CN102788798B - 贴合板状体检查装置与方法 - Google Patents

贴合板状体检查装置与方法 Download PDF

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Publication number
CN102788798B
CN102788798B CN201210151151.8A CN201210151151A CN102788798B CN 102788798 B CN102788798 B CN 102788798B CN 201210151151 A CN201210151151 A CN 201210151151A CN 102788798 B CN102788798 B CN 102788798B
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CN
China
Prior art keywords
plate
shaped body
line sensor
sensor camera
light
Prior art date
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Expired - Fee Related
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CN201210151151.8A
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English (en)
Chinese (zh)
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CN102788798A (zh
Inventor
林义典
若叶博之
井筒纪
关胜利
小野洋子
权藤隆德
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Shibaura Mechatronics Corp
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Shibaura Engineering Works Co Ltd
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Publication of CN102788798A publication Critical patent/CN102788798A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN201210151151.8A 2011-05-16 2012-05-15 贴合板状体检查装置与方法 Expired - Fee Related CN102788798B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011109951A JP5791101B2 (ja) 2011-05-16 2011-05-16 貼り合せ板状体検査装置及び方法
JP2011-109951 2011-05-16

Publications (2)

Publication Number Publication Date
CN102788798A CN102788798A (zh) 2012-11-21
CN102788798B true CN102788798B (zh) 2015-06-03

Family

ID=47154262

Family Applications (1)

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CN201210151151.8A Expired - Fee Related CN102788798B (zh) 2011-05-16 2012-05-15 贴合板状体检查装置与方法

Country Status (4)

Country Link
JP (1) JP5791101B2 (enExample)
KR (1) KR101296969B1 (enExample)
CN (1) CN102788798B (enExample)
TW (1) TWI499770B (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104406988A (zh) * 2014-11-18 2015-03-11 浙江大学 一种玻璃内部缺陷的检测方法
KR20170133113A (ko) * 2016-05-25 2017-12-05 코닝정밀소재 주식회사 유리 상면 상의 이물질 검출 방법과 장치, 및 입사광 조사 방법
CN106872483A (zh) * 2017-02-04 2017-06-20 大连益盛达智能科技有限公司 解决光学检测设备因透明材质中的气泡影响检测的方法
CN110391132B (zh) * 2018-04-16 2023-05-16 芝浦机械电子株式会社 有机膜形成装置
KR102713409B1 (ko) * 2018-11-26 2024-10-04 삼성디스플레이 주식회사 윈도우 패널, 이를 포함하는 표시 장치 및 그 제조 방법
CN113702401B (zh) * 2021-08-17 2023-12-08 芜湖东旭光电科技有限公司 玻璃边部缺陷的检测方法
CN114152619B (zh) * 2021-11-30 2024-05-03 天马微电子股份有限公司 线路板及显示装置

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0726457A2 (en) * 1995-02-10 1996-08-14 Central Glass Company, Limited Method and apparatus for detecting defects in transparent sheets, particularly glass sheets
CN1441294A (zh) * 2002-02-28 2003-09-10 芝浦机械电子装置股份有限公司 基板贴合装置及其方法以及基板检测装置
CN1495748A (zh) * 2002-08-01 2004-05-12 株式会社理光 光盘检查装置、光盘检查方法、光盘制造方法和光盘
CN101241086A (zh) * 2008-03-03 2008-08-13 中国科学院光电技术研究所 一种基于对玻璃材料的气泡、杂质测量的检测仪
CN101322169A (zh) * 2005-11-30 2008-12-10 精工电子有限公司 粘合方法以及显示装置的制造方法
CN101790679A (zh) * 2007-09-04 2010-07-28 旭硝子株式会社 检测透明板体内部的微小异物的方法及其装置
CN101813640A (zh) * 2009-02-20 2010-08-25 三星康宁精密琉璃株式会社 玻璃表面的异物检查装置及检查方法
CN101883979A (zh) * 2007-12-03 2010-11-10 芝浦机械电子装置股份有限公司 基板表面检查装置以及基板表面检查方法

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JPH11328756A (ja) * 1998-03-13 1999-11-30 Sanyo Electric Co Ltd 貼り合せ型ディスクの接着部の検査方法および検査装置
JP2001141662A (ja) * 1999-11-18 2001-05-25 Central Glass Co Ltd 透明板状体の欠点検出方法および検出装置
JP2001143353A (ja) * 1999-11-18 2001-05-25 Aiwa Co Ltd ディスク装置のディスク取出機構
JP2003083904A (ja) * 2001-09-17 2003-03-19 Central Glass Co Ltd 透明板状体の欠点検出方法およびその装置
JP2004212202A (ja) * 2002-12-27 2004-07-29 Dainippon Printing Co Ltd 透光体の外観検査方法及び装置
JP2004257776A (ja) * 2003-02-25 2004-09-16 Kiyousera Opt Kk 光透過体検査装置
JP2004301882A (ja) * 2003-03-28 2004-10-28 Fujitsu Display Technologies Corp 液晶表示パネルの欠陥検出方法
JP2004309262A (ja) * 2003-04-04 2004-11-04 V Technology Co Ltd シール材塗布検査装置
JP4322890B2 (ja) * 2005-06-13 2009-09-02 シャープ株式会社 起伏検査装置、起伏検査方法、起伏検査装置の制御プログラム、記録媒体
JP5051874B2 (ja) * 2006-01-11 2012-10-17 日東電工株式会社 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置
JP2009249211A (ja) * 2008-04-03 2009-10-29 Central Glass Co Ltd 合わせガラスの光学的欠陥の検査方法および検査装置
JP5334617B2 (ja) * 2009-02-17 2013-11-06 日東電工株式会社 配線回路基板の製造方法
JP2010223613A (ja) * 2009-03-19 2010-10-07 Futec Inc 光学検査装置
JP5521377B2 (ja) * 2009-04-13 2014-06-11 セントラル硝子株式会社 ガラス板の欠陥識別方法および装置
DE202009017691U1 (de) * 2009-09-02 2010-05-20 Gp Inspect Gmbh Vorrichtung zur Detektion von Defekten in einem Objekt

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0726457A2 (en) * 1995-02-10 1996-08-14 Central Glass Company, Limited Method and apparatus for detecting defects in transparent sheets, particularly glass sheets
CN1441294A (zh) * 2002-02-28 2003-09-10 芝浦机械电子装置股份有限公司 基板贴合装置及其方法以及基板检测装置
CN1495748A (zh) * 2002-08-01 2004-05-12 株式会社理光 光盘检查装置、光盘检查方法、光盘制造方法和光盘
CN101322169A (zh) * 2005-11-30 2008-12-10 精工电子有限公司 粘合方法以及显示装置的制造方法
CN101790679A (zh) * 2007-09-04 2010-07-28 旭硝子株式会社 检测透明板体内部的微小异物的方法及其装置
CN101883979A (zh) * 2007-12-03 2010-11-10 芝浦机械电子装置股份有限公司 基板表面检查装置以及基板表面检查方法
CN101241086A (zh) * 2008-03-03 2008-08-13 中国科学院光电技术研究所 一种基于对玻璃材料的气泡、杂质测量的检测仪
CN101813640A (zh) * 2009-02-20 2010-08-25 三星康宁精密琉璃株式会社 玻璃表面的异物检查装置及检查方法

Also Published As

Publication number Publication date
CN102788798A (zh) 2012-11-21
KR20120128093A (ko) 2012-11-26
KR101296969B1 (ko) 2013-08-20
JP5791101B2 (ja) 2015-10-07
TWI499770B (zh) 2015-09-11
TW201303284A (zh) 2013-01-16
JP2012242142A (ja) 2012-12-10

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