CN106463379B - 具有细长切割边缘的化学机械平坦化垫调节器 - Google Patents
具有细长切割边缘的化学机械平坦化垫调节器 Download PDFInfo
- Publication number
- CN106463379B CN106463379B CN201580026005.4A CN201580026005A CN106463379B CN 106463379 B CN106463379 B CN 106463379B CN 201580026005 A CN201580026005 A CN 201580026005A CN 106463379 B CN106463379 B CN 106463379B
- Authority
- CN
- China
- Prior art keywords
- protrusions
- elongated
- substrate
- elongated protrusions
- cmp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D5/00—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting only by their periphery; Bushings or mountings therefor
- B24D5/06—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting only by their periphery; Bushings or mountings therefor with inserted abrasive blocks, e.g. segmental
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/12—Dressing tools; Holders therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D2203/00—Tool surfaces formed with a pattern
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201461968846P | 2014-03-21 | 2014-03-21 | |
| US61/968,846 | 2014-03-21 | ||
| PCT/US2015/021679 WO2015143278A1 (en) | 2014-03-21 | 2015-03-20 | Chemical mechanical planarization pad conditioner with elongated cutting edges |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106463379A CN106463379A (zh) | 2017-02-22 |
| CN106463379B true CN106463379B (zh) | 2019-08-06 |
Family
ID=54145367
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201580026005.4A Active CN106463379B (zh) | 2014-03-21 | 2015-03-20 | 具有细长切割边缘的化学机械平坦化垫调节器 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10293463B2 (cg-RX-API-DMAC7.html) |
| JP (1) | JP6542793B2 (cg-RX-API-DMAC7.html) |
| KR (1) | KR102304574B1 (cg-RX-API-DMAC7.html) |
| CN (1) | CN106463379B (cg-RX-API-DMAC7.html) |
| TW (1) | TWI666091B (cg-RX-API-DMAC7.html) |
| WO (1) | WO2015143278A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10105812B2 (en) * | 2014-07-17 | 2018-10-23 | Applied Materials, Inc. | Polishing pad configuration and polishing pad support |
| JP6316460B2 (ja) * | 2016-01-08 | 2018-04-25 | バンドー化学株式会社 | 研磨材 |
| KR102365066B1 (ko) * | 2016-04-06 | 2022-02-18 | 엠 큐브드 테크놀로지스 | 다이아몬드 복합 cmp 패드 조절기 |
| US10471567B2 (en) | 2016-09-15 | 2019-11-12 | Entegris, Inc. | CMP pad conditioning assembly |
| US20180085891A1 (en) * | 2016-09-29 | 2018-03-29 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Apparatus for shaping the surface of chemical mechanical polishing pads |
| TWI621503B (zh) * | 2017-05-12 | 2018-04-21 | Kinik Company Ltd. | 化學機械研磨拋光墊修整器及其製造方法 |
| US20190351527A1 (en) * | 2018-05-17 | 2019-11-21 | Entegris, Inc. | Conditioner for chemical-mechanical-planarization pad and related methods |
| US12208487B2 (en) | 2018-10-29 | 2025-01-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chemical mechanical polishing apparatus and method |
| US11331767B2 (en) * | 2019-02-01 | 2022-05-17 | Micron Technology, Inc. | Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods |
| CN113439010B (zh) | 2019-02-13 | 2024-08-27 | 3M创新有限公司 | 具有精确成形特征部的磨料元件、用其制成的磨料制品及其制造方法 |
| JP7368492B2 (ja) * | 2019-04-09 | 2023-10-24 | インテグリス・インコーポレーテッド | ディスクのセグメント設計 |
| US11524385B2 (en) * | 2019-06-07 | 2022-12-13 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | CMP polishing pad with lobed protruding structures |
| GB2590511B (en) * | 2019-11-20 | 2023-10-25 | Best Engineered Surface Tech Llc | Hybrid CMP conditioning head |
| US12370648B2 (en) * | 2020-01-30 | 2025-07-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | Surface clean system and method |
| US11833638B2 (en) * | 2020-03-25 | 2023-12-05 | Rohm and Haas Electronic Materials Holding, Inc. | CMP polishing pad with polishing elements on supports |
| WO2023055649A1 (en) * | 2021-09-29 | 2023-04-06 | Entegris, Inc. | Double-sided pad conditioner |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5527424A (en) * | 1995-01-30 | 1996-06-18 | Motorola, Inc. | Preconditioner for a polishing pad and method for using the same |
| US6302770B1 (en) * | 1998-07-28 | 2001-10-16 | Nikon Research Corporation Of America | In-situ pad conditioning for CMP polisher |
| JP2001157967A (ja) * | 1999-11-29 | 2001-06-12 | Mitsubishi Materials Corp | 単層砥石 |
| KR100387954B1 (ko) | 1999-10-12 | 2003-06-19 | (주) 휴네텍 | 연마패드용 컨디셔너와 이의 제조방법 |
| US6439986B1 (en) | 1999-10-12 | 2002-08-27 | Hunatech Co., Ltd. | Conditioner for polishing pad and method for manufacturing the same |
| US6390909B2 (en) * | 2000-04-03 | 2002-05-21 | Rodel Holdings, Inc. | Disk for conditioning polishing pads |
| JP2002337050A (ja) | 2001-03-13 | 2002-11-26 | Mitsubishi Materials Corp | Cmpコンディショナ |
| KR20050075280A (ko) | 2002-11-19 | 2005-07-20 | 가부시키가이샤 이시카와 세이사쿠쇼 | 화소제어 소자의 선택 전사 방법, 화소제어 소자의 선택전사 방법에 사용되는 화소제어 소자의 실장 장치,화소제어 소자 전사후의 배선 형성 방법, 및, 평면디스플레이 기판 |
| KR20050092743A (ko) * | 2003-01-15 | 2005-09-22 | 미츠비시 마테리알 가부시키가이샤 | 연질재 가공용 절삭 공구 |
| US7367872B2 (en) * | 2003-04-08 | 2008-05-06 | Applied Materials, Inc. | Conditioner disk for use in chemical mechanical polishing |
| CN1938128A (zh) | 2004-03-31 | 2007-03-28 | 三菱综合材料株式会社 | Cmp调节器 |
| US7799375B2 (en) | 2004-06-30 | 2010-09-21 | Poco Graphite, Inc. | Process for the manufacturing of dense silicon carbide |
| JP4145273B2 (ja) | 2004-07-14 | 2008-09-03 | 株式会社ノリタケスーパーアブレーシブ | Cmpパッドコンディショナー |
| US7066795B2 (en) * | 2004-10-12 | 2006-06-27 | Applied Materials, Inc. | Polishing pad conditioner with shaped abrasive patterns and channels |
| TWI406736B (zh) * | 2005-08-25 | 2013-09-01 | Hiroshi Ishizuka | 具有燒結體研磨部位之工具及其製造方法 |
| US7300338B2 (en) * | 2005-09-22 | 2007-11-27 | Abrasive Technology, Inc. | CMP diamond conditioning disk |
| TW200726582A (en) * | 2005-10-04 | 2007-07-16 | Mitsubishi Materials Corp | Rotary tool for processing flexible materials |
| JP4441552B2 (ja) | 2006-07-31 | 2010-03-31 | メゾテクダイヤ株式会社 | ダイヤモンドコンディショナ |
| US20080153398A1 (en) * | 2006-11-16 | 2008-06-26 | Chien-Min Sung | Cmp pad conditioners and associated methods |
| US20170232576A1 (en) * | 2006-11-16 | 2017-08-17 | Chien-Min Sung | Cmp pad conditioners with mosaic abrasive segments and associated methods |
| JP2008229820A (ja) * | 2007-03-23 | 2008-10-02 | Elpida Memory Inc | Cmp加工用のドレッサ及びcmp加工装置並びにcmp加工用の研磨パッドのドレッシング処理方法 |
| CN101903131B (zh) * | 2007-11-13 | 2013-01-02 | 宋健民 | Cmp垫修整器 |
| JP2009241200A (ja) | 2008-03-31 | 2009-10-22 | Mitsubishi Materials Corp | Cmpコンディショナ |
| EP2474025A2 (en) * | 2009-09-01 | 2012-07-11 | Saint-Gobain Abrasives, Inc. | Chemical mechanical polishing conditioner |
| KR101091030B1 (ko) * | 2010-04-08 | 2011-12-09 | 이화다이아몬드공업 주식회사 | 감소된 마찰력을 갖는 패드 컨디셔너 제조방법 |
| JP5871904B2 (ja) | 2010-04-12 | 2016-03-01 | イコニクス コーポレーションIkonics Corporation | アブレシブエッチングおよびカッティングのためのフォトレジスト膜および方法 |
| CN101972995B (zh) | 2010-06-08 | 2013-05-01 | 沈阳理工大学 | 一种仿生表面结构抛光垫及制造方法 |
| SG193340A1 (en) * | 2011-03-07 | 2013-10-30 | Entegris Inc | Chemical mechanical planarization pad conditioner |
| KR101211138B1 (ko) | 2011-03-07 | 2012-12-11 | 이화다이아몬드공업 주식회사 | 연약패드용 컨디셔너 및 그 제조방법 |
| KR101144981B1 (ko) | 2011-05-17 | 2012-05-11 | 삼성전자주식회사 | Cmp 패드 컨디셔너 및 상기 cmp 패드 컨디셔너 제조방법 |
| CN110328616A (zh) | 2012-05-04 | 2019-10-15 | 恩特格里斯公司 | 具有超硬磨料增强的化学机械平坦化修整器衬垫 |
| TWI564116B (zh) * | 2013-08-12 | 2017-01-01 | Sapphire polishing pad dresser with multiple trimmed pellets |
-
2015
- 2015-03-20 JP JP2016558346A patent/JP6542793B2/ja active Active
- 2015-03-20 WO PCT/US2015/021679 patent/WO2015143278A1/en not_active Ceased
- 2015-03-20 CN CN201580026005.4A patent/CN106463379B/zh active Active
- 2015-03-20 KR KR1020167029446A patent/KR102304574B1/ko active Active
- 2015-03-20 US US15/128,021 patent/US10293463B2/en active Active
- 2015-03-23 TW TW104109176A patent/TWI666091B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| TWI666091B (zh) | 2019-07-21 |
| CN106463379A (zh) | 2017-02-22 |
| JP6542793B2 (ja) | 2019-07-10 |
| US10293463B2 (en) | 2019-05-21 |
| KR20160136404A (ko) | 2016-11-29 |
| JP2017509500A (ja) | 2017-04-06 |
| US20170095903A1 (en) | 2017-04-06 |
| WO2015143278A1 (en) | 2015-09-24 |
| KR102304574B1 (ko) | 2021-09-27 |
| TW201600241A (zh) | 2016-01-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |