CN103097879B - 透明基质的光学质量分析方法和装置 - Google Patents

透明基质的光学质量分析方法和装置 Download PDF

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Publication number
CN103097879B
CN103097879B CN201180017405.0A CN201180017405A CN103097879B CN 103097879 B CN103097879 B CN 103097879B CN 201180017405 A CN201180017405 A CN 201180017405A CN 103097879 B CN103097879 B CN 103097879B
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scale
substrate
image
support
camera
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CN103097879A (zh
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M.皮雄
F.达韦纳
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Saint Gobain Glass France SAS
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Saint Gobain Glass France SAS
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

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  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN201180017405.0A 2010-04-01 2011-03-28 透明基质的光学质量分析方法和装置 Active CN103097879B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1052477A FR2958404B1 (fr) 2010-04-01 2010-04-01 Procede et dispositif d'analyse de la qualite optique d'un substrat transparent
FR1052477 2010-04-01
PCT/FR2011/050675 WO2011121219A1 (fr) 2010-04-01 2011-03-28 Procede et dispositif d'analyse de la qualite optique d'un substrat transparent

Publications (2)

Publication Number Publication Date
CN103097879A CN103097879A (zh) 2013-05-08
CN103097879B true CN103097879B (zh) 2017-01-18

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ID=42666144

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CN201180017405.0A Active CN103097879B (zh) 2010-04-01 2011-03-28 透明基质的光学质量分析方法和装置

Country Status (13)

Country Link
US (1) US8736688B2 (enExample)
EP (1) EP2553439B1 (enExample)
JP (1) JP2013524192A (enExample)
KR (2) KR20180018829A (enExample)
CN (1) CN103097879B (enExample)
BR (1) BR112012023274B1 (enExample)
EA (1) EA026441B1 (enExample)
ES (1) ES2751989T3 (enExample)
FR (1) FR2958404B1 (enExample)
MX (1) MX2012010900A (enExample)
PL (1) PL2553439T3 (enExample)
PT (1) PT2553439T (enExample)
WO (1) WO2011121219A1 (enExample)

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DE102011109793B4 (de) * 2011-08-08 2014-12-04 Grenzbach Maschinenbau Gmbh Verfahren und Vorrichtung zur sicheren Detektion von Materialfehlern in transparenten Werkstoffen
FR2983583B1 (fr) 2011-12-02 2013-11-15 Saint Gobain Dispositif d'analyse des defauts d'aspect d'un substrat transparent
US9007454B2 (en) * 2012-10-31 2015-04-14 The Aerospace Corporation Optimized illumination for imaging
CN103454287A (zh) * 2013-09-05 2013-12-18 深圳市维图视技术有限公司 一种玻璃管缺陷视觉检测方法及其装置
CN103472072A (zh) * 2013-09-09 2013-12-25 深圳市维图视技术有限公司 一种新的玻璃管缺陷视觉检测方法及其装置
WO2015077113A1 (en) * 2013-11-25 2015-05-28 Corning Incorporated Methods for determining a shape of a substantially cylindrical specular reflective surface
JP6353913B2 (ja) * 2014-04-24 2018-07-04 エーエスエムエル ホールディング エヌ．ブイ． コンパクトな両側レチクル検査システム
US10378996B2 (en) * 2014-08-08 2019-08-13 Heraeus Quartz North America Llc Methods and apparatus for determining geometric properties of optical fiber preforms
US20160178535A1 (en) * 2014-12-17 2016-06-23 Xerox Corporation Inspection Device And Method
US10845746B2 (en) * 2017-01-20 2020-11-24 Hp Indigo B.V. Identifying linear defects
IT201700075428A1 (it) * 2017-07-05 2019-01-05 Antares Vision S R L Dispositivo di ispezione di contenitori particolarmente per il rilevamento di difetti lineari
KR102358582B1 (ko) * 2017-08-23 2022-02-04 삼성전자 주식회사 휴대 단말의 커버 글래스의 광학적 특성을 확인하는 검사 장치 및 커버 글래의 광학적 특성의 확인 방법
FR3085205B1 (fr) * 2018-08-22 2020-07-24 Livbag Sas Dispositif et methode de controle de verre de protection de soudeuse laser
EP3640630A1 (en) * 2018-10-18 2020-04-22 Infineon Technologies AG Embedded wafer inspection
WO2020187994A1 (en) * 2019-03-19 2020-09-24 Central Glass Co., Ltd. Optical pattern for information acquisition system
CN111107257A (zh) * 2020-01-20 2020-05-05 成都德图福思科技有限公司 针对透明介质表面刻蚀或浮雕图案进行高对比度成像的方法
EP3875893A1 (en) * 2020-03-02 2021-09-08 Trifid Automation, s.r.o. Method and device for contactless measurement of geometric objects
FR3151094B1 (fr) * 2023-07-10 2025-07-18 Sas Woodoo Procede d’evaluation de la clarte d’un materiau, notamment non-homogene

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US20060158664A1 (en) * 2003-02-06 2006-07-20 Koh Young Technology Inc Three-dimensional image measuring apparatus
CN101049022A (zh) * 2004-10-28 2007-10-03 康宁股份有限公司 用于识别玻璃板表面缺陷和体缺陷的检查系统和方法
CN101287960A (zh) * 2004-10-13 2008-10-15 阿克罗米特里克斯有限责任公司 测量连续移动样品的样品表面平整度的系统与方法
CN101592621A (zh) * 2009-05-18 2009-12-02 济南佳美视觉技术有限公司 一种使用折射栅格光源检验玻璃瓶表面缺陷及内部缺陷的自动光学检验设备

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JPS61176839A (ja) * 1985-01-31 1986-08-08 Kanebo Ltd 透明または半透明の板状体の欠点検査装置
US5175601A (en) * 1991-10-15 1992-12-29 Electro-Optical Information Systems High-speed 3-D surface measurement surface inspection and reverse-CAD system
JP2795595B2 (ja) * 1992-06-26 1998-09-10 セントラル硝子株式会社 透明板状体の欠点検出方法
JPH10111252A (ja) * 1996-10-02 1998-04-28 Asahi Glass Co Ltd ガラス板の欠点検出装置
US6509967B1 (en) 1996-10-18 2003-01-21 Innomess Gelsellschaft Fur Messtechnik Mbh Method for detecting optical errors in large surface panels
US6208412B1 (en) 1999-06-14 2001-03-27 Visteon Global Technologies, Inc. Method and apparatus for determining optical quality
JP4633245B2 (ja) * 2000-11-06 2011-02-16 住友化学株式会社 表面検査装置及び表面検査方法
DE10301941B4 (de) * 2003-01-20 2005-11-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Kamera und Verfahren zur optischen Aufnahme eines Schirms
FR2898969B1 (fr) * 2006-03-24 2008-10-24 Peugeot Citroen Automobiles Sa Procede et installation de controle de la qualite de pieces
EP2325625A1 (en) * 2008-08-07 2011-05-25 Kde Corporation Inspection system
NL2003263A (en) * 2008-08-20 2010-03-10 Asml Holding Nv Particle detection on an object surface.
FR2936605B1 (fr) 2008-10-01 2014-10-31 Saint Gobain Dispositif d'analyse de la surface d'un substrat

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060158664A1 (en) * 2003-02-06 2006-07-20 Koh Young Technology Inc Three-dimensional image measuring apparatus
CN101287960A (zh) * 2004-10-13 2008-10-15 阿克罗米特里克斯有限责任公司 测量连续移动样品的样品表面平整度的系统与方法
CN101049022A (zh) * 2004-10-28 2007-10-03 康宁股份有限公司 用于识别玻璃板表面缺陷和体缺陷的检查系统和方法
CN101592621A (zh) * 2009-05-18 2009-12-02 济南佳美视觉技术有限公司 一种使用折射栅格光源检验玻璃瓶表面缺陷及内部缺陷的自动光学检验设备

Also Published As

Publication number Publication date
EA201290998A1 (ru) 2013-03-29
ES2751989T3 (es) 2020-04-02
FR2958404B1 (fr) 2012-04-27
BR112012023274B1 (pt) 2020-05-26
FR2958404A1 (fr) 2011-10-07
PL2553439T3 (pl) 2020-02-28
KR20180018829A (ko) 2018-02-21
US8736688B2 (en) 2014-05-27
KR20130014528A (ko) 2013-02-07
PT2553439T (pt) 2019-11-22
BR112012023274A2 (pt) 2016-05-17
WO2011121219A1 (fr) 2011-10-06
EP2553439B1 (fr) 2019-08-14
CN103097879A (zh) 2013-05-08
EA026441B1 (ru) 2017-04-28
EP2553439A1 (fr) 2013-02-06
JP2013524192A (ja) 2013-06-17
MX2012010900A (es) 2012-11-06
US20130010175A1 (en) 2013-01-10

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