EA026441B1 - Способ и устройство анализа оптического качества прозрачной подложки - Google Patents
Способ и устройство анализа оптического качества прозрачной подложки Download PDFInfo
- Publication number
- EA026441B1 EA026441B1 EA201290998A EA201290998A EA026441B1 EA 026441 B1 EA026441 B1 EA 026441B1 EA 201290998 A EA201290998 A EA 201290998A EA 201290998 A EA201290998 A EA 201290998A EA 026441 B1 EA026441 B1 EA 026441B1
- Authority
- EA
- Eurasian Patent Office
- Prior art keywords
- substrate
- worlds
- image
- camera
- holder
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 104
- 230000003287 optical effect Effects 0.000 title claims description 34
- 238000000034 method Methods 0.000 title claims description 21
- 238000012545 processing Methods 0.000 claims abstract description 28
- 238000004458 analytical method Methods 0.000 claims abstract description 16
- 230000000737 periodic effect Effects 0.000 claims abstract description 8
- 230000007547 defect Effects 0.000 claims description 53
- 230000033001 locomotion Effects 0.000 claims description 17
- 238000005259 measurement Methods 0.000 claims description 9
- 230000000694 effects Effects 0.000 claims description 8
- 238000013507 mapping Methods 0.000 claims description 7
- 238000010252 digital analysis Methods 0.000 claims description 4
- 238000002834 transmittance Methods 0.000 claims description 4
- 210000003739 neck Anatomy 0.000 claims 1
- 239000011521 glass Substances 0.000 description 17
- 238000004519 manufacturing process Methods 0.000 description 12
- 230000005540 biological transmission Effects 0.000 description 7
- 238000004364 calculation method Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 238000012544 monitoring process Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 238000000691 measurement method Methods 0.000 description 4
- 239000007787 solid Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000005094 computer simulation Methods 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 239000005357 flat glass Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- 238000006124 Pilkington process Methods 0.000 description 1
- 230000002745 absorbent Effects 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 238000003708 edge detection Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 239000005329 float glass Substances 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000010191 image analysis Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 238000005191 phase separation Methods 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Landscapes
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1052477A FR2958404B1 (fr) | 2010-04-01 | 2010-04-01 | Procede et dispositif d'analyse de la qualite optique d'un substrat transparent |
| PCT/FR2011/050675 WO2011121219A1 (fr) | 2010-04-01 | 2011-03-28 | Procede et dispositif d'analyse de la qualite optique d'un substrat transparent |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EA201290998A1 EA201290998A1 (ru) | 2013-03-29 |
| EA026441B1 true EA026441B1 (ru) | 2017-04-28 |
Family
ID=42666144
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EA201290998A EA026441B1 (ru) | 2010-04-01 | 2011-03-28 | Способ и устройство анализа оптического качества прозрачной подложки |
Country Status (13)
| Country | Link |
|---|---|
| US (1) | US8736688B2 (enExample) |
| EP (1) | EP2553439B1 (enExample) |
| JP (1) | JP2013524192A (enExample) |
| KR (2) | KR20180018829A (enExample) |
| CN (1) | CN103097879B (enExample) |
| BR (1) | BR112012023274B1 (enExample) |
| EA (1) | EA026441B1 (enExample) |
| ES (1) | ES2751989T3 (enExample) |
| FR (1) | FR2958404B1 (enExample) |
| MX (1) | MX2012010900A (enExample) |
| PL (1) | PL2553439T3 (enExample) |
| PT (1) | PT2553439T (enExample) |
| WO (1) | WO2011121219A1 (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102011109793B4 (de) * | 2011-08-08 | 2014-12-04 | Grenzbach Maschinenbau Gmbh | Verfahren und Vorrichtung zur sicheren Detektion von Materialfehlern in transparenten Werkstoffen |
| FR2983583B1 (fr) | 2011-12-02 | 2013-11-15 | Saint Gobain | Dispositif d'analyse des defauts d'aspect d'un substrat transparent |
| US9007454B2 (en) * | 2012-10-31 | 2015-04-14 | The Aerospace Corporation | Optimized illumination for imaging |
| CN103454287A (zh) * | 2013-09-05 | 2013-12-18 | 深圳市维图视技术有限公司 | 一种玻璃管缺陷视觉检测方法及其装置 |
| CN103472072A (zh) * | 2013-09-09 | 2013-12-25 | 深圳市维图视技术有限公司 | 一种新的玻璃管缺陷视觉检测方法及其装置 |
| WO2015077113A1 (en) * | 2013-11-25 | 2015-05-28 | Corning Incorporated | Methods for determining a shape of a substantially cylindrical specular reflective surface |
| JP6353913B2 (ja) * | 2014-04-24 | 2018-07-04 | エーエスエムエル ホールディング エヌ．ブイ． | コンパクトな両側レチクル検査システム |
| US10378996B2 (en) * | 2014-08-08 | 2019-08-13 | Heraeus Quartz North America Llc | Methods and apparatus for determining geometric properties of optical fiber preforms |
| US20160178535A1 (en) * | 2014-12-17 | 2016-06-23 | Xerox Corporation | Inspection Device And Method |
| US10845746B2 (en) * | 2017-01-20 | 2020-11-24 | Hp Indigo B.V. | Identifying linear defects |
| IT201700075428A1 (it) * | 2017-07-05 | 2019-01-05 | Antares Vision S R L | Dispositivo di ispezione di contenitori particolarmente per il rilevamento di difetti lineari |
| KR102358582B1 (ko) * | 2017-08-23 | 2022-02-04 | 삼성전자 주식회사 | 휴대 단말의 커버 글래스의 광학적 특성을 확인하는 검사 장치 및 커버 글래의 광학적 특성의 확인 방법 |
| FR3085205B1 (fr) * | 2018-08-22 | 2020-07-24 | Livbag Sas | Dispositif et methode de controle de verre de protection de soudeuse laser |
| EP3640630A1 (en) * | 2018-10-18 | 2020-04-22 | Infineon Technologies AG | Embedded wafer inspection |
| WO2020187994A1 (en) * | 2019-03-19 | 2020-09-24 | Central Glass Co., Ltd. | Optical pattern for information acquisition system |
| CN111107257A (zh) * | 2020-01-20 | 2020-05-05 | 成都德图福思科技有限公司 | 针对透明介质表面刻蚀或浮雕图案进行高对比度成像的方法 |
| EP3875893A1 (en) * | 2020-03-02 | 2021-09-08 | Trifid Automation, s.r.o. | Method and device for contactless measurement of geometric objects |
| FR3151094B1 (fr) * | 2023-07-10 | 2025-07-18 | Sas Woodoo | Procede d’evaluation de la clarte d’un materiau, notamment non-homogene |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5175601A (en) * | 1991-10-15 | 1992-12-29 | Electro-Optical Information Systems | High-speed 3-D surface measurement surface inspection and reverse-CAD system |
| US20060158664A1 (en) * | 2003-02-06 | 2006-07-20 | Koh Young Technology Inc | Three-dimensional image measuring apparatus |
| FR2898969A1 (fr) * | 2006-03-24 | 2007-09-28 | Peugeot Citroen Automobiles Sa | Procede et installation de controle de la qualite de pieces |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61176839A (ja) * | 1985-01-31 | 1986-08-08 | Kanebo Ltd | 透明または半透明の板状体の欠点検査装置 |
| JP2795595B2 (ja) * | 1992-06-26 | 1998-09-10 | セントラル硝子株式会社 | 透明板状体の欠点検出方法 |
| JPH10111252A (ja) * | 1996-10-02 | 1998-04-28 | Asahi Glass Co Ltd | ガラス板の欠点検出装置 |
| US6509967B1 (en) | 1996-10-18 | 2003-01-21 | Innomess Gelsellschaft Fur Messtechnik Mbh | Method for detecting optical errors in large surface panels |
| US6208412B1 (en) | 1999-06-14 | 2001-03-27 | Visteon Global Technologies, Inc. | Method and apparatus for determining optical quality |
| JP4633245B2 (ja) * | 2000-11-06 | 2011-02-16 | 住友化学株式会社 | 表面検査装置及び表面検査方法 |
| DE10301941B4 (de) * | 2003-01-20 | 2005-11-17 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Kamera und Verfahren zur optischen Aufnahme eines Schirms |
| US7369253B2 (en) * | 2004-10-13 | 2008-05-06 | Akrometrix, Llc | Systems and methods for measuring sample surface flatness of continuously moving samples |
| US20060092276A1 (en) * | 2004-10-28 | 2006-05-04 | Ariglio James A | Inspection system and method for identifying surface and body defects in a glass sheet |
| EP2325625A1 (en) * | 2008-08-07 | 2011-05-25 | Kde Corporation | Inspection system |
| NL2003263A (en) * | 2008-08-20 | 2010-03-10 | Asml Holding Nv | Particle detection on an object surface. |
| FR2936605B1 (fr) | 2008-10-01 | 2014-10-31 | Saint Gobain | Dispositif d'analyse de la surface d'un substrat |
| CN101592621A (zh) * | 2009-05-18 | 2009-12-02 | 济南佳美视觉技术有限公司 | 一种使用折射栅格光源检验玻璃瓶表面缺陷及内部缺陷的自动光学检验设备 |
-
2010
- 2010-04-01 FR FR1052477A patent/FR2958404B1/fr not_active Expired - Fee Related
-
2011
- 2011-03-28 CN CN201180017405.0A patent/CN103097879B/zh active Active
- 2011-03-28 ES ES11717302T patent/ES2751989T3/es active Active
- 2011-03-28 KR KR1020187003691A patent/KR20180018829A/ko not_active Ceased
- 2011-03-28 PT PT117173021T patent/PT2553439T/pt unknown
- 2011-03-28 WO PCT/FR2011/050675 patent/WO2011121219A1/fr not_active Ceased
- 2011-03-28 PL PL11717302T patent/PL2553439T3/pl unknown
- 2011-03-28 EP EP11717302.1A patent/EP2553439B1/fr active Active
- 2011-03-28 US US13/637,318 patent/US8736688B2/en active Active
- 2011-03-28 KR KR1020127025532A patent/KR20130014528A/ko not_active Ceased
- 2011-03-28 MX MX2012010900A patent/MX2012010900A/es active IP Right Grant
- 2011-03-28 JP JP2013501904A patent/JP2013524192A/ja active Pending
- 2011-03-28 BR BR112012023274-6A patent/BR112012023274B1/pt not_active IP Right Cessation
- 2011-03-28 EA EA201290998A patent/EA026441B1/ru not_active IP Right Cessation
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5175601A (en) * | 1991-10-15 | 1992-12-29 | Electro-Optical Information Systems | High-speed 3-D surface measurement surface inspection and reverse-CAD system |
| US20060158664A1 (en) * | 2003-02-06 | 2006-07-20 | Koh Young Technology Inc | Three-dimensional image measuring apparatus |
| FR2898969A1 (fr) * | 2006-03-24 | 2007-09-28 | Peugeot Citroen Automobiles Sa | Procede et installation de controle de la qualite de pieces |
Also Published As
| Publication number | Publication date |
|---|---|
| EA201290998A1 (ru) | 2013-03-29 |
| CN103097879B (zh) | 2017-01-18 |
| ES2751989T3 (es) | 2020-04-02 |
| FR2958404B1 (fr) | 2012-04-27 |
| BR112012023274B1 (pt) | 2020-05-26 |
| FR2958404A1 (fr) | 2011-10-07 |
| PL2553439T3 (pl) | 2020-02-28 |
| KR20180018829A (ko) | 2018-02-21 |
| US8736688B2 (en) | 2014-05-27 |
| KR20130014528A (ko) | 2013-02-07 |
| PT2553439T (pt) | 2019-11-22 |
| BR112012023274A2 (pt) | 2016-05-17 |
| WO2011121219A1 (fr) | 2011-10-06 |
| EP2553439B1 (fr) | 2019-08-14 |
| CN103097879A (zh) | 2013-05-08 |
| EP2553439A1 (fr) | 2013-02-06 |
| JP2013524192A (ja) | 2013-06-17 |
| MX2012010900A (es) | 2012-11-06 |
| US20130010175A1 (en) | 2013-01-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EA026441B1 (ru) | Способ и устройство анализа оптического качества прозрачной подложки | |
| EA026373B1 (ru) | Устройство и способ для контроля дефектности прозрачной или зеркальной подложки по ее оптическим свойствам в проходящем или отраженном свете соответственно | |
| EP2102587B1 (en) | Method of automated quantitative analysis of distortion shaped vehicle glass by reflected optical imaging | |
| CN103257468B (zh) | 一种基于参考亮度的液晶显示器响应时间测量方法 | |
| CN106705897A (zh) | 曲面电子显示屏用弧形玻璃面板缺陷检测方法 | |
| KR100495608B1 (ko) | 큰 표면의 페인에서 광학 오차의 검출방법 | |
| JP2013524192A5 (enExample) | ||
| US8081840B2 (en) | Appliance for controlling transparent or reflective elements | |
| JPH03175308A (ja) | ガラスのような透明材料から成る大面積の板の光学品質検査方法 | |
| CN110186937A (zh) | 剔除灰尘影响的镜面物体表面二维缺陷检测方法及系统 | |
| US20120127283A1 (en) | Apparatus and Method for Measuring Picture Quality of Stereoscopic Display Device, and Picture Quality Analyzing Method Using the Same | |
| CN113624457B (zh) | 基于光学衍射的薄膜均匀性检测系统 | |
| CN119715610A (zh) | 一种利用条纹光栅板区分点状灰尘和气泡缺陷的装置和方法 | |
| TWM457889U (zh) | 面板瑕疵檢測之裝置 | |
| CN104111040B (zh) | 一种浮法玻璃波筋在线检测方法 | |
| KR102129973B1 (ko) | 투명도 측정장치를 포함하는 측정 시스템 및 투명도 측정 방법 | |
| CN113624461B (zh) | 基于线结构光的薄膜均匀性检测系统 | |
| TW201522941A (zh) | 相互疊合之具有週期性結構之上下光學元件之疊紋的檢測裝置與方法 | |
| BRPI0919419B1 (pt) | Dispositivo de análise da superfície de um substrato |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Lapse of a eurasian patent due to non-payment of renewal fees within the time limit in the following designated state(s) |
Designated state(s): AM AZ BY KZ KG MD TJ TM |