PL2553439T3 - Sposób i urządzenie do analizy właściwości optycznych przezroczystego substratu - Google Patents

Sposób i urządzenie do analizy właściwości optycznych przezroczystego substratu

Info

Publication number
PL2553439T3
PL2553439T3 PL11717302T PL11717302T PL2553439T3 PL 2553439 T3 PL2553439 T3 PL 2553439T3 PL 11717302 T PL11717302 T PL 11717302T PL 11717302 T PL11717302 T PL 11717302T PL 2553439 T3 PL2553439 T3 PL 2553439T3
Authority
PL
Poland
Prior art keywords
analysis
transparent substrate
optical quality
optical
quality
Prior art date
Application number
PL11717302T
Other languages
English (en)
Inventor
Michel Pichon
Franc Davenne
Original Assignee
Saint-Gobain Glass France
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saint-Gobain Glass France filed Critical Saint-Gobain Glass France
Publication of PL2553439T3 publication Critical patent/PL2553439T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
PL11717302T 2010-04-01 2011-03-28 Sposób i urządzenie do analizy właściwości optycznych przezroczystego substratu PL2553439T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1052477A FR2958404B1 (fr) 2010-04-01 2010-04-01 Procede et dispositif d'analyse de la qualite optique d'un substrat transparent
PCT/FR2011/050675 WO2011121219A1 (fr) 2010-04-01 2011-03-28 Procede et dispositif d'analyse de la qualite optique d'un substrat transparent
EP11717302.1A EP2553439B1 (fr) 2010-04-01 2011-03-28 Procede et dispositif d'analyse de la qualite optique d'un substrat transparent

Publications (1)

Publication Number Publication Date
PL2553439T3 true PL2553439T3 (pl) 2020-02-28

Family

ID=42666144

Family Applications (1)

Application Number Title Priority Date Filing Date
PL11717302T PL2553439T3 (pl) 2010-04-01 2011-03-28 Sposób i urządzenie do analizy właściwości optycznych przezroczystego substratu

Country Status (13)

Country Link
US (1) US8736688B2 (pl)
EP (1) EP2553439B1 (pl)
JP (1) JP2013524192A (pl)
KR (2) KR20130014528A (pl)
CN (1) CN103097879B (pl)
BR (1) BR112012023274B1 (pl)
EA (1) EA026441B1 (pl)
ES (1) ES2751989T3 (pl)
FR (1) FR2958404B1 (pl)
MX (1) MX2012010900A (pl)
PL (1) PL2553439T3 (pl)
PT (1) PT2553439T (pl)
WO (1) WO2011121219A1 (pl)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011109793B4 (de) * 2011-08-08 2014-12-04 Grenzbach Maschinenbau Gmbh Verfahren und Vorrichtung zur sicheren Detektion von Materialfehlern in transparenten Werkstoffen
FR2983583B1 (fr) * 2011-12-02 2013-11-15 Saint Gobain Dispositif d'analyse des defauts d'aspect d'un substrat transparent
US9007454B2 (en) * 2012-10-31 2015-04-14 The Aerospace Corporation Optimized illumination for imaging
CN103454287A (zh) * 2013-09-05 2013-12-18 深圳市维图视技术有限公司 一种玻璃管缺陷视觉检测方法及其装置
CN103472072A (zh) * 2013-09-09 2013-12-25 深圳市维图视技术有限公司 一种新的玻璃管缺陷视觉检测方法及其装置
KR102216118B1 (ko) * 2013-11-25 2021-02-17 코닝 인코포레이티드 실질적인 원통형의 정반사성 반사 표면의 형상을 결정하는 방법
NL2014399A (en) * 2014-04-24 2015-11-02 Asml Holding Nv Compact two-sided reticle inspection system.
EP3177902B1 (en) * 2014-08-08 2022-03-30 Heraeus Quartz North America LLC Methods and apparatus for determining geometric properties of optical fiber preforms
US20160178535A1 (en) * 2014-12-17 2016-06-23 Xerox Corporation Inspection Device And Method
US10845746B2 (en) * 2017-01-20 2020-11-24 Hp Indigo B.V. Identifying linear defects
IT201700075428A1 (it) * 2017-07-05 2019-01-05 Antares Vision S R L Dispositivo di ispezione di contenitori particolarmente per il rilevamento di difetti lineari
KR102358582B1 (ko) * 2017-08-23 2022-02-04 삼성전자 주식회사 휴대 단말의 커버 글래스의 광학적 특성을 확인하는 검사 장치 및 커버 글래의 광학적 특성의 확인 방법
FR3085205B1 (fr) * 2018-08-22 2020-07-24 Livbag Sas Dispositif et methode de controle de verre de protection de soudeuse laser
EP3640630A1 (en) * 2018-10-18 2020-04-22 Infineon Technologies AG Embedded wafer inspection
WO2020187994A1 (en) * 2019-03-19 2020-09-24 Central Glass Co., Ltd. Optical pattern for information acquisition system
CN111107257A (zh) * 2020-01-20 2020-05-05 成都德图福思科技有限公司 针对透明介质表面刻蚀或浮雕图案进行高对比度成像的方法
EP3875893A1 (en) * 2020-03-02 2021-09-08 Trifid Automation, s.r.o. Method and device for contactless measurement of geometric objects

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61176839A (ja) * 1985-01-31 1986-08-08 Kanebo Ltd 透明または半透明の板状体の欠点検査装置
US5175601A (en) * 1991-10-15 1992-12-29 Electro-Optical Information Systems High-speed 3-D surface measurement surface inspection and reverse-CAD system
JP2795595B2 (ja) * 1992-06-26 1998-09-10 セントラル硝子株式会社 透明板状体の欠点検出方法
JPH10111252A (ja) * 1996-10-02 1998-04-28 Asahi Glass Co Ltd ガラス板の欠点検出装置
US6509967B1 (en) 1996-10-18 2003-01-21 Innomess Gelsellschaft Fur Messtechnik Mbh Method for detecting optical errors in large surface panels
US6208412B1 (en) 1999-06-14 2001-03-27 Visteon Global Technologies, Inc. Method and apparatus for determining optical quality
JP4633245B2 (ja) * 2000-11-06 2011-02-16 住友化学株式会社 表面検査装置及び表面検査方法
DE10301941B4 (de) * 2003-01-20 2005-11-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Kamera und Verfahren zur optischen Aufnahme eines Schirms
KR100615576B1 (ko) 2003-02-06 2006-08-25 주식회사 고영테크놀러지 3차원형상 측정장치
WO2006044185A2 (en) * 2004-10-13 2006-04-27 Akrometrix, Llc Systems and methods for measuring sample surface flatness of continuously moving samples
US20060092276A1 (en) * 2004-10-28 2006-05-04 Ariglio James A Inspection system and method for identifying surface and body defects in a glass sheet
FR2898969B1 (fr) * 2006-03-24 2008-10-24 Peugeot Citroen Automobiles Sa Procede et installation de controle de la qualite de pieces
CN102119328B (zh) * 2008-08-07 2013-01-23 凯德易株式会社 检查系统
NL2003263A (en) * 2008-08-20 2010-03-10 Asml Holding Nv Particle detection on an object surface.
FR2936605B1 (fr) 2008-10-01 2014-10-31 Saint Gobain Dispositif d'analyse de la surface d'un substrat
CN101592621A (zh) * 2009-05-18 2009-12-02 济南佳美视觉技术有限公司 一种使用折射栅格光源检验玻璃瓶表面缺陷及内部缺陷的自动光学检验设备

Also Published As

Publication number Publication date
KR20180018829A (ko) 2018-02-21
ES2751989T3 (es) 2020-04-02
PT2553439T (pt) 2019-11-22
WO2011121219A1 (fr) 2011-10-06
US20130010175A1 (en) 2013-01-10
CN103097879B (zh) 2017-01-18
BR112012023274A2 (pt) 2016-05-17
FR2958404B1 (fr) 2012-04-27
EP2553439A1 (fr) 2013-02-06
EA026441B1 (ru) 2017-04-28
EP2553439B1 (fr) 2019-08-14
BR112012023274B1 (pt) 2020-05-26
MX2012010900A (es) 2012-11-06
EA201290998A1 (ru) 2013-03-29
FR2958404A1 (fr) 2011-10-07
US8736688B2 (en) 2014-05-27
CN103097879A (zh) 2013-05-08
JP2013524192A (ja) 2013-06-17
KR20130014528A (ko) 2013-02-07

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