KR20150008428A - 명령어 트레이스 기능을 갖춘 프로세서 디바이스 - Google Patents

명령어 트레이스 기능을 갖춘 프로세서 디바이스 Download PDF

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Publication number
KR20150008428A
KR20150008428A KR1020147033473A KR20147033473A KR20150008428A KR 20150008428 A KR20150008428 A KR 20150008428A KR 1020147033473 A KR1020147033473 A KR 1020147033473A KR 20147033473 A KR20147033473 A KR 20147033473A KR 20150008428 A KR20150008428 A KR 20150008428A
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KR
South Korea
Prior art keywords
trace
trigger signal
event
breakpoint
trigger
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1020147033473A
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English (en)
Korean (ko)
Inventor
케빈 킬저
저스틴 밀크스
선다르 발라수브라마니안
토마스 에드워드 페르메
쿠샤라 자바갤
Original Assignee
마이크로칩 테크놀로지 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 마이크로칩 테크놀로지 인코포레이티드 filed Critical 마이크로칩 테크놀로지 인코포레이티드
Publication of KR20150008428A publication Critical patent/KR20150008428A/ko
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Prevention of errors by analysis, debugging or testing of software
    • G06F11/362—Debugging of software
    • G06F11/3636—Debugging of software by tracing the execution of the program
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Prevention of errors by analysis, debugging or testing of software
    • G06F11/362—Debugging of software
    • G06F11/3648—Debugging of software using additional hardware

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Debugging And Monitoring (AREA)
KR1020147033473A 2012-05-07 2013-05-07 명령어 트레이스 기능을 갖춘 프로세서 디바이스 Ceased KR20150008428A (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261643690P 2012-05-07 2012-05-07
US61/643,690 2012-05-07
US13/888,357 2013-05-06
US13/888,357 US9377507B2 (en) 2012-05-07 2013-05-06 Processor device with instruction trace capabilities
PCT/US2013/039944 WO2013169773A1 (en) 2012-05-07 2013-05-07 Processor device with instruction trace capabilities

Publications (1)

Publication Number Publication Date
KR20150008428A true KR20150008428A (ko) 2015-01-22

Family

ID=48570433

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020147033473A Ceased KR20150008428A (ko) 2012-05-07 2013-05-07 명령어 트레이스 기능을 갖춘 프로세서 디바이스

Country Status (6)

Country Link
US (1) US9377507B2 (enExample)
EP (1) EP2847683B1 (enExample)
JP (1) JP6397815B2 (enExample)
KR (1) KR20150008428A (enExample)
CN (1) CN104272271B (enExample)
WO (1) WO2013169773A1 (enExample)

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* Cited by examiner, † Cited by third party
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CN103885845A (zh) * 2012-12-21 2014-06-25 祥硕科技股份有限公司 集成电路的除错系统及其除错方法
US10216616B2 (en) * 2016-07-02 2019-02-26 Intel Corporation Cooperative triggering
KR102851374B1 (ko) 2016-11-15 2025-08-26 삼성전자주식회사 트레이스 데이터를 생성하는 스토리지 장치 및 상기 스토리지 장치의 동작 방법
CN107609187A (zh) * 2017-10-09 2018-01-19 郑州云海信息技术有限公司 一种统计文件系统中异步操作的方法、系统及相关装置
US10754759B1 (en) * 2018-02-05 2020-08-25 Xilinx, Inc. Breakpointing circuitry that evaluates breakpoint conditions while running clock to target circuit
US11237946B2 (en) * 2018-05-03 2022-02-01 Sap Se Error finder tool
CN110515754B (zh) * 2018-05-22 2021-01-26 深圳云天励飞技术有限公司 神经网络处理器的调试系统及方法
US10963328B2 (en) * 2018-09-05 2021-03-30 Mikroelektronika D.O.O. WiFi programmer and debugger for microcontroller and method thereof
GB2605796B (en) * 2021-04-13 2023-06-28 Advanced Risc Mach Ltd Apparatus and method for generating debug information
US12182003B1 (en) 2021-08-31 2024-12-31 Apple Inc. Hardware support for software event collection

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JPH07104800B2 (ja) * 1987-05-25 1995-11-13 日本電気株式会社 プログラム評価装置
JP3116706B2 (ja) * 1994-02-04 2000-12-11 横河電機株式会社 トリガ入力回路
JPH08179965A (ja) * 1994-12-26 1996-07-12 Mitsubishi Denki Semiconductor Software Kk イベント検出回路
EP0869434A3 (en) * 1997-03-31 1999-09-15 Hewlett-Packard Company Method for outputting trace information of a microprocessor
JPH1124959A (ja) * 1997-07-02 1999-01-29 Hewlett Packard Japan Ltd マイクロプロセッサのトレース情報出力方法
US5978902A (en) * 1997-04-08 1999-11-02 Advanced Micro Devices, Inc. Debug interface including operating system access of a serial/parallel debug port
US6094729A (en) 1997-04-08 2000-07-25 Advanced Micro Devices, Inc. Debug interface including a compact trace record storage
JP2002202900A (ja) * 2000-12-28 2002-07-19 Seiko Epson Corp デバッグ装置
US7231339B1 (en) * 2002-03-28 2007-06-12 Cypress Semiconductor Corporation Event architecture and method for configuring same
US6948155B2 (en) 2002-11-22 2005-09-20 Texas Instruments Incorporated Little offset in multicycle event maintaining cycle accurate tracing of stop events
US7325169B2 (en) 2002-12-17 2008-01-29 Texas Instruments Incorporated Apparatus and method for trace stream identification of multiple target processor events
TW200401188A (en) * 2003-09-16 2004-01-16 Via Tech Inc Debug device and method thereof
US7219265B2 (en) * 2003-12-29 2007-05-15 Agere Systems Inc. System and method for debugging system-on-chips
US7627784B1 (en) * 2005-04-06 2009-12-01 Altera Corporation Modular processor debug core connection for programmable chip systems
CN1851668A (zh) * 2006-06-01 2006-10-25 北京天碁科技有限公司 片上系统芯片、片上系统芯片的跟踪调试系统及方法
US20080082801A1 (en) * 2006-09-29 2008-04-03 Mips Technologies, Inc. Apparatus and method for tracing instructions with simplified instruction state descriptors
JP2008191788A (ja) * 2007-02-01 2008-08-21 Ricoh Co Ltd 情報処理装置
WO2008099657A1 (ja) * 2007-02-14 2008-08-21 Nec Corporation 半導体集積回路、デバッグ・トレース回路、および半導体集積回路動作観測方法
CN101751327B (zh) * 2008-12-04 2012-04-18 北京中电华大电子设计有限责任公司 嵌入式处理器的跟踪调试方法
JP2011013867A (ja) * 2009-06-30 2011-01-20 Panasonic Corp データ処理装置、性能評価解析システム
US8566645B2 (en) * 2010-12-02 2013-10-22 Advanced Micro Devices, Inc. Debug state machine and processor including the same

Also Published As

Publication number Publication date
JP6397815B2 (ja) 2018-09-26
CN104272271A (zh) 2015-01-07
CN104272271B (zh) 2017-12-26
WO2013169773A1 (en) 2013-11-14
EP2847683B1 (en) 2019-07-03
JP2015516100A (ja) 2015-06-04
US20130318408A1 (en) 2013-11-28
US9377507B2 (en) 2016-06-28
EP2847683A1 (en) 2015-03-18

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