CN102483435B - 用于微电路测试器的导电开尔文接触件 - Google Patents

用于微电路测试器的导电开尔文接触件 Download PDF

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Publication number
CN102483435B
CN102483435B CN201080027549.XA CN201080027549A CN102483435B CN 102483435 B CN102483435 B CN 102483435B CN 201080027549 A CN201080027549 A CN 201080027549A CN 102483435 B CN102483435 B CN 102483435B
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CN
China
Prior art keywords
contact
force
contacts
sense
under test
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CN201080027549.XA
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English (en)
Chinese (zh)
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CN102483435A (zh
Inventor
乔尔·N·厄尔德曼
杰弗里·C·谢里
加里·W·米哈尔科
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Johnstech International Corp
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Johnstech International Corp
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
CN201080027549.XA 2009-04-21 2010-04-21 用于微电路测试器的导电开尔文接触件 Active CN102483435B (zh)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US17114109P 2009-04-21 2009-04-21
US61/171,141 2009-04-21
US25723609P 2009-11-02 2009-11-02
US61/257,236 2009-11-02
US30750110P 2010-02-24 2010-02-24
US61/307,501 2010-02-24
PCT/US2010/031896 WO2010123991A2 (en) 2009-04-21 2010-04-21 Electrically conductive kelvin contacts for microcircuit tester

Publications (2)

Publication Number Publication Date
CN102483435A CN102483435A (zh) 2012-05-30
CN102483435B true CN102483435B (zh) 2016-06-08

Family

ID=42980534

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201080027549.XA Active CN102483435B (zh) 2009-04-21 2010-04-21 用于微电路测试器的导电开尔文接触件

Country Status (9)

Country Link
US (2) US8558554B2 (https=)
EP (1) EP2422205B1 (https=)
JP (1) JP5695637B2 (https=)
KR (1) KR101399071B1 (https=)
CN (1) CN102483435B (https=)
CA (1) CA2759189C (https=)
MY (1) MY179297A (https=)
SG (1) SG175302A1 (https=)
WO (1) WO2010123991A2 (https=)

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MY179228A (en) * 2016-02-22 2020-11-02 Jf Microtechnology Sdn Bhd Kelvin contact assembly and method of installation thereof
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IT201700019437A1 (it) * 2017-02-21 2018-08-21 St Microelectronics Srl Scheda di test per un dispositivo attuabile magneticamente, e sistema di test includente la scheda di test
KR101780476B1 (ko) 2017-03-03 2017-09-21 (주)티에스이 검사용 소켓
MY185304A (en) * 2017-05-18 2021-04-30 Jf Microtechnology Sdn Bhd High precision vertical motion kelvin contact assembly
TWI623996B (zh) * 2017-07-24 2018-05-11 中華精測科技股份有限公司 整合信號及電源完整性模組之積體電路測試座
CN107545246A (zh) * 2017-08-17 2018-01-05 华天科技（西安）有限公司 一种指纹识别芯片的封装结构及其封装方法
MX2020007325A (es) * 2017-09-25 2021-01-29 Johnstech Int Corp Contactor de alto grado de aislamiento con clavija de prueba y carcasa para probar circuitos integrados.
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CN110376511A (zh) * 2019-08-17 2019-10-25 深圳斯普瑞溙科技有限公司 测试极小间距及触点芯片的金手指
TWI737199B (zh) * 2020-02-27 2021-08-21 黃文斌 電子元件測試夾具
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CN112083315A (zh) * 2020-09-15 2020-12-15 苏州韬盛电子科技有限公司 一种针对qfn的开尔文测试插座
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TWI755919B (zh) * 2020-11-03 2022-02-21 中華精測科技股份有限公司 板狀連接器與其雙環式串接件、及晶圓測試組件
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Also Published As

Publication number Publication date
EP2422205B1 (en) 2019-09-18
US8558554B2 (en) 2013-10-15
US20100264935A1 (en) 2010-10-21
KR20120013397A (ko) 2012-02-14
WO2010123991A3 (en) 2012-02-02
JP5695637B2 (ja) 2015-04-08
CA2759189C (en) 2019-05-21
MY179297A (en) 2020-11-04
KR101399071B1 (ko) 2014-05-27
EP2422205A4 (en) 2017-08-30
EP2422205A2 (en) 2012-02-29
US20140103949A1 (en) 2014-04-17
US9500673B2 (en) 2016-11-22
JP2012524905A (ja) 2012-10-18
CN102483435A (zh) 2012-05-30
SG175302A1 (en) 2011-11-28
WO2010123991A2 (en) 2010-10-28
CA2759189A1 (en) 2010-10-28
HK1171264A1 (zh) 2013-03-22

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