-09-01 | 2007-09-12 | ソニー株式会社 | 実装基板及びその製造方法 |
US6229210B1 (en) * | 1998-12-04 | 2001-05-08 | Mcms, Inc. | Device and method for attaching and soldering pre-formed solder spheres to the ball grid array (BGA) integrated circuit package attachment sites in high volume |
US6168972B1 (en) | 1998-12-22 | 2001-01-02 | Fujitsu Limited | Flip chip pre-assembly underfill process |
WO2000065647A1 (en) | 1999-04-22 | 2000-11-02 | International Rectifier Corporation | Chip scale package |
FR2793606B1 (fr) * | 1999-05-10 | 2003-06-13 | Bull Sa | Boitier pbga a grille de billage integree |
US6365977B1 (en) * | 1999-08-31 | 2002-04-02 | International Business Machines Corporation | Insulating interposer between two electronic components and process thereof |
JP4646284B2 (ja) | 2000-02-10 | 2011-03-09 | インターナショナル レクティフィアー コーポレイション | 単一表面上のバンプコンタクトを有する垂直伝導フリップチップ半導体デバイス |
TW517263B (en) * | 2000-03-29 | 2003-01-11 | Nitto Denko Corp | Semiconductor device and process for producing the same, and tablet comprising epoxy resin composition |
US6717245B1 (en) | 2000-06-02 | 2004-04-06 | Micron Technology, Inc. | Chip scale packages performed by wafer level processing |
KR100484891B1 (ko) * | 2002-09-18 | 2005-04-28 | 재단법인서울대학교산학협력재단 | 간단한 공정을 통한 플립 칩 탑재 방법 |
CN1720490B (zh) * | 2002-11-15 | 2010-12-08 | 应用材料有限公司 | 用于控制具有多变量输入参数的制造工艺的方法和系统 |
US7166491B2 (en) * | 2003-06-11 | 2007-01-23 | Fry's Metals, Inc. | Thermoplastic fluxing underfill composition and method |
US7247683B2 (en) * | 2004-08-05 | 2007-07-24 | Fry's Metals, Inc. | Low voiding no flow fluxing underfill for electronic devices |
KR100601483B1 (ko) * | 2004-12-06 | 2006-07-18 | 삼성전기주식회사 | 비아포스트에 의해 층간 전도성이 부여된 병렬적 다층인쇄회로기판 및 그 제조 방법 |
US7768075B2 (en) * | 2006-04-06 | 2010-08-03 | Fairchild Semiconductor Corporation | Semiconductor die packages using thin dies and metal substrates |
JP4182996B2 (ja) * | 2006-08-10 | 2008-11-19 | ソニー株式会社 | 電子装置及びその製造方法 |
US20080265428A1 (en) * | 2007-04-26 | 2008-10-30 | International Business Machines Corporation | Via and solder ball shapes to maximize chip or silicon carrier strength relative to thermal or bending load zero point |
WO2015154233A1 (en) * | 2014-04-09 | 2015-10-15 | GM Global Technology Operations LLC | Systems and methods for reinforced adhesive bonding |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5410805A (en) * | 1989-08-28 | 1995-05-02 | Lsi Logic Corporation | Method and apparatus for isolation of flux materials in "flip-chip" manufacturing |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0348435A (ja) * | 1989-07-17 | 1991-03-01 | Oki Electric Ind Co Ltd | フリップチップ素子の実装構造 |
JP2805245B2 (ja) * | 1989-08-28 | 1998-09-30 | エルエスアイ ロジック コーポレーション | フリップチップ構造 |
JPH04273464A (ja) * | 1991-02-28 | 1992-09-29 | Furukawa Electric Co Ltd:The | 半導体チップのマウント方法 |
JPH04345041A (ja) * | 1991-05-22 | 1992-12-01 | Nitto Denko Corp | 半導体素子の実装構造 |
JPH04345040A (ja) * | 1991-05-22 | 1992-12-01 | Nitto Denko Corp | 半導体素子実装用絶縁フィルムおよびこれを用いてなる搬送体ならびに半導体素子の実装構造 |
-
1995
- 1995-09-22 KR KR1019950031431A patent/KR0157899B1/ko not_active IP Right Cessation
-
1996
- 1996-01-12 JP JP8003453A patent/JPH09172038A/ja active Pending
- 1996-01-19 US US08/587,744 patent/US5703406A/en not_active Expired - Lifetime
- 1996-09-11 CN CN96109653A patent/CN1072840C/zh not_active Expired - Lifetime
-
1997
- 1997-05-08 US US08/854,069 patent/US5883438A/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5410805A (en) * | 1989-08-28 | 1995-05-02 | Lsi Logic Corporation | Method and apparatus for isolation of flux materials in "flip-chip" manufacturing |
Also Published As
Publication number | Publication date |
---|---|
US5703406A (en) | 1997-12-30 |
KR970018433A (ko) | 1997-04-30 |
US5883438A (en) | 1999-03-16 |
JPH09172038A (ja) | 1997-06-30 |
CN1149764A (zh) | 1997-05-14 |
KR0157899B1 (ko) | 1998-12-01 |
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Owner name: HYUNDAI MICROVIEW ELECTRONIC CO., LTD. Free format text: FORMER OWNER: LG SEMICON CO., LTD. Effective date: 20111125 Owner name: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. Free format text: FORMER OWNER: HYUNDAI MICROVIEW ELECTRONIC CO., LTD. Effective date: 20111125 |
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