CN102109388A - 温度检测系统 - Google Patents
温度检测系统 Download PDFInfo
- Publication number
- CN102109388A CN102109388A CN2010106231800A CN201010623180A CN102109388A CN 102109388 A CN102109388 A CN 102109388A CN 2010106231800 A CN2010106231800 A CN 2010106231800A CN 201010623180 A CN201010623180 A CN 201010623180A CN 102109388 A CN102109388 A CN 102109388A
- Authority
- CN
- China
- Prior art keywords
- temperature
- temperature detection
- terminal
- voltage
- reference voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K3/00—Thermometers giving results other than momentary value of temperature
- G01K3/005—Circuits arrangements for indicating a predetermined temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/02—Means for indicating or recording specially adapted for thermometers
- G01K1/026—Means for indicating or recording specially adapted for thermometers arrangements for monitoring a plurality of temperatures, e.g. by multiplexing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
- G01K7/015—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions using microstructures, e.g. made of silicon
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Semiconductor Integrated Circuits (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
Description
Claims (2)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009-294656 | 2009-12-25 | ||
JP2009294656A JP5389635B2 (ja) | 2009-12-25 | 2009-12-25 | 温度検出システム |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102109388A true CN102109388A (zh) | 2011-06-29 |
CN102109388B CN102109388B (zh) | 2016-01-20 |
Family
ID=44173606
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201010623180.0A Expired - Fee Related CN102109388B (zh) | 2009-12-25 | 2010-12-24 | 温度检测系统 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8449179B2 (zh) |
JP (1) | JP5389635B2 (zh) |
KR (1) | KR101671034B1 (zh) |
CN (1) | CN102109388B (zh) |
TW (1) | TWI460410B (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009058438A (ja) * | 2007-08-31 | 2009-03-19 | Toshiba Corp | 温度検出回路 |
Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4445636A (en) * | 1982-08-25 | 1984-05-01 | American Stabilis, Inc. | Temperature comparison apparatus and methods |
EP0191740A2 (en) * | 1985-01-30 | 1986-08-20 | Telefonaktiebolaget L M Ericsson | Temperature and current protection for quadruple voltage regulator |
JPH0317188Y2 (zh) * | 1982-11-16 | 1991-04-11 | ||
US5703575A (en) * | 1995-06-06 | 1997-12-30 | Rosemount Inc. | Open sensor diagnostic system for temperature transmitter in a process control system |
US20040019453A1 (en) * | 2002-04-29 | 2004-01-29 | Blakley Daniel Robert | Determination of pharmaceutical expiration date |
JP2004085384A (ja) * | 2002-08-27 | 2004-03-18 | Seiko Epson Corp | 温度センサ回路、半導体集積回路及びその調整方法 |
US20070150225A1 (en) * | 2003-06-26 | 2007-06-28 | Boerstler David W | Thermal sensing method and system |
US20070258503A1 (en) * | 2006-05-03 | 2007-11-08 | Clark Jr William F | Bolometric on-chip temperature sensor |
US7410293B1 (en) * | 2006-03-27 | 2008-08-12 | Altera Corporation | Techniques for sensing temperature and automatic calibration on integrated circuits |
US20080198899A1 (en) * | 2007-02-17 | 2008-08-21 | Atsushi Igarashi | Temperature detection circuit |
CN101514925A (zh) * | 2008-02-18 | 2009-08-26 | 精工电子有限公司 | 温度检测电路 |
CN100552952C (zh) * | 2006-07-06 | 2009-10-21 | 株式会社理光 | 温度检测方法,温度检测电路及半导体装置 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3149857B2 (ja) * | 1998-09-04 | 2001-03-26 | 日本電気株式会社 | 温度検出機構を有する出力電流調整回路 |
JP2001141572A (ja) * | 1999-11-15 | 2001-05-25 | Mitsubishi Electric Corp | マイクロコンピュータおよびチップ温度検出方法 |
JP2001160042A (ja) | 1999-12-02 | 2001-06-12 | Mitsubishi Electric Corp | 温度センサ搭載のマイクロコンピュータ |
US7657772B2 (en) * | 2003-02-13 | 2010-02-02 | International Business Machines Corporation | Thermally aware integrated circuit |
JP4219750B2 (ja) * | 2003-06-26 | 2009-02-04 | シャープ株式会社 | Icチップの温度保護回路 |
JP2006349521A (ja) * | 2005-06-16 | 2006-12-28 | Denso Corp | 過熱検出回路および半導体集積回路装置 |
KR100854452B1 (ko) | 2005-06-30 | 2008-08-27 | 주식회사 하이닉스반도체 | 디지털 온도검출기 및 이를 이용한 오실레이터 회로 |
US8118483B2 (en) * | 2006-06-21 | 2012-02-21 | Intel Corporation | Thermal sensor having toggle control |
TWI434032B (zh) * | 2007-01-11 | 2014-04-11 | Marvell World Trade Ltd | 溫度感測系統 |
US8237515B2 (en) * | 2007-03-09 | 2012-08-07 | Broadcom Corporation | Crystal oscillator temperature control and compensation |
US8517605B2 (en) * | 2009-09-18 | 2013-08-27 | Northwestern University | Bimetallic integrated on-chip thermocouple array |
US8419273B2 (en) * | 2010-05-03 | 2013-04-16 | Sharp Kabushiki Kaisha | Array element for temperature sensor array circuit, temperature sensor array circuit utilizing such array element, and AM-EWOD device including such a temperature sensor array circuit |
US9317082B2 (en) * | 2010-10-13 | 2016-04-19 | Advanced Micro Devices, Inc. | Controlling operation of temperature sensors |
JP5263321B2 (ja) * | 2011-02-25 | 2013-08-14 | 株式会社デンソー | 温度検出装置 |
-
2009
- 2009-12-25 JP JP2009294656A patent/JP5389635B2/ja not_active Expired - Fee Related
-
2010
- 2010-12-20 TW TW099144769A patent/TWI460410B/zh not_active IP Right Cessation
- 2010-12-21 US US12/974,956 patent/US8449179B2/en not_active Expired - Fee Related
- 2010-12-23 KR KR1020100133272A patent/KR101671034B1/ko active IP Right Grant
- 2010-12-24 CN CN201010623180.0A patent/CN102109388B/zh not_active Expired - Fee Related
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4445636A (en) * | 1982-08-25 | 1984-05-01 | American Stabilis, Inc. | Temperature comparison apparatus and methods |
JPH0317188Y2 (zh) * | 1982-11-16 | 1991-04-11 | ||
EP0191740A2 (en) * | 1985-01-30 | 1986-08-20 | Telefonaktiebolaget L M Ericsson | Temperature and current protection for quadruple voltage regulator |
US5703575A (en) * | 1995-06-06 | 1997-12-30 | Rosemount Inc. | Open sensor diagnostic system for temperature transmitter in a process control system |
US20040019453A1 (en) * | 2002-04-29 | 2004-01-29 | Blakley Daniel Robert | Determination of pharmaceutical expiration date |
JP2004085384A (ja) * | 2002-08-27 | 2004-03-18 | Seiko Epson Corp | 温度センサ回路、半導体集積回路及びその調整方法 |
US20070150225A1 (en) * | 2003-06-26 | 2007-06-28 | Boerstler David W | Thermal sensing method and system |
US7410293B1 (en) * | 2006-03-27 | 2008-08-12 | Altera Corporation | Techniques for sensing temperature and automatic calibration on integrated circuits |
US20070258503A1 (en) * | 2006-05-03 | 2007-11-08 | Clark Jr William F | Bolometric on-chip temperature sensor |
CN100552952C (zh) * | 2006-07-06 | 2009-10-21 | 株式会社理光 | 温度检测方法,温度检测电路及半导体装置 |
US20080198899A1 (en) * | 2007-02-17 | 2008-08-21 | Atsushi Igarashi | Temperature detection circuit |
CN101514925A (zh) * | 2008-02-18 | 2009-08-26 | 精工电子有限公司 | 温度检测电路 |
Non-Patent Citations (1)
Title |
---|
陈圣俭,赵天策: "一种模数混合电路故障诊断新方法", 《微电子学与计算机》 * |
Also Published As
Publication number | Publication date |
---|---|
TWI460410B (zh) | 2014-11-11 |
TW201140011A (en) | 2011-11-16 |
JP5389635B2 (ja) | 2014-01-15 |
US20110158285A1 (en) | 2011-06-30 |
CN102109388B (zh) | 2016-01-20 |
JP2011133419A (ja) | 2011-07-07 |
KR101671034B1 (ko) | 2016-10-31 |
KR20110074691A (ko) | 2011-07-01 |
US8449179B2 (en) | 2013-05-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160308 Address after: Chiba County, Japan Patentee after: SEIKO INSTR INC Address before: Chiba, Chiba, Japan Patentee before: Seiko Instruments Inc. |
|
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: Chiba County, Japan Patentee after: EPPs Lingke Co. Ltd. Address before: Chiba County, Japan Patentee before: SEIKO INSTR INC |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160120 Termination date: 20181224 |