MX2012010900A - Metodo y dispositivo para analizar la cantidad optica de un sustrato transparente. - Google Patents

Metodo y dispositivo para analizar la cantidad optica de un sustrato transparente.

Info

Publication number
MX2012010900A
MX2012010900A MX2012010900A MX2012010900A MX2012010900A MX 2012010900 A MX2012010900 A MX 2012010900A MX 2012010900 A MX2012010900 A MX 2012010900A MX 2012010900 A MX2012010900 A MX 2012010900A MX 2012010900 A MX2012010900 A MX 2012010900A
Authority
MX
Mexico
Prior art keywords
substrate
reference pattern
image
camera
support
Prior art date
Application number
MX2012010900A
Other languages
English (en)
Spanish (es)
Inventor
Michel Pichon
Franc Davenne
Original Assignee
Saint Gobain
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saint Gobain filed Critical Saint Gobain
Publication of MX2012010900A publication Critical patent/MX2012010900A/es

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513Liquid crystal panels

Landscapes

  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
MX2012010900A 2010-04-01 2011-03-28 Metodo y dispositivo para analizar la cantidad optica de un sustrato transparente. MX2012010900A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1052477A FR2958404B1 (fr) 2010-04-01 2010-04-01 Procede et dispositif d'analyse de la qualite optique d'un substrat transparent
PCT/FR2011/050675 WO2011121219A1 (fr) 2010-04-01 2011-03-28 Procede et dispositif d'analyse de la qualite optique d'un substrat transparent

Publications (1)

Publication Number Publication Date
MX2012010900A true MX2012010900A (es) 2012-11-06

Family

ID=42666144

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2012010900A MX2012010900A (es) 2010-04-01 2011-03-28 Metodo y dispositivo para analizar la cantidad optica de un sustrato transparente.

Country Status (13)

Country Link
US (1) US8736688B2 (enExample)
EP (1) EP2553439B1 (enExample)
JP (1) JP2013524192A (enExample)
KR (2) KR20130014528A (enExample)
CN (1) CN103097879B (enExample)
BR (1) BR112012023274B1 (enExample)
EA (1) EA026441B1 (enExample)
ES (1) ES2751989T3 (enExample)
FR (1) FR2958404B1 (enExample)
MX (1) MX2012010900A (enExample)
PL (1) PL2553439T3 (enExample)
PT (1) PT2553439T (enExample)
WO (1) WO2011121219A1 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011109793B4 (de) * 2011-08-08 2014-12-04 Grenzbach Maschinenbau Gmbh Verfahren und Vorrichtung zur sicheren Detektion von Materialfehlern in transparenten Werkstoffen
FR2983583B1 (fr) 2011-12-02 2013-11-15 Saint Gobain Dispositif d'analyse des defauts d'aspect d'un substrat transparent
US9007454B2 (en) * 2012-10-31 2015-04-14 The Aerospace Corporation Optimized illumination for imaging
CN103454287A (zh) * 2013-09-05 2013-12-18 深圳市维图视技术有限公司 一种玻璃管缺陷视觉检测方法及其装置
CN103472072A (zh) * 2013-09-09 2013-12-25 深圳市维图视技术有限公司 一种新的玻璃管缺陷视觉检测方法及其装置
JP2017501951A (ja) 2013-11-25 2017-01-19 コーニング インコーポレイテッド 実質的に柱面を成す鏡面反射面の形状を決定するための方法
US10156527B2 (en) * 2014-04-24 2018-12-18 Asml Holding N.V. Compact two-sided reticle inspection system
JP6559225B2 (ja) * 2014-08-08 2019-08-14 ヘレーウス クオーツ ノース アメリカ エルエルシーHeraeus Quartz North America LLC 光ファイバ母材の幾何学的特性を求めるための方法及び装置
US20160178535A1 (en) * 2014-12-17 2016-06-23 Xerox Corporation Inspection Device And Method
US10845746B2 (en) * 2017-01-20 2020-11-24 Hp Indigo B.V. Identifying linear defects
IT201700075428A1 (it) * 2017-07-05 2019-01-05 Antares Vision S R L Dispositivo di ispezione di contenitori particolarmente per il rilevamento di difetti lineari
KR102358582B1 (ko) * 2017-08-23 2022-02-04 삼성전자 주식회사 휴대 단말의 커버 글래스의 광학적 특성을 확인하는 검사 장치 및 커버 글래의 광학적 특성의 확인 방법
FR3085205B1 (fr) * 2018-08-22 2020-07-24 Livbag Sas Dispositif et methode de controle de verre de protection de soudeuse laser
EP3640630A1 (en) * 2018-10-18 2020-04-22 Infineon Technologies AG Embedded wafer inspection
EP3941743B1 (en) 2019-03-19 2024-05-01 Central Glass Co., Ltd. Optical pattern for information acquisition system
CN111107257A (zh) * 2020-01-20 2020-05-05 成都德图福思科技有限公司 针对透明介质表面刻蚀或浮雕图案进行高对比度成像的方法
EP3875893A1 (en) * 2020-03-02 2021-09-08 Trifid Automation, s.r.o. Method and device for contactless measurement of geometric objects
FR3151094B1 (fr) * 2023-07-10 2025-07-18 Sas Woodoo Procede d’evaluation de la clarte d’un materiau, notamment non-homogene

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61176839A (ja) * 1985-01-31 1986-08-08 Kanebo Ltd 透明または半透明の板状体の欠点検査装置
US5175601A (en) * 1991-10-15 1992-12-29 Electro-Optical Information Systems High-speed 3-D surface measurement surface inspection and reverse-CAD system
JP2795595B2 (ja) * 1992-06-26 1998-09-10 セントラル硝子株式会社 透明板状体の欠点検出方法
JPH10111252A (ja) * 1996-10-02 1998-04-28 Asahi Glass Co Ltd ガラス板の欠点検出装置
US6509967B1 (en) 1996-10-18 2003-01-21 Innomess Gelsellschaft Fur Messtechnik Mbh Method for detecting optical errors in large surface panels
US6208412B1 (en) 1999-06-14 2001-03-27 Visteon Global Technologies, Inc. Method and apparatus for determining optical quality
JP4633245B2 (ja) * 2000-11-06 2011-02-16 住友化学株式会社 表面検査装置及び表面検査方法
DE10301941B4 (de) * 2003-01-20 2005-11-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Kamera und Verfahren zur optischen Aufnahme eines Schirms
KR100615576B1 (ko) * 2003-02-06 2006-08-25 주식회사 고영테크놀러지 3차원형상 측정장치
WO2006044185A2 (en) * 2004-10-13 2006-04-27 Akrometrix, Llc Systems and methods for measuring sample surface flatness of continuously moving samples
US20060092276A1 (en) * 2004-10-28 2006-05-04 Ariglio James A Inspection system and method for identifying surface and body defects in a glass sheet
FR2898969B1 (fr) * 2006-03-24 2008-10-24 Peugeot Citroen Automobiles Sa Procede et installation de controle de la qualite de pieces
EP2325625A1 (en) * 2008-08-07 2011-05-25 Kde Corporation Inspection system
NL2003263A (en) * 2008-08-20 2010-03-10 Asml Holding Nv Particle detection on an object surface.
FR2936605B1 (fr) 2008-10-01 2014-10-31 Saint Gobain Dispositif d'analyse de la surface d'un substrat
CN101592621A (zh) * 2009-05-18 2009-12-02 济南佳美视觉技术有限公司 一种使用折射栅格光源检验玻璃瓶表面缺陷及内部缺陷的自动光学检验设备

Also Published As

Publication number Publication date
KR20180018829A (ko) 2018-02-21
US20130010175A1 (en) 2013-01-10
BR112012023274A2 (pt) 2016-05-17
WO2011121219A1 (fr) 2011-10-06
BR112012023274B1 (pt) 2020-05-26
EA201290998A1 (ru) 2013-03-29
EA026441B1 (ru) 2017-04-28
FR2958404B1 (fr) 2012-04-27
US8736688B2 (en) 2014-05-27
PT2553439T (pt) 2019-11-22
JP2013524192A (ja) 2013-06-17
FR2958404A1 (fr) 2011-10-07
CN103097879A (zh) 2013-05-08
PL2553439T3 (pl) 2020-02-28
KR20130014528A (ko) 2013-02-07
CN103097879B (zh) 2017-01-18
EP2553439A1 (fr) 2013-02-06
ES2751989T3 (es) 2020-04-02
EP2553439B1 (fr) 2019-08-14

Similar Documents

Publication Publication Date Title
MX2012010900A (es) Metodo y dispositivo para analizar la cantidad optica de un sustrato transparente.
KR101916961B1 (ko) 기판의 표면을 분석하기 위한 장치
EP2102587B1 (en) Method of automated quantitative analysis of distortion shaped vehicle glass by reflected optical imaging
US9551671B2 (en) Method and device for detecting, in particular, refracting defects
CN106705897A (zh) 曲面电子显示屏用弧形玻璃面板缺陷检测方法
US20150049331A1 (en) Method and device for analysing phase distribution of fringe image using high-dimensional intensity information, and program for the same
KR20150129054A (ko) 무라 검출 및 계측을 위한 방법 및 장치
KR100495608B1 (ko) 큰 표면의 페인에서 광학 오차의 검출방법
IT201700002416A1 (it) Apparecchiatura mobile automatizzata per il rilevamento e la classificazione dei danni sulla carrozzeria
JPH03175308A (ja) ガラスのような透明材料から成る大面積の板の光学品質検査方法
US8081840B2 (en) Appliance for controlling transparent or reflective elements
RU2009131500A (ru) Способ бесконтактного измерения скорости и/или длины экструдата в продольном направлении, в частности кабеля
US20120133761A1 (en) Uneven area inspection system
JP2009168454A (ja) 表面欠陥検査装置及び表面欠陥検査方法
DE19509962A1 (de) Verfahren und Vorrichtung zur Erfassung von dreidimensionalen Verschiebungsvektorfeldern
CN116664516A (zh) 一种基于线阵相机的动态物体相位偏折分析方法及系统
CN104180772A (zh) 一种视觉检测装置
JP6013819B2 (ja) 表面形状検査装置及び表面形状検査方法
Adamo et al. An online defects inspection system for satin glass based on machine vision
CN105486693A (zh) 一种无损检测高精度元件缺陷的方法
KR102783695B1 (ko) 광간섭 단층촬영장치용 결함 감지 방법
CN117538259A (zh) 平板玻璃缺陷检测装置和平板玻璃缺陷检测方法
TW201522941A (zh) 相互疊合之具有週期性結構之上下光學元件之疊紋的檢測裝置與方法

Legal Events

Date Code Title Description
FG Grant or registration