CN104272271B - 具有指令跟踪能力的处理器装置 - Google Patents

具有指令跟踪能力的处理器装置 Download PDF

Info

Publication number
CN104272271B
CN104272271B CN201380023766.5A CN201380023766A CN104272271B CN 104272271 B CN104272271 B CN 104272271B CN 201380023766 A CN201380023766 A CN 201380023766A CN 104272271 B CN104272271 B CN 104272271B
Authority
CN
China
Prior art keywords
tracking
processor device
trigger signal
event
bag
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201380023766.5A
Other languages
English (en)
Chinese (zh)
Other versions
CN104272271A (zh
Inventor
凯文·基尔策
贾斯廷·米尔克斯
孙达尔·巴拉苏布拉马尼亚安
托马斯·爱德华·佩尔门
库沙拉·贾瓦盖尔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Microchip Technology Inc
Original Assignee
Microchip Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microchip Technology Inc filed Critical Microchip Technology Inc
Publication of CN104272271A publication Critical patent/CN104272271A/zh
Application granted granted Critical
Publication of CN104272271B publication Critical patent/CN104272271B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3177Testing of logic operation, e.g. by logic analysers
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Prevention of errors by analysis, debugging or testing of software
    • G06F11/362Debugging of software
    • G06F11/3636Debugging of software by tracing the execution of the program
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Prevention of errors by analysis, debugging or testing of software
    • G06F11/362Debugging of software
    • G06F11/3648Debugging of software using additional hardware

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Debugging And Monitoring (AREA)
CN201380023766.5A 2012-05-07 2013-05-07 具有指令跟踪能力的处理器装置 Active CN104272271B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261643690P 2012-05-07 2012-05-07
US61/643,690 2012-05-07
US13/888,357 2013-05-06
US13/888,357 US9377507B2 (en) 2012-05-07 2013-05-06 Processor device with instruction trace capabilities
PCT/US2013/039944 WO2013169773A1 (en) 2012-05-07 2013-05-07 Processor device with instruction trace capabilities

Publications (2)

Publication Number Publication Date
CN104272271A CN104272271A (zh) 2015-01-07
CN104272271B true CN104272271B (zh) 2017-12-26

Family

ID=48570433

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380023766.5A Active CN104272271B (zh) 2012-05-07 2013-05-07 具有指令跟踪能力的处理器装置

Country Status (6)

Country Link
US (1) US9377507B2 (enExample)
EP (1) EP2847683B1 (enExample)
JP (1) JP6397815B2 (enExample)
KR (1) KR20150008428A (enExample)
CN (1) CN104272271B (enExample)
WO (1) WO2013169773A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103885845A (zh) * 2012-12-21 2014-06-25 祥硕科技股份有限公司 集成电路的除错系统及其除错方法
US10216616B2 (en) * 2016-07-02 2019-02-26 Intel Corporation Cooperative triggering
KR102851374B1 (ko) 2016-11-15 2025-08-26 삼성전자주식회사 트레이스 데이터를 생성하는 스토리지 장치 및 상기 스토리지 장치의 동작 방법
CN107609187A (zh) * 2017-10-09 2018-01-19 郑州云海信息技术有限公司 一种统计文件系统中异步操作的方法、系统及相关装置
US10754759B1 (en) * 2018-02-05 2020-08-25 Xilinx, Inc. Breakpointing circuitry that evaluates breakpoint conditions while running clock to target circuit
US11237946B2 (en) * 2018-05-03 2022-02-01 Sap Se Error finder tool
CN110515754B (zh) * 2018-05-22 2021-01-26 深圳云天励飞技术有限公司 神经网络处理器的调试系统及方法
US10963328B2 (en) * 2018-09-05 2021-03-30 Mikroelektronika D.O.O. WiFi programmer and debugger for microcontroller and method thereof
GB2605796B (en) * 2021-04-13 2023-06-28 Advanced Risc Mach Ltd Apparatus and method for generating debug information
US12182003B1 (en) 2021-08-31 2024-12-31 Apple Inc. Hardware support for software event collection

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0869434A2 (en) * 1997-03-31 1998-10-07 Hewlett-Packard Company Method for outputting trace information of a microprocessor

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07104800B2 (ja) * 1987-05-25 1995-11-13 日本電気株式会社 プログラム評価装置
JP3116706B2 (ja) * 1994-02-04 2000-12-11 横河電機株式会社 トリガ入力回路
JPH08179965A (ja) * 1994-12-26 1996-07-12 Mitsubishi Denki Semiconductor Software Kk イベント検出回路
JPH1124959A (ja) * 1997-07-02 1999-01-29 Hewlett Packard Japan Ltd マイクロプロセッサのトレース情報出力方法
US5978902A (en) * 1997-04-08 1999-11-02 Advanced Micro Devices, Inc. Debug interface including operating system access of a serial/parallel debug port
US6094729A (en) 1997-04-08 2000-07-25 Advanced Micro Devices, Inc. Debug interface including a compact trace record storage
JP2002202900A (ja) * 2000-12-28 2002-07-19 Seiko Epson Corp デバッグ装置
US7231339B1 (en) * 2002-03-28 2007-06-12 Cypress Semiconductor Corporation Event architecture and method for configuring same
US6948155B2 (en) 2002-11-22 2005-09-20 Texas Instruments Incorporated Little offset in multicycle event maintaining cycle accurate tracing of stop events
US7325169B2 (en) 2002-12-17 2008-01-29 Texas Instruments Incorporated Apparatus and method for trace stream identification of multiple target processor events
TW200401188A (en) * 2003-09-16 2004-01-16 Via Tech Inc Debug device and method thereof
US7219265B2 (en) * 2003-12-29 2007-05-15 Agere Systems Inc. System and method for debugging system-on-chips
US7627784B1 (en) * 2005-04-06 2009-12-01 Altera Corporation Modular processor debug core connection for programmable chip systems
CN1851668A (zh) * 2006-06-01 2006-10-25 北京天碁科技有限公司 片上系统芯片、片上系统芯片的跟踪调试系统及方法
US20080082801A1 (en) * 2006-09-29 2008-04-03 Mips Technologies, Inc. Apparatus and method for tracing instructions with simplified instruction state descriptors
JP2008191788A (ja) * 2007-02-01 2008-08-21 Ricoh Co Ltd 情報処理装置
WO2008099657A1 (ja) * 2007-02-14 2008-08-21 Nec Corporation 半導体集積回路、デバッグ・トレース回路、および半導体集積回路動作観測方法
CN101751327B (zh) * 2008-12-04 2012-04-18 北京中电华大电子设计有限责任公司 嵌入式处理器的跟踪调试方法
JP2011013867A (ja) * 2009-06-30 2011-01-20 Panasonic Corp データ処理装置、性能評価解析システム
US8566645B2 (en) * 2010-12-02 2013-10-22 Advanced Micro Devices, Inc. Debug state machine and processor including the same

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0869434A2 (en) * 1997-03-31 1998-10-07 Hewlett-Packard Company Method for outputting trace information of a microprocessor

Also Published As

Publication number Publication date
JP6397815B2 (ja) 2018-09-26
CN104272271A (zh) 2015-01-07
WO2013169773A1 (en) 2013-11-14
EP2847683B1 (en) 2019-07-03
JP2015516100A (ja) 2015-06-04
US20130318408A1 (en) 2013-11-28
KR20150008428A (ko) 2015-01-22
US9377507B2 (en) 2016-06-28
EP2847683A1 (en) 2015-03-18

Similar Documents

Publication Publication Date Title
CN104272271B (zh) 具有指令跟踪能力的处理器装置
CN104380266B (zh) 具有复位条件跟踪能力的处理器装置
CN100541442C (zh) 高性能串行总线测试方法
US7055117B2 (en) System and method for debugging system-on-chips using single or n-cycle stepping
CN104471545B (zh) 具有基于中断状态的可配置断点的装置
CN103440216B (zh) 一种通过i2c从设备调试mcu的芯片及方法
US10078113B1 (en) Methods and circuits for debugging data bus communications
CN102360329A (zh) 总线监控与调试控制装置及进行总线监控与总线调试的方法
KR100954568B1 (ko) 집적 회로 내에서의 진단 데이터 수집 장치 및 방법
US6760864B2 (en) Data processing system with on-chip FIFO for storing debug information and method therefor
CN101950280B (zh) 产生多个串行总线芯片选择的方法
US8832500B2 (en) Multiple clock domain tracing
CN104461796B (zh) 用于嵌入式8051cpu的jtag调试模块及调试方法
CN101782626B (zh) 一种jtag端口控制器
CN101799782A (zh) 一种基于可编程器件的冗余容错计算机数据表决电路
CN114528034B (zh) 加载电路、方法和系统
US8959398B2 (en) Multiple clock domain debug capability
CN201903876U (zh) 支持外部自动测试设备的电路板
JP2006171810A (ja) デバッグ制御システム及びその制御方法
US7924050B2 (en) Key based pin sharing selection

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant