CN103748696B - 加工半导体结构的方法 - Google Patents
加工半导体结构的方法 Download PDFInfo
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- CN103748696B CN103748696B CN201280041603.5A CN201280041603A CN103748696B CN 103748696 B CN103748696 B CN 103748696B CN 201280041603 A CN201280041603 A CN 201280041603A CN 103748696 B CN103748696 B CN 103748696B
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- semiconductor structure
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- processing semiconductor
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
- H10H20/0137—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials the light-emitting regions comprising nitride materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/851—Wavelength conversion means
- H10H20/8515—Wavelength conversion means not being in contact with the bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/018—Bonding of wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/819—Bodies characterised by their shape, e.g. curved or truncated substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/822—Materials of the light-emitting regions
- H10H20/824—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
- H10H20/825—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/83—Electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/84—Coatings, e.g. passivation layers or antireflective coatings
- H10H20/841—Reflective coatings, e.g. dielectric Bragg reflectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/851—Wavelength conversion means
- H10H20/8511—Wavelength conversion means characterised by their material, e.g. binder
- H10H20/8512—Wavelength conversion materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/23—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/23—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
- H10P74/235—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes comprising optical enhancement of defects or not-directly-visible states
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/036—Manufacture or treatment of packages
- H10H20/0361—Manufacture or treatment of packages of wavelength conversion means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/851—Wavelength conversion means
- H10H20/8511—Wavelength conversion means characterised by their material, e.g. binder
Landscapes
- Led Devices (AREA)
- Led Device Packages (AREA)
- Optical Filters (AREA)
- Laser Beam Processing (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161527634P | 2011-08-26 | 2011-08-26 | |
| US61/527634 | 2011-08-26 | ||
| PCT/IB2012/054225 WO2013030718A1 (en) | 2011-08-26 | 2012-08-21 | Method of processing a semiconductor structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103748696A CN103748696A (zh) | 2014-04-23 |
| CN103748696B true CN103748696B (zh) | 2018-06-22 |
Family
ID=47148861
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280041603.5A Active CN103748696B (zh) | 2011-08-26 | 2012-08-21 | 加工半导体结构的方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10056531B2 (https=) |
| EP (1) | EP2748864B1 (https=) |
| JP (2) | JP6305337B2 (https=) |
| KR (2) | KR101965265B1 (https=) |
| CN (1) | CN103748696B (https=) |
| TW (2) | TWI583029B (https=) |
| WO (1) | WO2013030718A1 (https=) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2732478B1 (en) | 2011-07-15 | 2018-09-19 | Lumileds Holding B.V. | Method of bonding a semiconductor device to a support substrate |
| WO2013118072A2 (en) | 2012-02-10 | 2013-08-15 | Koninklijke Philips N.V. | Wavelength converted light emitting device |
| KR20170069240A (ko) * | 2014-10-01 | 2017-06-20 | 코닌클리케 필립스 엔.브이. | 조절가능한 방출 스펙트럼을 갖는 광원 |
| US10217914B2 (en) | 2015-05-27 | 2019-02-26 | Samsung Electronics Co., Ltd. | Semiconductor light emitting device |
| JP2017220479A (ja) * | 2016-06-03 | 2017-12-14 | 株式会社ディスコ | 発光ダイオードチップの製造方法 |
| JP2017224726A (ja) * | 2016-06-15 | 2017-12-21 | 株式会社ディスコ | 発光ダイオードチップの製造方法 |
| JP2017224728A (ja) * | 2016-06-15 | 2017-12-21 | 株式会社ディスコ | 発光ダイオードチップの製造方法 |
| JP2018014425A (ja) * | 2016-07-21 | 2018-01-25 | 株式会社ディスコ | 発光ダイオードチップの製造方法 |
| TWI759289B (zh) * | 2017-03-21 | 2022-04-01 | 晶元光電股份有限公司 | 發光元件 |
| US10559727B2 (en) * | 2017-07-25 | 2020-02-11 | Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. | Manufacturing method of colorful Micro-LED, display modlue and terminals |
| CN109461805B (zh) * | 2018-03-07 | 2021-08-10 | 普瑞光电股份有限公司 | 具有位于包含荧光体的玻璃转换板上的玻璃透镜的汽车led光源 |
| DE112018007310T5 (de) | 2018-03-21 | 2020-12-17 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronische vorrichtung, die eine leuchtstoffplatte aufweist und verfahren zur herstellung der optoelektronischen vorrichtung |
| CN110544641A (zh) * | 2018-05-28 | 2019-12-06 | 山东浪潮华光光电子股份有限公司 | 一种发光二极管芯片的测试方法 |
| JP2019212875A (ja) * | 2018-06-08 | 2019-12-12 | 信越半導体株式会社 | 発光素子及び発光素子の製造方法 |
| JP7108196B2 (ja) | 2019-12-26 | 2022-07-28 | 日亜化学工業株式会社 | 発光装置、波長変換部材の製造方法及び発光装置の製造方法 |
| KR20210123064A (ko) * | 2020-04-02 | 2021-10-13 | 웨이브로드 주식회사 | 3족 질화물 반도체 소자를 제조하는 방법 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0611131A1 (en) * | 1993-02-10 | 1994-08-17 | Sharp Kabushiki Kaisha | A method for producing a light-emitting diode having a transparent substrate |
| WO2005091390A1 (en) * | 2004-03-18 | 2005-09-29 | Showa Denko K.K. | Group iii nitride semiconductor light-emitting device and producing method thereof |
| DE102008039790A1 (de) * | 2008-08-26 | 2010-03-04 | Osram Opto Semiconductors Gmbh | Optoelektronisches Bauelement und Verfahren zu dessen Herstellung |
| WO2010110204A1 (ja) * | 2009-03-27 | 2010-09-30 | コニカミノルタオプト株式会社 | 蛍光体部材、蛍光体部材の製造方法、及び照明装置 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002344029A (ja) | 2001-05-17 | 2002-11-29 | Rohm Co Ltd | 発光ダイオードの色調調整方法 |
| TWI231054B (en) * | 2003-03-13 | 2005-04-11 | Showa Denko Kk | Light-emitting diode and its manufacturing method |
| WO2005050748A1 (ja) | 2003-11-19 | 2005-06-02 | Nichia Corporation | 半導体素子及びその製造方法 |
| JP4594708B2 (ja) * | 2003-12-05 | 2010-12-08 | 昭和電工株式会社 | 発光ダイオードおよびその製造方法、発光ダイオードランプ。 |
| JP2005259912A (ja) | 2004-03-10 | 2005-09-22 | Shin Etsu Handotai Co Ltd | 発光素子の製造方法 |
| JP4116587B2 (ja) * | 2004-04-13 | 2008-07-09 | 浜松ホトニクス株式会社 | 半導体発光素子及びその製造方法 |
| JP4857596B2 (ja) * | 2004-06-24 | 2012-01-18 | 豊田合成株式会社 | 発光素子の製造方法 |
| US7560294B2 (en) | 2004-06-07 | 2009-07-14 | Toyoda Gosei Co., Ltd. | Light emitting element and method of making same |
| US7553683B2 (en) | 2004-06-09 | 2009-06-30 | Philips Lumiled Lighting Co., Llc | Method of forming pre-fabricated wavelength converting elements for semiconductor light emitting devices |
| US20080070380A1 (en) * | 2004-06-11 | 2008-03-20 | Showda Denko K.K. | Production Method of Compound Semiconductor Device Wafer |
| JP4692059B2 (ja) * | 2005-04-25 | 2011-06-01 | パナソニック電工株式会社 | 発光装置の製造方法 |
| JP4895541B2 (ja) * | 2005-07-08 | 2012-03-14 | シャープ株式会社 | 波長変換部材、発光装置及び波長変換部材の製造方法 |
| US7456080B2 (en) * | 2005-12-19 | 2008-11-25 | Corning Incorporated | Semiconductor on glass insulator made using improved ion implantation process |
| JP2008135697A (ja) | 2006-10-23 | 2008-06-12 | Rohm Co Ltd | 半導体発光素子 |
| US7521862B2 (en) | 2006-11-20 | 2009-04-21 | Philips Lumileds Lighting Co., Llc | Light emitting device including luminescent ceramic and light-scattering material |
| JP2008159628A (ja) | 2006-12-20 | 2008-07-10 | Rohm Co Ltd | 半導体発光素子及び半導体発光素子の製造方法 |
| US7989236B2 (en) | 2007-12-27 | 2011-08-02 | Toyoda Gosei Co., Ltd. | Method of making phosphor containing glass plate, method of making light emitting device |
| US8877524B2 (en) * | 2008-03-31 | 2014-11-04 | Cree, Inc. | Emission tuning methods and devices fabricated utilizing methods |
| US8236582B2 (en) * | 2008-07-24 | 2012-08-07 | Philips Lumileds Lighting Company, Llc | Controlling edge emission in package-free LED die |
| US10147843B2 (en) | 2008-07-24 | 2018-12-04 | Lumileds Llc | Semiconductor light emitting device including a window layer and a light-directing structure |
| JP2010087292A (ja) * | 2008-09-30 | 2010-04-15 | Toyoda Gosei Co Ltd | 発光素子 |
| EP2384073B1 (en) | 2009-01-27 | 2018-02-28 | Mitsubishi Electric Corporation | Transmission apparatus, communication system, and communication method |
| US8581229B2 (en) | 2009-11-23 | 2013-11-12 | Koninklijke Philips N.V. | III-V light emitting device with thin n-type region |
-
2012
- 2012-08-21 US US14/238,477 patent/US10056531B2/en active Active
- 2012-08-21 KR KR1020147007513A patent/KR101965265B1/ko active Active
- 2012-08-21 EP EP12784063.5A patent/EP2748864B1/en active Active
- 2012-08-21 KR KR1020197008997A patent/KR102082499B1/ko active Active
- 2012-08-21 WO PCT/IB2012/054225 patent/WO2013030718A1/en not_active Ceased
- 2012-08-21 CN CN201280041603.5A patent/CN103748696B/zh active Active
- 2012-08-21 JP JP2014526585A patent/JP6305337B2/ja active Active
- 2012-08-24 TW TW101130877A patent/TWI583029B/zh active
- 2012-08-24 TW TW106103469A patent/TWI635628B/zh active
-
2016
- 2016-07-21 JP JP2016142915A patent/JP6294402B2/ja active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0611131A1 (en) * | 1993-02-10 | 1994-08-17 | Sharp Kabushiki Kaisha | A method for producing a light-emitting diode having a transparent substrate |
| WO2005091390A1 (en) * | 2004-03-18 | 2005-09-29 | Showa Denko K.K. | Group iii nitride semiconductor light-emitting device and producing method thereof |
| DE102008039790A1 (de) * | 2008-08-26 | 2010-03-04 | Osram Opto Semiconductors Gmbh | Optoelektronisches Bauelement und Verfahren zu dessen Herstellung |
| WO2010110204A1 (ja) * | 2009-03-27 | 2010-09-30 | コニカミノルタオプト株式会社 | 蛍光体部材、蛍光体部材の製造方法、及び照明装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2016213490A (ja) | 2016-12-15 |
| TWI635628B (zh) | 2018-09-11 |
| KR102082499B1 (ko) | 2020-02-27 |
| JP6305337B2 (ja) | 2018-04-04 |
| JP2014525674A (ja) | 2014-09-29 |
| TW201318229A (zh) | 2013-05-01 |
| JP6294402B2 (ja) | 2018-03-14 |
| KR20190038671A (ko) | 2019-04-08 |
| CN103748696A (zh) | 2014-04-23 |
| EP2748864B1 (en) | 2020-02-05 |
| US10056531B2 (en) | 2018-08-21 |
| WO2013030718A1 (en) | 2013-03-07 |
| KR101965265B1 (ko) | 2019-04-04 |
| TW201717436A (zh) | 2017-05-16 |
| EP2748864A1 (en) | 2014-07-02 |
| KR20140053361A (ko) | 2014-05-07 |
| TWI583029B (zh) | 2017-05-11 |
| US20140179029A1 (en) | 2014-06-26 |
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Legal Events
| Date | Code | Title | Description |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20180326 Address after: Holland Schiphol Applicant after: LUMILEDS HOLDING B.V. Address before: Holland Ian Deho Finn Applicant before: Koninkl Philips Electronics NV |
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| GR01 | Patent grant | ||
| GR01 | Patent grant |