CN102239278A - 具有改进的阻隔层性能的薄膜的高速沉积 - Google Patents

具有改进的阻隔层性能的薄膜的高速沉积 Download PDF

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Publication number
CN102239278A
CN102239278A CN2009801486298A CN200980148629A CN102239278A CN 102239278 A CN102239278 A CN 102239278A CN 2009801486298 A CN2009801486298 A CN 2009801486298A CN 200980148629 A CN200980148629 A CN 200980148629A CN 102239278 A CN102239278 A CN 102239278A
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barrier layer
substrate
film
precursor
less
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Chinese (zh)
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E.R.迪基
W.巴罗
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Lotus Applied Technology LLC
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Lotus Applied Technology LLC
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    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40—Oxides
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40—Oxides
    • C23C16/405—Oxides of refractory metals or yttrium
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523—Pulsed gas flow or change of composition over time
    • C23C16/45525—Atomic layer deposition [ALD]
    • C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
    • C23C16/45548—Atomic layer deposition [ALD] characterized by the apparatus having arrangements for gas injection at different locations of the reactor for each ALD half-reaction
    • C23C16/45551—Atomic layer deposition [ALD] characterized by the apparatus having arrangements for gas injection at different locations of the reactor for each ALD half-reaction for relative movement of the substrate and the gas injectors or half-reaction reactor compartments
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/54—Apparatus specially adapted for continuous coating
    • C23C16/545—Apparatus specially adapted for continuous coating for coating elongated substrates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02612—Formation types
    • H01L21/02617—Deposition types
    • H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/26—Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension
    • Y10T428/263—Coating layer not in excess of 5 mils thick or equivalent
    • Y10T428/264—Up to 3 mils
    • Y10T428/265—1 mil or less

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Vapour Deposition (AREA)
  • Wrappers (AREA)
  • Physical Vapour Deposition (AREA)
  • Laminated Bodies (AREA)
CN2009801486298A 2008-12-05 2009-12-07 具有改进的阻隔层性能的薄膜的高速沉积 Pending CN102239278A (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US12038108P 2008-12-05 2008-12-05
US61/120381 2008-12-05
US16128709P 2009-03-18 2009-03-18
US61/161287 2009-03-18
PCT/US2009/067024 WO2010065966A2 (en) 2008-12-05 2009-12-07 High rate deposition of thin films with improved barrier layer properties

Publications (1)

Publication Number Publication Date
CN102239278A true CN102239278A (zh) 2011-11-09

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CN2009801486298A Pending CN102239278A (zh) 2008-12-05 2009-12-07 具有改进的阻隔层性能的薄膜的高速沉积

Country Status (7)

Country Link
US (1) US20100143710A1 (enExample)
EP (1) EP2364380A4 (enExample)
JP (1) JP2012511106A (enExample)
KR (1) KR20110100618A (enExample)
CN (1) CN102239278A (enExample)
BR (1) BRPI0922795A2 (enExample)
WO (1) WO2010065966A2 (enExample)

Cited By (10)

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CN102514280A (zh) * 2011-12-12 2012-06-27 武汉理工大学 一种太阳能选择性吸收涂层及其制备方法
CN104204290A (zh) * 2012-03-23 2014-12-10 皮考逊公司 原子层沉积方法和装置
CN104736334A (zh) * 2012-10-18 2015-06-24 凸版印刷株式会社 层积体、阻气膜及其制造方法
CN104995716A (zh) * 2012-12-31 2015-10-21 美国圣戈班性能塑料公司 柔性基材上的薄膜氮化硅阻挡层
CN106947957A (zh) * 2017-03-01 2017-07-14 秦皇岛博硕光电设备股份有限公司 食品/药品容器的加工方法、食品/药品容器用材料及食品/药品容器
CN107108073A (zh) * 2014-12-26 2017-08-29 竹本容器株式会社 树脂容器及树脂容器覆膜装置
CN107210199A (zh) * 2014-10-17 2017-09-26 路特斯应用技术有限责任公司 高速沉积混合氧化物阻挡膜
CN107815665A (zh) * 2016-09-14 2018-03-20 中国科学院上海硅酸盐研究所 一种二氧化钛薄膜及其制备方法和应用
CN115685301A (zh) * 2023-01-04 2023-02-03 中创智科(绵阳)科技有限公司 一种防爆型氚浓度测量仪
CN116926493A (zh) * 2019-02-20 2023-10-24 松下知识产权经营株式会社 制膜方法、制膜装置及电极箔的制造方法

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KR101314708B1 (ko) 2006-03-26 2013-10-10 로터스 어플라이드 테크놀로지, 엘엘씨 원자층 증착 시스템 및 연성 기판을 코팅하기 위한 방법
US8637117B2 (en) 2009-10-14 2014-01-28 Lotus Applied Technology, Llc Inhibiting excess precursor transport between separate precursor zones in an atomic layer deposition system
US8637123B2 (en) * 2009-12-29 2014-01-28 Lotus Applied Technology, Llc Oxygen radical generation for radical-enhanced thin film deposition
US9297076B2 (en) * 2010-07-23 2016-03-29 Lotus Applied Technology, Llc Substrate transport mechanism contacting a single side of a flexible web substrate for roll-to-roll thin film deposition
JP5864089B2 (ja) 2010-08-25 2016-02-17 日亜化学工業株式会社 発光装置の製造方法
WO2012032343A1 (en) 2010-09-07 2012-03-15 Sun Chemical B.V. A carbon dioxide barrier coating
JP5682372B2 (ja) * 2011-02-07 2015-03-11 ソニー株式会社 電池用セパレータ、電池用セパレータの製造方法、電池、電池パックおよび電子機器
WO2012133541A1 (ja) * 2011-03-29 2012-10-04 凸版印刷株式会社 巻き取り成膜装置
US20130177760A1 (en) 2011-07-11 2013-07-11 Lotus Applied Technology, Llc Mixed metal oxide barrier films and atomic layer deposition method for making mixed metal oxide barrier films
JP5803488B2 (ja) * 2011-09-22 2015-11-04 凸版印刷株式会社 原子層堆積法によるフレキシブル基板への成膜方法及び成膜装置
WO2013180005A1 (ja) * 2012-05-31 2013-12-05 凸版印刷株式会社 巻き取り成膜装置
KR101372309B1 (ko) * 2012-08-07 2014-03-13 (주)씨엔원 롤투롤 방식의 원자층 증착 장비 및 원자층 증착 방법
US9631275B2 (en) * 2012-11-30 2017-04-25 Lg Chem, Ltd. Device for forming a layer
CN104134756A (zh) * 2013-04-30 2014-11-05 成均馆大学校产学协力团 多层封装薄膜
US20180135167A1 (en) * 2014-12-19 2018-05-17 Fujifilm Manufacturing Europe B.V. Transparent Sheet Materials
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KR101704723B1 (ko) * 2015-04-06 2017-02-09 연세대학교 산학협력단 탄소 박막 소자 및 이의 제조 방법
CN110709174A (zh) 2017-06-22 2020-01-17 宝洁公司 包括水溶性层和气相沉积有机涂层的膜
CN110719968A (zh) * 2017-06-22 2020-01-21 宝洁公司 包括水溶性层和气相沉积无机涂层的膜
JP7014291B2 (ja) * 2018-04-12 2022-02-01 信越化学工業株式会社 光触媒転写フィルム及びその製造方法
EP3771751A1 (en) * 2019-08-02 2021-02-03 AR Metallizing N.V. Multi-metal layer wvtr barrier products on water vapour and oxygen permeable bio-based substrates
CN117301589A (zh) * 2023-11-02 2023-12-29 江苏思尔德科技有限公司 一种柔性显示用高阻隔膜制备方法

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Cited By (12)

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Publication number Priority date Publication date Assignee Title
CN102514280A (zh) * 2011-12-12 2012-06-27 武汉理工大学 一种太阳能选择性吸收涂层及其制备方法
CN102514280B (zh) * 2011-12-12 2015-02-04 武汉理工大学 一种太阳能选择性吸收涂层的制备方法
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