CN102147453B - 磁性传感器装置 - Google Patents

磁性传感器装置 Download PDF

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Publication number
CN102147453B
CN102147453B CN201110037432.6A CN201110037432A CN102147453B CN 102147453 B CN102147453 B CN 102147453B CN 201110037432 A CN201110037432 A CN 201110037432A CN 102147453 B CN102147453 B CN 102147453B
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CN
China
Prior art keywords
magnetic
teat
medium
poly
sensor element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201110037432.6A
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English (en)
Chinese (zh)
Other versions
CN102147453A (zh
Inventor
百濑正吾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Instruments Corp
Original Assignee
Sankyo Seiki Manufacturing Co Ltd
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=44421822&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=CN102147453(B) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Sankyo Seiki Manufacturing Co Ltd filed Critical Sankyo Seiki Manufacturing Co Ltd
Publication of CN102147453A publication Critical patent/CN102147453A/zh
Application granted granted Critical
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    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07DHANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D7/00Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
    • G07D7/04Testing magnetic properties of the materials thereof, e.g. by detection of magnetic imprint
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09Magnetoresistive devices
    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07DHANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D7/00Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
    • G07D7/01Testing electronic circuits therein

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measuring Magnetic Variables (AREA)
  • Inspection Of Paper Currency And Valuable Securities (AREA)
CN201110037432.6A 2010-02-05 2011-01-31 磁性传感器装置 Expired - Fee Related CN102147453B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010-024790 2010-02-05
JP2010024790A JP5542466B2 (ja) 2010-02-05 2010-02-05 磁気センサ装置

Publications (2)

Publication Number Publication Date
CN102147453A CN102147453A (zh) 2011-08-10
CN102147453B true CN102147453B (zh) 2015-02-11

Family

ID=44421822

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201110037432.6A Expired - Fee Related CN102147453B (zh) 2010-02-05 2011-01-31 磁性传感器装置

Country Status (3)

Country Link
JP (1) JP5542466B2 (enExample)
KR (1) KR101551515B1 (enExample)
CN (1) CN102147453B (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5912479B2 (ja) * 2011-12-12 2016-04-27 日本電産サンキョー株式会社 磁気センサ装置
JP5996867B2 (ja) * 2011-12-20 2016-09-21 日本電産サンキョー株式会社 磁気センサ装置
CN104471355B (zh) * 2012-07-06 2016-12-14 北京磊岳同泰电子有限公司 芯片式磁传感器
CN103839320A (zh) * 2012-11-23 2014-06-04 北京嘉岳同乐极电子有限公司 用于金融鉴伪机的磁传感器及其制作方法
DE102013000016A1 (de) * 2013-01-02 2014-07-03 Meas Deutschland Gmbh Messvorrichtung zum Messen magnetischer Eigenschaften der Umgebung der Messvorrichtung
CN103106727B (zh) * 2013-01-23 2014-04-09 广州纳龙智能科技有限公司 一种磁传感器及量化鉴定磁码磁滞迴线特征的方法
CN103226865B (zh) * 2013-04-16 2016-05-25 无锡乐尔科技有限公司 一种基于磁电阻技术检测磁性图形表面磁场的磁头
CN103366438B (zh) * 2013-07-06 2015-09-02 广州纳龙智能科技有限公司 一种磁传感器、量化鉴定磁码磁滞迴线特征的方法及自动柜员机、验钞机
DE102013109467A1 (de) 2013-08-30 2015-03-05 MRB Forschungszentrum für Magnet - Resonanz - Bayern e.V. Verfahren und Vorrichtung zur Analyse eines magnetische Partikel umfassenden Probenvolumens
CN103544764B (zh) * 2013-09-12 2016-11-16 无锡乐尔科技有限公司 一种用于识别磁性介质的传感器
CN104167046A (zh) * 2014-08-01 2014-11-26 无锡乐尔科技有限公司 磁图形防伪方法及系统
JP6116647B2 (ja) * 2015-11-06 2017-04-19 日本電産サンキョー株式会社 磁気センサ装置
WO2017175308A1 (ja) * 2016-04-05 2017-10-12 株式会社ヴィーネックス 磁気ラインセンサおよびこれを用いた鑑別装置
KR102516301B1 (ko) * 2016-05-02 2023-04-03 기산전자 주식회사 자성물질 식별 장치 및 지폐 계수기
CH712932A2 (de) * 2016-09-16 2018-03-29 NM Numerical Modelling GmbH Verfahren zur Bestimmung der Position eines Positionsgebers eines Positionsmesssystems.
JP2018072026A (ja) * 2016-10-25 2018-05-10 Tdk株式会社 磁場検出装置
JP6508381B1 (ja) * 2018-03-22 2019-05-08 Tdk株式会社 磁気センサ装置
CN109358300B (zh) * 2018-09-29 2021-02-05 河南理工大学 一种基于立体结构铁芯的微型磁通门传感器
DE102019000254A1 (de) 2019-01-16 2020-07-16 Infineon Technologies Ag Magnetfelderfassung
JP7536291B2 (ja) * 2020-12-14 2024-08-20 ニッカ電測株式会社 平行型フラックスゲートセンサおよびこれを用いた磁気検出回路、装置
JP7754479B2 (ja) * 2021-08-19 2025-10-15 ニッカ電測株式会社 平行フラックスゲートセンサ及びその製造方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5831431A (en) * 1994-01-31 1998-11-03 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Miniaturized coil arrangement made by planar technology, for the detection of ferromagnetic materials
JP2006160599A (ja) * 2004-11-11 2006-06-22 Sony Corp 無鉛ガラス組成物及び磁気ヘッド
JP2008185436A (ja) * 2007-01-30 2008-08-14 Jfe Steel Kk 金属被検体の電磁気特性測定方法及び電磁気特性測定装置
CN101248351B (zh) * 2005-08-31 2011-05-11 日本电产三协株式会社 磁传感器装置、磁传感器装置的制造方法及纸张类识别装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5720166A (en) * 1980-07-07 1982-02-02 Oki Electric Ind Co Ltd Position detector for linear pulse motor
JPS59124354U (ja) * 1983-02-09 1984-08-21 日立電子エンジニアリング株式会社 栓溶接検出器
JP2002140747A (ja) * 2000-10-31 2002-05-17 Sankyo Seiki Mfg Co Ltd コイン識別センサ
JP4771738B2 (ja) * 2005-05-02 2011-09-14 日本電産サンキョー株式会社 紙葉類識別装置および紙葉類識別用磁気センサ
JP4675704B2 (ja) * 2005-07-13 2011-04-27 株式会社東芝 磁性体検知装置
JP5266695B2 (ja) * 2007-09-19 2013-08-21 Jfeスチール株式会社 方向性電磁鋼板の磁気特性変動部位の検出方法および装置
JP5127440B2 (ja) * 2007-12-28 2013-01-23 日本電産サンキョー株式会社 磁気パターン検出装置
JP2009231806A (ja) 2008-02-28 2009-10-08 Nidec Sankyo Corp 磁気検出素子および磁気センサ用コアならびにこれらの製造方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5831431A (en) * 1994-01-31 1998-11-03 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Miniaturized coil arrangement made by planar technology, for the detection of ferromagnetic materials
JP2006160599A (ja) * 2004-11-11 2006-06-22 Sony Corp 無鉛ガラス組成物及び磁気ヘッド
CN101248351B (zh) * 2005-08-31 2011-05-11 日本电产三协株式会社 磁传感器装置、磁传感器装置的制造方法及纸张类识别装置
JP2008185436A (ja) * 2007-01-30 2008-08-14 Jfe Steel Kk 金属被検体の電磁気特性測定方法及び電磁気特性測定装置

Also Published As

Publication number Publication date
CN102147453A (zh) 2011-08-10
KR20110091442A (ko) 2011-08-11
JP2011163832A (ja) 2011-08-25
JP5542466B2 (ja) 2014-07-09
KR101551515B1 (ko) 2015-09-08

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Granted publication date: 20150211

Termination date: 20210131