CN103563190A - 陷阱减少的具有高铟低铝量子阱和高铝低铟势垒层的激光器 - Google Patents
陷阱减少的具有高铟低铝量子阱和高铝低铟势垒层的激光器 Download PDFInfo
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- CN103563190A CN103563190A CN201280023971.7A CN201280023971A CN103563190A CN 103563190 A CN103563190 A CN 103563190A CN 201280023971 A CN201280023971 A CN 201280023971A CN 103563190 A CN103563190 A CN 103563190A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3407—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers characterised by special barrier layers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34313—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer having only As as V-compound, e.g. AlGaAs, InGaAs
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34346—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser characterised by the materials of the barrier layers
- H01S5/3436—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser characterised by the materials of the barrier layers based on InGa(Al)P
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/0014—Measuring characteristics or properties thereof
- H01S5/0021—Degradation or life time measurements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18308—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] having a special structure for lateral current or light confinement
- H01S5/18311—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] having a special structure for lateral current or light confinement using selective oxidation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34346—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser characterised by the materials of the barrier layers
- H01S5/34366—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser characterised by the materials of the barrier layers based on InGa(Al)AS
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34346—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser characterised by the materials of the barrier layers
- H01S5/34373—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser characterised by the materials of the barrier layers based on InGa(Al)AsP
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- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161453851P | 2011-03-17 | 2011-03-17 | |
| US201161453635P | 2011-03-17 | 2011-03-17 | |
| US61/453,635 | 2011-03-17 | ||
| US61/453,851 | 2011-03-17 | ||
| PCT/US2012/029635 WO2012125997A2 (en) | 2011-03-17 | 2012-03-19 | Lasers with quantum wells having high indium and low aluminum with barrier layers having high aluminum and low indium with reduced traps |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103563190A true CN103563190A (zh) | 2014-02-05 |
Family
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Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280023971.7A Pending CN103563190A (zh) | 2011-03-17 | 2012-03-19 | 陷阱减少的具有高铟低铝量子阱和高铝低铟势垒层的激光器 |
| CN201280024005.7A Expired - Fee Related CN103548220B (zh) | 2011-03-17 | 2012-03-19 | 分解减少的具有铟INGaP势垒层和INGaAs(P)量子阱的激光器 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280024005.7A Expired - Fee Related CN103548220B (zh) | 2011-03-17 | 2012-03-19 | 分解减少的具有铟INGaP势垒层和INGaAs(P)量子阱的激光器 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US8837547B2 (https=) |
| EP (2) | EP2686924A4 (https=) |
| JP (3) | JP2014508425A (https=) |
| CN (2) | CN103563190A (https=) |
| WO (2) | WO2012125997A2 (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108028512A (zh) * | 2015-08-10 | 2018-05-11 | 慧与发展有限责任合伙企业 | 低阻抗vcsel |
| CN114069388A (zh) * | 2020-08-07 | 2022-02-18 | 山东华光光电子股份有限公司 | 一种基于GaAsP界面过渡层的小功率AlGaInP红光半导体激光器及其制备方法 |
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| CN103563190A (zh) | 2011-03-17 | 2014-02-05 | 菲尼萨公司 | 陷阱减少的具有高铟低铝量子阱和高铝低铟势垒层的激光器 |
| KR20120138080A (ko) * | 2011-06-14 | 2012-12-24 | 엘지이노텍 주식회사 | 발광 소자 |
| CA2879749C (en) * | 2012-07-27 | 2020-12-08 | Thorlabs,Inc. | Polarization stable widely tunable short cavity laser |
| KR102098295B1 (ko) * | 2013-07-29 | 2020-04-07 | 엘지이노텍 주식회사 | 발광소자 및 조명시스템 |
| CN103779786A (zh) * | 2013-12-12 | 2014-05-07 | 太原理工大学 | 一种具有插入层量子阱半导体激光器的外延结构 |
| KR102276422B1 (ko) * | 2014-07-18 | 2021-07-12 | 삼성전자주식회사 | 투과형 고흡수 광 변조기 및 그 제조방법 |
| CN104167474B (zh) * | 2014-08-11 | 2017-03-29 | 厦门乾照光电股份有限公司 | 一种高晶体质量红外发光二极管 |
| CN104167473B (zh) * | 2014-08-11 | 2017-03-29 | 厦门乾照光电股份有限公司 | 一种高晶体质量红外发光二极管的外延生长方法 |
| US9306115B1 (en) | 2015-02-10 | 2016-04-05 | Epistar Corporation | Light-emitting device |
| JP6579488B2 (ja) * | 2015-03-16 | 2019-09-25 | 株式会社リコー | 面発光レーザ、面発光レーザアレイ、レーザ装置、点火装置及び内燃機関 |
| CN106033866B (zh) | 2015-03-20 | 2019-12-03 | 云晖科技有限公司 | 垂直腔面发射激光器 |
| DE102015110610A1 (de) * | 2015-07-01 | 2017-01-05 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip |
| WO2018031582A1 (en) * | 2016-08-08 | 2018-02-15 | Finisar Corporation | Etched planarized vcsel |
| CN106410005B (zh) * | 2016-10-18 | 2018-09-04 | 华灿光电(浙江)有限公司 | 一种氮化镓基led外延片及其生长方法 |
| US10043941B1 (en) | 2017-01-31 | 2018-08-07 | International Business Machines Corporation | Light emitting diode having improved quantum efficiency at low injection current |
| JP7043802B2 (ja) * | 2017-11-16 | 2022-03-30 | 住友電気工業株式会社 | 垂直共振型面発光レーザ、垂直共振型面発光レーザを作製する方法 |
| US11942762B2 (en) | 2018-04-04 | 2024-03-26 | Suzhou Lekin Semiconductor Co., Ltd. | Surface-emitting laser device and light emitting device including the same |
| WO2019217798A1 (en) * | 2018-05-11 | 2019-11-14 | The Regents Of The University Of California | Epitaxial growth on a gallium arsenide phosphide capped material on a gallium arsenide substrate |
| JP2020017573A (ja) * | 2018-07-23 | 2020-01-30 | 住友電気工業株式会社 | 垂直共振型面発光レーザ |
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| US10804428B2 (en) | 2018-11-16 | 2020-10-13 | International Business Machines Corporation | High efficiency light emitting diode (LED) with low injection current |
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2012
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- 2012-03-19 EP EP12757449.9A patent/EP2686924A4/en not_active Withdrawn
- 2012-03-19 EP EP12757701.3A patent/EP2686925B1/en active Active
- 2012-03-19 JP JP2013558233A patent/JP2014508425A/ja active Pending
- 2012-03-19 WO PCT/US2012/029635 patent/WO2012125997A2/en not_active Ceased
- 2012-03-19 US US13/423,826 patent/US8837547B2/en active Active
- 2012-03-19 CN CN201280024005.7A patent/CN103548220B/zh not_active Expired - Fee Related
- 2012-03-19 WO PCT/US2012/029658 patent/WO2012126001A2/en not_active Ceased
- 2012-03-19 US US13/423,550 patent/US20120236891A1/en not_active Abandoned
- 2012-03-19 JP JP2013558236A patent/JP5802768B2/ja active Active
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- 2015-11-30 JP JP2015233009A patent/JP2016036050A/ja active Pending
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108028512A (zh) * | 2015-08-10 | 2018-05-11 | 慧与发展有限责任合伙企业 | 低阻抗vcsel |
| US10530129B2 (en) | 2015-08-10 | 2020-01-07 | Hewlett Packard Enterprise Development Lp | Low impedance VCSELs |
| US10978854B2 (en) | 2015-08-10 | 2021-04-13 | Hewlett Packard Enterprise Development Lp | Low impedance VCSELs |
| CN114069388A (zh) * | 2020-08-07 | 2022-02-18 | 山东华光光电子股份有限公司 | 一种基于GaAsP界面过渡层的小功率AlGaInP红光半导体激光器及其制备方法 |
| CN114069388B (zh) * | 2020-08-07 | 2024-02-06 | 山东华光光电子股份有限公司 | 一种基于GaAsP界面过渡层的小功率AlGaInP红光半导体激光器及其制备方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2686925A2 (en) | 2014-01-22 |
| JP5802768B2 (ja) | 2015-11-04 |
| EP2686925B1 (en) | 2018-08-22 |
| CN103548220A (zh) | 2014-01-29 |
| EP2686925A4 (en) | 2015-04-01 |
| JP2014508425A (ja) | 2014-04-03 |
| CN103548220B (zh) | 2015-12-09 |
| WO2012126001A3 (en) | 2012-12-27 |
| WO2012125997A3 (en) | 2013-01-03 |
| JP2016036050A (ja) | 2016-03-17 |
| EP2686924A2 (en) | 2014-01-22 |
| JP2014512092A (ja) | 2014-05-19 |
| US20120236891A1 (en) | 2012-09-20 |
| EP2686924A4 (en) | 2015-04-01 |
| US20120236892A1 (en) | 2012-09-20 |
| WO2012125997A2 (en) | 2012-09-20 |
| US8837547B2 (en) | 2014-09-16 |
| WO2012126001A2 (en) | 2012-09-20 |
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