CN104321639A - 试样分析元件以及检测装置 - Google Patents

试样分析元件以及检测装置 Download PDF

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Publication number
CN104321639A
CN104321639A CN201380020394.0A CN201380020394A CN104321639A CN 104321639 A CN104321639 A CN 104321639A CN 201380020394 A CN201380020394 A CN 201380020394A CN 104321639 A CN104321639 A CN 104321639A
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CN
China
Prior art keywords
metal
light
sample analysis
analysis element
wavelength
Prior art date
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Pending
Application number
CN201380020394.0A
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English (en)
Chinese (zh)
Inventor
杉本守
尼子淳
西田秀明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
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Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of CN104321639A publication Critical patent/CN104321639A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/249921—Web or sheet containing structurally defined element or component

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Nanotechnology (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Composite Materials (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Materials Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201380020394.0A 2012-04-18 2013-04-12 试样分析元件以及检测装置 Pending CN104321639A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2012-094519 2012-04-18
JP2012094519A JP2013221883A (ja) 2012-04-18 2012-04-18 試料分析素子および検出装置
PCT/JP2013/002503 WO2013157233A1 (ja) 2012-04-18 2013-04-12 試料分析素子および検出装置

Publications (1)

Publication Number Publication Date
CN104321639A true CN104321639A (zh) 2015-01-28

Family

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Family Applications (1)

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CN201380020394.0A Pending CN104321639A (zh) 2012-04-18 2013-04-12 试样分析元件以及检测装置

Country Status (5)

Country Link
US (1) US9228944B2 (https=)
EP (1) EP2840383A4 (https=)
JP (1) JP2013221883A (https=)
CN (1) CN104321639A (https=)
WO (1) WO2013157233A1 (https=)

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JP2015055482A (ja) * 2013-09-10 2015-03-23 セイコーエプソン株式会社 分析装置、分析方法、これらに用いる光学素子及び電子機器
JP6365817B2 (ja) 2014-02-17 2018-08-01 セイコーエプソン株式会社 分析装置、及び電子機器
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JP6613736B2 (ja) * 2015-09-07 2019-12-04 セイコーエプソン株式会社 物質検出方法および物質検出装置
DE102017105113B4 (de) * 2017-03-10 2021-09-30 Leibniz-Institut für Photonische Technologien e.V. (Engl.Leibniz Institute of Photonic Technology) Anordnung und Verfahren für die Erfassung von Änderungen der optischen Weglänge in einem Nano-Kapillarkanal
US11959859B2 (en) * 2021-06-02 2024-04-16 Edwin Thomas Carlen Multi-gas detection system and method

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Also Published As

Publication number Publication date
WO2013157233A1 (ja) 2013-10-24
JP2013221883A (ja) 2013-10-28
US9228944B2 (en) 2016-01-05
EP2840383A1 (en) 2015-02-25
US20150103347A1 (en) 2015-04-16
EP2840383A4 (en) 2015-11-18

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Application publication date: 20150128