EA201290998A1 - Способ и устройство анализа оптического качества прозрачной подложки - Google Patents

Способ и устройство анализа оптического качества прозрачной подложки

Info

Publication number
EA201290998A1
EA201290998A1 EA201290998A EA201290998A EA201290998A1 EA 201290998 A1 EA201290998 A1 EA 201290998A1 EA 201290998 A EA201290998 A EA 201290998A EA 201290998 A EA201290998 A EA 201290998A EA 201290998 A1 EA201290998 A1 EA 201290998A1
Authority
EA
Eurasian Patent Office
Prior art keywords
analysis
world
carrier
transparent substrate
optical quality
Prior art date
Application number
EA201290998A
Other languages
English (en)
Other versions
EA026441B1 (ru
Inventor
Мишель Пишон
Франк Давенн
Original Assignee
Сэн-Гобэн Гласс Франс
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Сэн-Гобэн Гласс Франс filed Critical Сэн-Гобэн Гласс Франс
Publication of EA201290998A1 publication Critical patent/EA201290998A1/ru
Publication of EA026441B1 publication Critical patent/EA026441B1/ru

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Это устройство (1) анализа прозрачной поверхности подложки (2) содержит миру (10), располагаемую напротив поверхности измеряемой подложки. Мира сформирована на носителе (11) с малой и большой протяженностью. Предусмотрена камера (3) для получения по меньшей мере одного изображения миры, деформированного измеряемой подложкой. С камерой (3) связаны система (4) освещения миры и средства (5) цифровой обработки изображения и анализа. Носитель (11) имеет вытянутую форму, мира является однонаправленной и представляет собой рисунок (10), расположенный вдоль наименьшей протяженности носителя. Рисунок (10) является периодическим поперечно к малой протяженности, и камера является линейной.
EA201290998A 2010-04-01 2011-03-28 Способ и устройство анализа оптического качества прозрачной подложки EA026441B1 (ru)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1052477A FR2958404B1 (fr) 2010-04-01 2010-04-01 Procede et dispositif d'analyse de la qualite optique d'un substrat transparent
PCT/FR2011/050675 WO2011121219A1 (fr) 2010-04-01 2011-03-28 Procede et dispositif d'analyse de la qualite optique d'un substrat transparent

Publications (2)

Publication Number Publication Date
EA201290998A1 true EA201290998A1 (ru) 2013-03-29
EA026441B1 EA026441B1 (ru) 2017-04-28

Family

ID=42666144

Family Applications (1)

Application Number Title Priority Date Filing Date
EA201290998A EA026441B1 (ru) 2010-04-01 2011-03-28 Способ и устройство анализа оптического качества прозрачной подложки

Country Status (13)

Country Link
US (1) US8736688B2 (ru)
EP (1) EP2553439B1 (ru)
JP (1) JP2013524192A (ru)
KR (2) KR20180018829A (ru)
CN (1) CN103097879B (ru)
BR (1) BR112012023274B1 (ru)
EA (1) EA026441B1 (ru)
ES (1) ES2751989T3 (ru)
FR (1) FR2958404B1 (ru)
MX (1) MX2012010900A (ru)
PL (1) PL2553439T3 (ru)
PT (1) PT2553439T (ru)
WO (1) WO2011121219A1 (ru)

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DE102011109793B4 (de) * 2011-08-08 2014-12-04 Grenzbach Maschinenbau Gmbh Verfahren und Vorrichtung zur sicheren Detektion von Materialfehlern in transparenten Werkstoffen
FR2983583B1 (fr) 2011-12-02 2013-11-15 Saint Gobain Dispositif d'analyse des defauts d'aspect d'un substrat transparent
US9007454B2 (en) * 2012-10-31 2015-04-14 The Aerospace Corporation Optimized illumination for imaging
CN103454287A (zh) * 2013-09-05 2013-12-18 深圳市维图视技术有限公司 一种玻璃管缺陷视觉检测方法及其装置
CN103472072A (zh) * 2013-09-09 2013-12-25 深圳市维图视技术有限公司 一种新的玻璃管缺陷视觉检测方法及其装置
CN105764860B (zh) 2013-11-25 2019-01-11 康宁股份有限公司 用于确定基本上圆柱形镜面反射表面的形状的方法
JP6353913B2 (ja) * 2014-04-24 2018-07-04 エーエスエムエル ホールディング エヌ．ブイ． コンパクトな両側レチクル検査システム
KR102128214B1 (ko) * 2014-08-08 2020-06-30 헤래우스 쿼츠 노쓰 아메리카 엘엘씨 광섬유 모재의 기하학적 속성을 결정하기 위한 방법 및 장치
US20160178535A1 (en) * 2014-12-17 2016-06-23 Xerox Corporation Inspection Device And Method
WO2018133945A1 (en) * 2017-01-20 2018-07-26 Hp Indigo B.V. Identifying linear defects
IT201700075428A1 (it) * 2017-07-05 2019-01-05 Antares Vision S R L Dispositivo di ispezione di contenitori particolarmente per il rilevamento di difetti lineari
KR102358582B1 (ko) * 2017-08-23 2022-02-04 삼성전자 주식회사 휴대 단말의 커버 글래스의 광학적 특성을 확인하는 검사 장치 및 커버 글래의 광학적 특성의 확인 방법
FR3085205B1 (fr) * 2018-08-22 2020-07-24 Livbag Sas Dispositif et methode de controle de verre de protection de soudeuse laser
EP3640630A1 (en) * 2018-10-18 2020-04-22 Infineon Technologies AG Embedded wafer inspection
WO2020187994A1 (en) * 2019-03-19 2020-09-24 Central Glass Co., Ltd. Optical pattern for information acquisition system
CN111107257A (zh) * 2020-01-20 2020-05-05 成都德图福思科技有限公司 针对透明介质表面刻蚀或浮雕图案进行高对比度成像的方法
EP3875893A1 (en) * 2020-03-02 2021-09-08 Trifid Automation, s.r.o. Method and device for contactless measurement of geometric objects

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US5175601A (en) * 1991-10-15 1992-12-29 Electro-Optical Information Systems High-speed 3-D surface measurement surface inspection and reverse-CAD system
JP2795595B2 (ja) * 1992-06-26 1998-09-10 セントラル硝子株式会社 透明板状体の欠点検出方法
JPH10111252A (ja) * 1996-10-02 1998-04-28 Asahi Glass Co Ltd ガラス板の欠点検出装置
US6509967B1 (en) 1996-10-18 2003-01-21 Innomess Gelsellschaft Fur Messtechnik Mbh Method for detecting optical errors in large surface panels
US6208412B1 (en) 1999-06-14 2001-03-27 Visteon Global Technologies, Inc. Method and apparatus for determining optical quality
JP4633245B2 (ja) * 2000-11-06 2011-02-16 住友化学株式会社 表面検査装置及び表面検査方法
DE10301941B4 (de) * 2003-01-20 2005-11-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Kamera und Verfahren zur optischen Aufnahme eines Schirms
KR100615576B1 (ko) * 2003-02-06 2006-08-25 주식회사 고영테크놀러지 3차원형상 측정장치
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Also Published As

Publication number Publication date
BR112012023274B1 (pt) 2020-05-26
FR2958404A1 (fr) 2011-10-07
PL2553439T3 (pl) 2020-02-28
FR2958404B1 (fr) 2012-04-27
WO2011121219A1 (fr) 2011-10-06
EP2553439B1 (fr) 2019-08-14
KR20180018829A (ko) 2018-02-21
EP2553439A1 (fr) 2013-02-06
PT2553439T (pt) 2019-11-22
BR112012023274A2 (pt) 2016-05-17
JP2013524192A (ja) 2013-06-17
ES2751989T3 (es) 2020-04-02
CN103097879B (zh) 2017-01-18
MX2012010900A (es) 2012-11-06
CN103097879A (zh) 2013-05-08
US20130010175A1 (en) 2013-01-10
KR20130014528A (ko) 2013-02-07
US8736688B2 (en) 2014-05-27
EA026441B1 (ru) 2017-04-28

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